IP Library Granted Patent US 9,209,097
Granted Patent B2
US 9,209,097 · App. 14/198,339 · Granted Dec 8, 2015

Substrate bonding method and substrate bonding apparatus

Inventor: Mitsuyoshi Endo (Yamato, JP)
Assignee: KABUSHIKI KAISHA TOSHIBA
H01L22/26H01L21/67092H01L21/67109
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Quick Facts
Patent No.
US 9,209,097
App. No.
14/198,339
Granted
Dec 8, 2015
Kind
B2
Abstract

According to one embodiment, there is provided a substrate bonding method. The substrate bonding method includes disposing a first substrate and a second substrate to face each other. The substrate bonding method includes controlling the first substrate and the second substrate to have a temperature difference. The substrate bonding method includes, in a state where the first substrate and the second substrate are controlled to have the temperature difference, bonding the first substrate to the second substrate by bringing the first substrate into contact with the second substrate while deforming the first substrate so that a central portion of the first substrate is projected toward the second substrate. The central portion of the first substrate is on an inner side of a peripheral portion of the first substrate.

Claims (16)

1. A substrate bonding method comprising:

disposing a first substrate and a second substrate to face each other;

controlling the first substrate and the second substrate to have a temperature difference; and

in a state where the first substrate and the second substrate are controlled to have the temperature difference, bonding the first substrate to the second substrate by bringing the first substrate into contact with the second substrate while deforming the first substrate so that a central portion of the first substrate is projected toward the second substrate, the central portion of the first substrate being on an inner side of a peripheral portion of the first substrate,

wherein the controlling to have the temperature difference includes producing the temperature difference between the first substrate and the second substrate to reach a predetermined temperature difference, so that a misalignment between a reference position of the first substrate and a reference position of the second substrate reaches a target value, and

wherein the predetermined temperature difference is decided in advance by:

disposing a third substrate corresponding to the first substrate and a fourth substrate corresponding to the second substrate, so that the third substrate and the fourth substrate face each other;

in the state where the third substrate and the fourth substrate are controlled to have a room temperature, bonding the third substrate to the fourth substrate by bringing the third substrate into contact with the fourth substrate while deforming the third substrate so that a central portion of the third substrate is projected toward the fourth substrate, the central portion of the third substrate being on an inner side of a peripheral portion of the third substrate;

measuring a misalignment between a reference position of the third substrate and a reference position of the fourth substrate; and

deciding a temperature difference corresponding to the measured misalignment between the reference positions,

wherein the controlling to have the temperature difference includes producing the temperature difference between the first substrate and the second substrate to reach the decided temperature difference.

2. The substrate bonding method according to claim 1 , wherein the deciding the temperature difference includes deciding the temperature difference so that a difference in thermal expansion amount is generated in a direction opposite to the measured misalignment of the reference positions.

3. The substrate bonding method according to claim 1 , wherein the deciding the temperature difference includes deciding the temperature difference so that, when the reference position of the third substrate is misaligned toward the center as compared with the reference position of the fourth substrate, a temperature of the first substrate is higher than a temperature of the second substrate.

4. The substrate bonding method according to claim 1 , wherein the deciding the temperature difference includes deciding the temperature difference so that, when the reference position of the third substrate is misaligned outward as compared with the reference position of the fourth substrate, a temperature of the first substrate is lower than a temperature of the second substrate.

5. The substrate bonding method according to claim 1 , wherein the bonding the first substrate to the second substrate includes deforming the first substrate so that a portion near a center of the first substrate is projected toward the second substrate.

6. The substrate bonding method according to claim 1 , wherein the bonding the first substrate to the second substrate includes deforming the first substrate so that a portion shifted from a center of the central portion of the first substrate is projected toward the second substrate.

Assignments (5)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2014
From: ENDO, MITSUYOSHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 032817/0735 →
Priority Claims (1)
JP 2013-238061 · Nov 18, 2013 · national
Continuity (1)
Related Publication 20150140689A1 · May 21, 2015