III nitride semiconductor substrate, epitaxial substrate, and semiconductor device
In a semiconductor device 100 , it is possible to prevent C from piling up at a boundary face between an epitaxial layer 22 and a group III nitride semiconductor substrate 10 by the presence of 30×10 10 pieces/cm 2 to 2000×10 10 pieces/cm 2 of sulfide in terms of S and 2 at % to 20 at % of oxide in terms of O in a surface layer 12 with a front surface 10 a having a specific plane orientation. Accordingly, a high-resistivity layer is prevented from being formed at the boundary face between the epitaxial layer 22 and the group III nitride semiconductor substrate 10 . Consequently, it is possible to improve the emission intensity of the semiconductor device 100.
1. A group III nitride semiconductor substrate, comprising a surface layer on a surface of the group III nitride semiconductor substrate, wherein
the surface layer has a surface concentration density of 120×10 10 pieces/cm 2 to 15000×10 10 pieces/cm 2 of chlorine and has a surface concentration density of 30×10 10 pieces/cm 2 to 2000×10 10 pieces/cm 2 of sulfur,
a thickness of an affected layer is 20 nm or less, and
an inclination angle of a normal axis of the surface with respect to a c-axis is 10° to 81°.
2. A group III nitride semiconductor substrate, comprising a surface layer on a surface of the group III nitride semiconductor substrate, wherein
the surface layer has a surface concentration density of 120×10 10 pieces/cm 2 to 15000×10 10 pieces/cm 2 of chlorine and has a surface concentration density of 30×10 10 pieces/cm 2 to 2000×10 10 pieces/cm 2 of sulfur,
a surface roughness of the surface layer is 5 nm or less on an RMS basis, and
an inclination angle of a normal axis of the surface with respect to a c-axis is 10° to 81°.
3. A group III nitride semiconductor substrate, comprising a surface layer on a surface of the group III nitride semiconductor substrate, wherein
the surface layer has a surface concentration density of 120×10 10 pieces/cm 2 to 15000×10 10 pieces/cm 2 of chlorine and has a surface concentration density of 30×10 10 pieces/cm 2 to 2000×10 10 pieces/cm 2 of sulfur,
a dislocation density of the surface layer is 1×10 6 pieces/cm 2 or lower, and
an inclination angle of a normal axis of the surface with respect to a c-axis is 10° to 81°.