RF MEMS isolation, series and shunt DVC, and small MEMS
The present invention generally relates to an architecture for isolating an RF MEMS device from a substrate and driving circuit, series and shunt DVC die architectures, and smaller MEMS arrays for high frequency communications. The semiconductor device has one or more cells with a plurality of MEMS devices therein. The MEMS device operates by applying an electrical bias to either a pull-up electrode or a pull-down electrode to move a switching element of the MEMS device between a first position spaced a first distance from an RF electrode and a second position spaced a second distance different than the first distance from the RF electrode. The pull-up and/or pull-off electrode may be coupled to a resistor to isolate the MEMS device from the substrate.
1. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, wherein each cell further comprises one or more of a pull-down electrode and a pull-up electrode, wherein the one or more resistors are electrically coupled to one or more of the pull-down electrode and the pull-up electrode, further comprising an RF electrode disposed within each cell, wherein each MEMS device comprises a switching element movable from a first position spaced a first distance from the RF electrode and a second position spaced a second distance from the RF electrode that is different than the first distance.
2. The semiconductor device of claim 1 , wherein the RF electrode of at least one cell is tapered from a center of cell to an edge of the cell.
3. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, wherein each cell comprises a pull-down electrode and a pull-up electrode and wherein a first resistor is coupled to the pull-down electrode and a second resistor is coupled to the pull-up electrode.
4. The semiconductor device of claim 3 , wherein each cell comprises an RF electrode.
5. The semiconductor device of claim 4 , wherein a first cell comprises a first RF electrode having a first size and wherein a second cell comprises a second RF electrode having a second size different than the first size.
6. The semiconductor device of claim 5 , wherein the first cell has a first number of MEMS devices and the second cell has a second number of MEMS device that is different than the first number of MEMS devices.
7. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, wherein each cell comprises an RF electrode.
8. The semiconductor device of claim 7 , wherein each cell further comprises one or more of a pull-down electrode and a pull-up electrode.
9. The semiconductor device of claim 8 , wherein the one or more resistors are electrically coupled to one or more of the pull-down electrode and the pull-up electrode.
10. The semiconductor device of claim 7 , wherein a first cell comprises a first RF electrode having a first size and wherein a second cell comprises a second RF electrode having a second size different than the first size.
11. The semiconductor device of claim 10 , wherein the first cell has a first number of MEMS devices and the second cell has a second number of MEMS device that is different than the first number of MEMS devices.
12. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, further comprising an RF electrode disposed within each cell, wherein each MEMS device comprises a switching element movable from a first position spaced a first distance from the RF electrode and a second position spaced a second distance from the RF electrode that is different than the first distance.
13. The semiconductor device of claim 12 , wherein the RF electrode of at least one cell is tapered from a center of cell to an edge of the cell.
14. The semiconductor device of claim 12 , wherein the RF electrode of at least one cell has two or more different widths corresponding to two or more different MEMS devices.
15. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, wherein the one or more resistors comprises a poly-resistor.
16. A semiconductor device, comprising:
a substrate;
one or more cells disposed over the substrate;
one or more MEMS devices disposed in each cell; and
one or more resistors disposed between the substrate and the one or more cells, further comprising one or more metallization layers disposed between the substrate and the one or more cells.
17. A method of operating a semiconductor device, comprising:
controlling a plurality of cells disposed over a CMOS structure, each cell having a plurality of MEMS devices therein and an RF electrode, a first cell of the plurality of cells has a first RF electrode having a first width and a first capacitance, and a second cell of the plurality of cells having a second RF electrode having a second width different than the first width and a second capacitance different than the first capacitance, wherein controlling sequentially comprises:
moving switches present in the first cell to increase a total capacitance of the semiconductor device;
moving switches present in the second cell to increase the total capacitance of the semiconductor device;
moving the switches present in the second cell to decrease the total capacitance of the semiconductor device; and
moving the switches present in the first cell to decrease the total capacitance of the semiconductor device.
18. A method of calibrating a semiconductor device, comprising:
assigning first bit values to a first plurality of cells of the semiconductor device, each cell comprising a plurality of MEMS devices and an RF electrode; and
assigning second bit values to one or more second cells of the semiconductor device, wherein the second bit values are different from the first bit values and the one or more second cells are each smaller in size than the first plurality of cells.
19. The method of claim 18 , further comprising causing the MEMS devices of at least one cell of the first plurality of cells to move.
20. The method of claim 18 , further comprising:
sensing a total capacitance value for the semiconductor device;
causing the MEMS devices of at least one cell of the first plurality of cells to move, wherein the moving occurs based upon a predefined frequency.