IP Library Granted Patent US 9,261,722
Granted Patent B2
US 9,261,722 · App. 14/306,309 · Granted Feb 16, 2016

Display device and method for manufacturing the same

Inventors: Noriko Miyagi (Shiga, JP); Masayuki Sakakura (Kanagawa, JP); Tatsuya Arao (Kanagawa, JP); Ritsuko Nagao (Kanagawa, JP); Yoshifumi Tanada (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G02F1/133345G09G3/3233H01L27/3276H01L51/5206H01L51/5221H01L51/5228G09G2300/0842G09G2300/0861H01L2251/5315
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Quick Facts
Patent No.
US 9,261,722
App. No.
14/306,309
Granted
Feb 16, 2016
Kind
B2
Abstract

An object of the present invention is to decrease substantial resistance of an electrode such as a transparent electrode or a wiring, and furthermore, to provide a display device for which is possible to apply same voltage to light-emitting elements. In the invention, a auxiliary wiring that is formed in one layer in which a conductive film of a semiconductor element such as an electrode, wiring, a signal line, a scanning line, or a power supply line is connected to an electrode typified by a second electrode, and a wiring. It is preferable that the auxiliary wiring is formed into a conductive film to include low resistive material, especially, formed to include lower resistive material than the resistance of an electrode and a wiring that is required to reduce the resistance.

Claims (71)

1. A display device comprising:

a pixel portion comprising:

a semiconductor film;

a first insulating film over the semiconductor film;

a second insulating film over the first insulating film;

a third insulating film over the second insulating film;

a first wiring over the third insulating film, wherein the first wiring is in contact with the semiconductor film in a first opening provided in the first insulating film, the second insulating film, and the third insulating film;

a second wiring over the third insulating film, wherein the second wiring is in contact with the semiconductor film in a second opening provided in the first insulating film, the second insulating film, and the third insulating film;

a fourth insulating film over the first wiring and the second wiring;

a first electrode over the fourth insulating film, wherein the first electrode is in contact with the first wiring in a third opening provided in the fourth insulating film;

a third wiring over the fourth insulating film;

a fifth insulating film over the first electrode and the third wiring;

a light-emitting layer over the first electrode and the fifth insulating film; and

a second electrode over the third wiring, the fifth insulating film, and the light-emitting layer, wherein the second electrode is in contact with the third wiring in a fourth opening and overlaps the first electrode with the light-emitting layer therebetween,

wherein the third wiring overlaps the semiconductor film,

wherein the first electrode and the third wiring are on and in contact with the fourth insulating film,

wherein the third wiring overlaps the second wiring, and

wherein the fifth insulating film is located in the third opening.

2. The display device according to claim 1 , wherein the semiconductor film is a polycrystalline silicon film.

3. The display device according to claim 1 , wherein the third wiring overlaps the second opening.

4. The display device according to claim 1 , wherein the third wiring is an auxiliary wiring.

5. The display device according to claim 1 , wherein the second wiring is a power supply line.

6. The display device according to claim 1 , wherein the semiconductor film comprises an impurity region.

7. A display device comprising:

a pixel portion comprising:

a semiconductor film;

a first insulating film over the semiconductor film;

a second insulating film over the first insulating film;

a third insulating film over the second insulating film;

a first wiring over the third insulating film, wherein the first wiring is in contact with the semiconductor film in a first opening provided in the first insulating film, the second insulating film, and the third insulating film;

a second wiring over the third insulating film, wherein the second wiring is in contact with the semiconductor film in a second opening provided in the first insulating film, the second insulating film, and the third insulating film;

a fourth insulating film over the first wiring and the second wiring;

a first electrode over the fourth insulating film, wherein the first electrode is in contact with the first wiring in a third opening provided in the fourth insulating film;

a third wiring over the fourth insulating film;

a fifth insulating film over the first electrode and the third wiring;

a light-emitting layer over the first electrode and the fifth insulating film; and

a second electrode over the third wiring, the fifth insulating film, and the light-emitting layer, wherein the second electrode is in contact with the third wiring in a fourth opening and overlaps the first electrode with the light-emitting layer therebetween,

wherein the third wiring overlaps the semiconductor film,

wherein the first electrode and the third wiring are on and in contact with the fourth insulating film,

wherein the first electrode and the third wiring are formed of the same material as each other,

wherein the third wiring overlaps the second wiring, and

wherein the fifth insulating film is located in the third opening.

8. The display device according to claim 7 , wherein the semiconductor film is a polycrystalline silicon film.

9. The display device according to claim 7 , wherein the third wiring overlaps the second opening.

10. The display device according to claim 7 , wherein the third wiring is an auxiliary wiring.

11. The display device according to claim 7 , wherein the second wiring is a power supply line.

12. The display device according to claim 7 , wherein the semiconductor film comprises an impurity region.

13. A display device comprising:

a pixel portion comprising:

a semiconductor film;

a first insulating film over the semiconductor film;

a gate electrode over the first insulating film;

a second insulating film over the first insulating film and the gate electrode;

a third insulating film over the second insulating film;

a first wiring over the third insulating film, wherein the first wiring is in contact with the semiconductor film in a first opening provided in the first insulating film, the second insulating film, and the third insulating film;

a second wiring over the third insulating film, wherein the second wiring is in contact with the semiconductor film in a second opening provided in the first insulating film, the second insulating film, and the third insulating film;

a fourth insulating film over the first wiring and the second wiring;

a first electrode over the fourth insulating film, wherein the first electrode is in contact with the first wiring in a third opening provided in the fourth insulating film;

a third wiring over the fourth insulating film;

a fifth insulating film over the first electrode and the third wiring;

a light-emitting layer over the first electrode and the fifth insulating film; and

a second electrode over the third wiring, the fifth insulating film, and the light-emitting layer, wherein the second electrode is in contact with the third wiring in a fourth opening and overlaps the first electrode with the light-emitting layer therebetween,

wherein the third wiring overlaps the semiconductor film,

wherein the first electrode and the third wiring are on and in contact with the fourth insulating film,

wherein the third wiring overlaps the second wiring, and

wherein the fifth insulating film is located in the third opening.

14. The display device according to claim 13 , wherein the semiconductor film is a polycrystalline silicon film.

15. The display device according to claim 13 , wherein the third wiring overlaps the second opening.

16. The display device according to claim 13 , wherein the third wiring is an auxiliary wiring.

17. The display device according to claim 13 , wherein the second wiring is a power supply line.

18. The display device according to claim 13 , wherein the semiconductor film comprises an impurity region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2014
From: MIYAGI, NORIKO; SAKAKURA, MASAYUKI; ARAO, TATSUYA; NAGAO, RITSUKO; TANADA, YOSHIFUMI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 033327/0054 →
Priority Claims (1)
JP 2003-171431 · Jun 16, 2003 · national
Continuity (4)
Continuation 13104074 · May 10, 2011
Continuation 11620120 · Jan 5, 2007
Continuation 10867226 · Jun 15, 2004
Related Publication 20140293207A1 · Oct 2, 2014