IP Library Granted Patent US 9,193,595
Granted Patent B2
US 9,193,595 · App. 14/094,966 · Granted Nov 24, 2015

Compositions comprising free-standing two-dimensional nanocrystals

Inventors: Michel W. Barsoum (Moorestown, NJ); Yury Gogotsi (Warminster, PA); Michael Naguib Abdelmalak (Philadelphia, PA); Olha Mashtalir (Philadelphia, PA)
Assignee: Drexel University
C01B31/30C01B21/06C01B21/0602C01B21/062C01B21/0615C01B21/0617C01B21/076C01B21/0828C01B31/303C01B31/305H01M4/0492H01M4/366H01M4/58H01M4/583H01M4/62B82Y30/00B82Y40/00C01P2002/01C01P2002/08C01P2002/20C01P2002/72C01P2002/77C01P2002/78C01P2002/82C01P2002/85C01P2002/88C01P2004/03C01P2004/04C01P2004/133C01P2004/136C01P2004/24C01P2004/61C01P2006/12H01M10/0525H01M2004/021Y10S977/755Y10S977/896
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Quick Facts
Patent No.
US 9,193,595
App. No.
14/094,966
Granted
Nov 24, 2015
Kind
B2
Abstract

The present invention is directed to compositions comprising free standing and stacked assemblies of two dimensional crystalline solids, and methods of making the same.

Claims (47)

1. A composition comprising at least one layer having first and second surfaces, each layer comprising:

a substantially two-dimensional array of crystal cells,

each crystal cell having an empirical formula of M n+1 X n , such that each X is positioned within an octahedral array of M,

wherein M is at least one Group IIIB, IVB, VB, or VIB metal,

wherein each X is C, N, or a combination thereof;

n=1, 2 or 3; and

wherein at least one of said surfaces of each layer has surface terminations comprising alkoxide, carboxylate, halide, hydroxide, hydride, oxide, sub-oxide, nitride, sub-nitride, sulfide, thiol, or a combination thereof.

2. The composition of claim 1 comprising a plurality of layers, wherein both surfaces of each layer have said surface terminations.

3. The composition of claim 1 , wherein M is at least one Group IVB, Group VB, or Group VIB metal.

4. The composition of claim 1 wherein M is Ti, and n is 1 or 2.

5. The composition of claim 1 wherein M n+1 X n comprises Sc 2 C, Sc 2 N, Ti 2 C, Ti 2 N, V 2 C, V 2 N, Cr 2 C, Cr 2 N, Zr 2 C, Zr 2 N, Nb 2 C, Nb 2 N, Hf 2 C, Hf 2 N, Ti 3 C 2 , Ti 3 N 2 , V 3 C 2 , Ta 3 C 2 , Ta 3 N 2 , Ti 4 C 3 , Ti 4 N 3 , V 4 C 3 , V 4 N 3 , Ta 4 C 3 , Ta 4 N 3 , or a combination thereof.

6. The composition of claim 1 wherein M n+1 X n comprises Ti 3 C 2 , Ti 3 CN, Ti 2 C, Ta 4 C 3 or (V 1/2 Cr 1/2 ) 3 C 2 .

7. The composition of claim 1 wherein M is Ta, and n is 2 or 3.

8. The composition of claim 1 , the crystal cells having an empirical formula Ti 3 C 2 or Ti 2 C and wherein at least one of said surfaces of each layer has surface terminations comprising hydroxide, oxide, sub-oxide, or a combination thereof.

9. The composition of claim 1 , wherein the composition comprises an electrically conductive or semiconductive surface.

10. The composition of claim 1 , wherein M is at least one of Sc, Y, Lu, Ti, Zr, Hf, V, Nb, Ta, Cr, Mo, or W.

11. A stacked assembly of at least two layers, each layer having first and second surfaces, each layer comprising:

a substantially two-dimensional array of crystal cells,

each crystal cell having the empirical formula of M n+1 X n , such that each X is positioned within an octahedral array of M;

wherein M is a Group IIIB, IVB, VB, or VIB metal;

each X is C, N, or a combination thereof; and

n=1, 2, or 3;

wherein the layers are characterized as having an average surface area and an average interlayer distance; and

wherein at least one of said surfaces of each layer has bound thereto surface terminations comprising alkoxide, carboxylate, halide, hydroxide, hydride, oxide, sub-oxide, nitride, sub-nitride, sulfide, thiol, or a combination thereof.

