IP Library › Granted Patent US 9,207,289
Granted Patent B2
US 9,207,289 · App. 13/652,683 · Granted Dec 8, 2015

Magnetic property analyzing method and apparatus

Inventor: Koichi Shimizu (Kawasaki, JP)
Assignee: FUJITSU LIMITED
G01R33/0064
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Quick Facts
Patent No.
US 9,207,289
App. No.
13/652,683
Granted
Dec 8, 2015
Kind
B2
Abstract

A magnetic property analyzing apparatus calculates vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements, and performs a magnetic field analysis of sub-grids arranged along one direction within each of the elements. An average magnetization with respect to each of the elements is calculated by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis.

Claims (53)

1. A magnetic property analyzing apparatus comprising:

a processor configured to perform a process including first calculating vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements,

performing a magnetic field analysis of sub-grids arranged along one direction within each of the elements, and

second calculating an average magnetization with respect to each of the elements, by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis, wherein the second calculating includes

after the magnetic field is calculated by the magnetic field analysis, calculating an effective magnetic field acting on each of the elements by keeping the magnetic field to a fixed value,

calculating magnetization vectors within each of sub-elements including the sub-grids by performing a time integral of the LLG equation using the effective magnetic field, and

calculating the average magnetization with respect to each of the elements by averaging magnetization vectors calculated for each of the sub-elements.

2. The magnetic property analyzing apparatus as claimed in claim 1 , wherein a process of the first calculating, and a process of the performing and the second calculating are alternately repeated.

3. The magnetic property analyzing apparatus as claimed in claim 1 , the second calculating includes

after calculating the magnetic field by the magnetic field analysis, performing a first process of calculating the magnetization vector and calculating the average magnetization with respect to each of the elements a plurality of times by recursively reflecting the average magnetization calculated by the second calculating to the effective magnetic field.

4. The magnetic property analyzing apparatus as claimed in claim 3 , wherein the second calculating calculates the average magnetization with respect to each of the elements, by alternately executing a process of calculating the magnetic field by the magnetic field analysis and the first process a plurality of times.

5. The magnetic property analyzing apparatus as claimed in claim 3 , wherein a number of times the first process is executed gradually decreases depending on a lapse of time in which the external magnetic field remains unchanged.

6. A magnetic property analyzing apparatus comprising:

a processor configured to perform a process including

first calculating vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements,

performing a magnetic field analysis of sub-grids arranged along one direction within each of the elements, and

second calculating an average magnetization with respect to each of the elements, by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis, wherein the second calculating includes

calculating, by the processor, the effective magnetic field by reflecting an external magnetic field as a set value,

after executing a process of calculating the average magnetization with respect to each of the elements, judging, by the processor, whether an index value indicating a change between the average magnetization calculated in a currently executed process of calculating the average magnetization with respect to each of the elements and the average magnetization calculated in a previously executed process of calculating the average magnetization with respect to each of the elements executed before the currently executed process, and

modifying, by the processor, the external magnetic field when the index value is less than a predetermined value.

7. The magnetic property analyzing apparatus as claimed in claim 6 , wherein the performing includes

when the index value is less than the predetermined value, outputting from the processor, as an analysis result, a combination of a value corresponding to the average magnetization calculated by the process of calculating the average magnetization with respect to each of the elements, and the external magnetic field that is set when the index value is less than the predetermined value.

8. A magnetic property analyzing method comprising:

first calculating, by a processor, vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements;

performing, by the processor, a magnetic field analysis of sub-grids arranged along one direction within each of the elements; and

second calculating, by the processor, an average magnetization with respect to each of the elements, by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis, wherein the second calculating includes

after the magnetic field is calculated by the magnetic field analysis, calculating, by the processor, an effective magnetic field acting on each of the elements by keeping the magnetic field to a fixed value,

calculating, by the processor, magnetization vectors within each of sub-elements including the sub-grids by performing a time integral of the LLG equation using the effective magnetic field, and

calculating, by the processor, the average magnetization with respect to each of the elements by averaging magnetization vectors calculated for each of the sub-elements.

9. The magnetic property analyzing method as claimed in claim 8 , wherein a process of the first calculating, and a process of the performing and the second calculating are alternately repeated.

10. The magnetic property analyzing method as claimed in claim 8 , further comprising:

after calculating the magnetic field by the magnetic field analysis, performing, by the processor, a first process of calculating the magnetization vector and calculating the average magnetization with respect to each of the elements a plurality of times by recursively reflecting the average magnetization calculated by the second calculating to the effective magnetic field.

11. A non-transitory computer-readable storage medium having stored therein a program for causing a computer to execute a process comprising:

first calculating vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements;

performing a magnetic field analysis of sub-grids arranged along one direction within each of the elements; and

second calculating an average magnetization with respect to each of the elements, by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis, wherein the second calculating includes

after the magnetic field is calculated by the magnetic field analysis, calculating an effective magnetic field acting on each of the elements by keeping the magnetic field to a fixed value,

calculating magnetization vectors within each of sub-elements including the sub-grids by performing a time integral of the LLG equation using the effective magnetic field, and

calculating the average magnetization with respect to each of the elements by averaging magnetization vectors calculated for each of the sub-elements.

12. The non-transitory computer-readable storage medium as claimed in claim 11 , wherein a process of the first calculating, and a process of the performing and the second calculating are alternately repeated.

13. The non-transitory computer-readable storage medium as claimed in claim 11 , wherein the second calculating includes

after calculating the magnetic field by the magnetic field analysis, performing a first process of calculating the magnetization vector and calculating the average magnetization with respect to each of the elements a plurality of times by recursively reflecting the average magnetization calculated by the second calculating to the effective magnetic field.

14. The non-transitory computer-readable storage medium as claimed in claim 13 , wherein the second calculating performs a process of calculating the average magnetization with respect to each of the elements, by alternately executing a process of calculating the magnetic field by the magnetic field analysis and the first process a plurality of times.

15. The non-transitory computer-readable storage medium as claimed in claim 13 , wherein a number of times the first process is executed gradually decreases depending on a lapse of time in which the external magnetic field remains unchanged.

16. A non-transitory computer-readable storage medium having stored therein a program for causing a computer to execute a process comprising:

first calculating vector potentials of each of elements to which an analyzing target is segmented by meshing, using an average magnetization obtained for each of the elements;

performing a magnetic field analysis of sub-grids arranged along one direction within each of the elements; and

second calculating an average magnetization with respect to each of the elements, by performing a time integral on a LLG (Landau Lifshitz Gilbert) equation using a magnetic field obtained from the magnetic field analysis in order to perform a magnetic property analysis, wherein the second calculating includes

calculating the effective magnetic field by reflecting an external magnetic field as a set value,

after executing a process of calculating the average magnetization with respect to each of the elements, judging whether an index value indicating a change between the average magnetization calculated in a currently executed process of calculating the average magnetization with respect to each of the elements and the average magnetization calculated in a previously executed process of calculating the average magnetization with respect to each of the elements executed before the currently executed process, and

modifying the external magnetic field when the index value is less than a predetermined value.

17. The non-transitory computer-readable storage medium as claimed in claim 16 , wherein the performing includes

when the index value is less than the predetermined value, causing the computer to output, as an analysis result, a combination of a value corresponding to the average magnetization calculated by the process of calculating the average magnetization with respect to each of the elements, and the external magnetic field that is set when the index value is less than the predetermined value.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2012
From: SHIMIZU, KOICHI
To: FUJITSU LIMITED
Reel/Frame 029205/0471 →
Continuity (1)
Related Publication 20130166230A1 · Jun 27, 2013