IP Library › Granted Patent US 9,159,726
Granted Patent B2
US 9,159,726 · App. 14/202,088 · Granted Oct 13, 2015

Semiconductor memory device and method for manufacturing same

Inventors: Osamu Yamane (Kanagawa-ken, JP); Yoshihiro Yanai (Mie-ken, JP); Hiromitsu Mashita (Kanagawa-ken, JP)
Assignee: Kabushiki Kaisha Toshiba
H01L27/10
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,159,726
App. No.
14/202,088
Granted
Oct 13, 2015
Kind
B2
Abstract

According to one embodiment, a semiconductor memory device includes a semiconductor substrate and a memory array. The semiconductor substrate has a first face. The memory array region is provided on the first face and includes a plurality of semiconductor pillars. The semiconductor pillars extend in a first direction perpendicular to the first face. Each of the semiconductor pillars includes a plurality of memory cells connected in series. Each of the semiconductor pillars is disposed at the nodes of a honeycomb shape when viewed in the first direction. When the semiconductor pillars are projected onto a first plane along the first and second directions perpendicular to the first direction, a component in the second direction of an interval between the semiconductor pillars has first and second intervals repeated alternately. The second interval is an integer multiple of the first interval greater than or equal to 2.

Claims (26)

1. A semiconductor memory device, comprising:

a semiconductor substrate having a first face; and

a memory array region provided on the first face of the semiconductor substrate, and including a plurality of semiconductor pillars extending in a first direction perpendicular to the first face,

the memory array region including a plurality of memory cells connected in series,

each of the semiconductor pillars being disposed at the nodes of a honeycomb shape when viewed in the first direction, and

when the semiconductor pillars are projected onto a first plane along the first direction and a second direction perpendicular to the first direction, a component in the second direction of an interval between the semiconductor pillars having a first interval and a second interval repeated alternately, the second interval being an integer multiple of the first interval greater than or equal to 2.

2. The device according to claim 1 , wherein the semiconductor pillars are disposed at an equal interval in a third direction perpendicular to the first direction and the second direction.

3. The device according to claim 1 , wherein the semiconductor pillars includes

a first semiconductor pillar, and

a second semiconductor pillar disposed at the second interval from the first semiconductor pillar in the second direction,

the device further includes a connecting portion connecting an end portion on a side of the semiconductor substrate of the first semiconductor pillar, and an end portion on a side of the semiconductor substrate of the second semiconductor pillar.

4. The device according to claim 1 , wherein the memory array region includes:

a plurality of electrode films stacked in the first direction;

a semiconductor film extending in the first direction, the semiconductor film being included in the each of the semiconductor pillars; and

a memory film provided between the semiconductor film and each of the electrode films.

5. The device according to claim 1 , further comprising a plurality of first interconnections extending in the second direction,

an interval of the first interconnections in a third direction perpendicular to the first direction and the second direction being half an interval in the third direction of the semiconductor pillars.

6. The device according to claim 5 , further comprising a plurality of second interconnections perpendicular to the first interconnections.

7. A semiconductor memory device, comprising:

a semiconductor substrate having a first face, the first face being along a second direction and a third direction perpendicular to a first direction; and

a plurality of pillars provided on the first face, the pillars extending in the first direction perpendicular to the first face, the pillars being included in a plurality of memory cells, the memory cells connected in series, end portions of the pillars being in contact with interconnections, the end portions being disposed on an opposite side of a side of the semiconductor substrate,

six pillars of the pillars being disposed at vertices of hexagonal pattern as viewed from the first direction,

three pairs of two pillars in the six pillars being alternately arranged in the third direction, and two pairs of two pillars in the six pillars being alternately arranged in the second direction,

any one of the pillars connected to interconnections not being disposed inside the hexagonal pattern,

as viewed from the third direction, intervals of the pillars in the second direction having a first interval and a second interval, the second interval being greater than or equal to double of the first interval.

8. The device according to claim 7 , wherein intervals in the third direction between the pillars are the same as viewed from the second direction.

Assignments (5)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2014
From: YAMANE, OSAMU; YANAI, YOSHIHIRO; MASHITA, HIROMITSU
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 032390/0512 →
Continuity (2)
Provisional Application 61875756 · Sep 10, 2013
Related Publication 20150069568A1 · Mar 12, 2015