12. The stacked assembly of claim 11 , wherein M n+1 X n comprises Sc 2 C, Sc 2 N, Ti 2 C, Ti 2 N, V 2 C, V 2 N, Cr 2 C, Cr 2 N, Zr 2 C, Zr 2 N, Nb 2 C, Nb 2 N, Hf 2 C, Hf 2 N, Ti 3 C 2 , Ti 3 N 2 , V 3 C 2 , Ta 3 C 2 , Ta 3 N 2 , Ti 4 C 3 , Ti 4 N 3 , V 4 C 3 , V 4 N 3 , Ta 4 C 3 , Ta 4 N 3 , or a combination thereof.

13. The stacked assembly of claim 12 , wherein M n+1 X n comprises Ti 2 C, Ti 2 N, Ti 3 C 2 , Ti 3 N 2 , Ti 4 C 3 , Ti 4 N 3 , Ta 3 C 2 , Ta 3 N 2 , Ta 4 C 3 , or Ta 4 N 3 , or a combination thereof.

14. The stacked assembly of claim 13 , wherein M n+1 X n comprises Ti 3 C 2 , TiNbC, Nb 2 C, Ti 3 CN, Ti 2 C, Ta 4 C 3 , or (V 1/2 Cr 1/2 ) 3 C 2 .

15. The stacked assembly of claim 11 , wherein M n+1 X n is Ti 3 C 2 , TiNbC, Ti 3 CN, or Ti 2 C.

16. The stacked assembly of claim 15 , wherein M n+1 X n is Ti 3 C 2 .

17. The stacked assembly of claim 11 , wherein the number of layers is in the range of 2 to about 50.

18. The stacked assembly of claim 11 , wherein the average surface area of the layers is in the range of from about 100 nm 2 to about 10,000 nm 2 or from about 100 μm 2 to about 10,000 μm 2 .

19. The stacked assembly of claim 11 , wherein lithium atoms, lithium ions, or both lithium atoms and lithium ions are intercalated between at least some of the layers.

20. An energy-storing device or electrode comprising the stacked assembly of claim 11 .

21. A method of preparing a composition comprising:

removing substantially all of the A atoms from a MAX-phase composition having an empirical formula of M n+1 AX n ;

wherein M is at least one Group IIIB, IVB, VB, or VIB metal;

wherein A is an A-group element;

each X is C, N, or a combination thereof; and

n=1, 2, or 3,

thereby providing a composition comprising at least one layer having a first and second surface, each layer comprising a substantially two-dimensional array of crystal cells;

each crystal cell having an empirical formula of M n+1 X n , such that each X is positioned within an octahedral array of M; and

wherein at least one of said surfaces of each layer has surface terminations comprising alkoxide, carboxylate, halide, hydroxide, hydride, oxide, sub-oxide, nitride, sub-nitride, sulfide, thiol, or a combination thereof.

22. The method of claim 21 , wherein the A atoms are removed by a process comprising a treatment with a fluorine-containing acid.

23. The method of claim 22 , wherein the fluorine-containing acid is aqueous hydrofluoric acid.

24. The method of claim 22 , further comprising sonication.

25. The method of claim 24 , wherein sonication is done using ultrasonic or megasonic sources.

26. The method of claim 21 , wherein removing substantially all of the A atoms from a MAX-phase composition is done electrochemically.

Assignments (2)
CONFIRMATORY LICENSE Recorded Aug 18, 2020
From: DREXEL UNIVERSITY
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 053532/0346 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2014
From: BARSOUM, MICHEL W.; GOGOTSI, YURY; ABDELMALAK, MICHAEL NAGUIB; MASHTALIR, OLHA
To: DREXEL UNIVERSITY
Reel/Frame 032291/0653 →
Continuity (6)
Continuation In Part PCTUS2012043273 · Jun 20, 2012
Provisional Application 61499318 · Jun 21, 2011
Provisional Application 61521428 · Aug 9, 2011
Provisional Application 61587172 · Jan 17, 2012
Provisional Application 61733015 · Dec 4, 2012
Related Publication 20140162130A1 · Jun 12, 2014