IP Library › Granted Patent US 9,278,846
Granted Patent B2
US 9,278,846 · App. 13/821,793 · Granted Mar 8, 2016

Micromachined monolithic 6-axis inertial sensor

Inventor: Cenk Acar (Newport Coast, CA)
Assignee: Fairchild Semiconductor Corporation
B81B3/0018B81C1/00158G01C19/5712G01C19/5755G01P15/125G01P15/18G01P2015/082G01P2015/084
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Quick Facts
Patent No.
US 9,278,846
App. No.
13/821,793
Granted
Mar 8, 2016
Kind
B2
Abstract

The device layer of a 6-degrees-of-freedom (6-DOF) inertial measurement system can include a single proof-mass 6-axis inertial sensor formed in an x-y plane, the inertial sensor including: a main proof-mass section suspended about a single, central anchor; a central suspension system configured to suspend the 6-axis inertial sensor from the single, central anchor; and a drive electrode including a moving portion and a stationary portion, the moving portion coupled to the radial portion. The drive electrode and the central suspension system are configured to oscillate the 6-axis inertial sensor about a z-axis normal to the x-y plane.

Claims (40)

1. A 6-degrees-of-freedom (6-DOF) inertial measurement system, comprising:

a device layer including a single proof-mass 6-axis inertial sensor formed in an x-y plane, the single proof-mass 6-axis inertial sensor including:

a main proof-mass section suspended about a single, central anchor, the main proof-mass section including a radial portion extending outward towards an edge of the 6-axis inertial sensor;

a pair of x-axis proof-mass sections coupled to the main proof-mass section using multi-function flexure bearings and coupled to each other using an anti-phase flexure bearing;

a central suspension system configured to suspend the 6-axis inertial sensor from the single, central anchor; and

a drive electrode including a moving portion and a stationary portion, the moving portion coupled to the radial portion, wherein the drive electrode and the central suspension system are configured to oscillate the 6-axis inertial sensor about a z-axis normal to the x-y plane at a drive frequency;

a cap wafer bonded to a first surface of the device layer; and

a via wafer bonded to a second surface of the device layer, wherein the cap wafer and the via wafer are configured to encapsulate the single proof-mass 6-axis inertial sensor.

2. The system of claim 1 , wherein the multi-function flexure bearings are configured to allow the first and second x-axis proof-mass sections to move in-phase or anti-phase along an x-axis of the x-y plane.

3. The system of claim 2 , wherein the multi-function flexure bearings are configured to allow the first and second x-axis proof-mass sections to move in-phase along the x-axis in response to an x-axis acceleration.

4. The system of claim 2 , wherein the multi-function flexure bearings are configured to allow the first and second x-axis proof-mass sections to move anti-phase along the x-axis in response to a z-axis rotation.

5. The system of claim 1 , wherein the multi-function flexure bearings are configured to allow each of the first and second x-axis proof-mass sections to rotate about a y-axis of the x-y plane in response to a z-axis acceleration.

6. The system of claim 1 , wherein at least one of the multi-function flexure bearings is elongate, extending between the main proof-mass section and the first x-axis proof-mass section along a y-axis of the x-y plane.

7. The system of claim 6 , wherein the at least one multi-function flexure bearing is configured to be flexed under torsion about an axis parallel to the y-axis.

8. The system of claim 7 , wherein four multi-function flexure bearings couple the single proof-mass to the first and second x-axis proof-mass sections, wherein for each multi-function flexure bearing there is an opposing multi-function bearing mirrored about an x-z plane, and another multi-function bearing mirrored about an y-z plane.

9. The system of claim 1 , wherein the anti-phase flexure bearing that is elongate extending along a y-axis of the x-y plane.

10. The system of claim 9 , wherein two anti-phase flexure bearings couple the first x-axis proof-mass section to the second x-axis proof-mass section on opposing sides of an x-z plane.

11. The system of claim 10 , wherein each of the two anti-phase flexure bearings zigzag as they extend along an x-axis between the first and second x-axis proof-mass sections.

12. The system of claim 1 , wherein the single proof-mass inertial sensor is quadrilateral in shape, wherein the single, central anchor is centered in the quadrilateral, and wherein the main proof-mass section includes four radial portions extending outward towards the four corners of the 6-axis inertial sensor.

13. The system of claim 1 , wherein the drive electrode includes a plurality of moving fingers interdigitated with a plurality of stationary fingers, and wherein the stationary fingers are anchored to the via wafer.

14. The system of claim 1 , including:

first electrodes in-plane with the device layer and configured to detect z-axis angular rotation, x-axis acceleration, and y-axis acceleration; and

second electrodes out-of-plane with the device layer and configured to detect z-axis acceleration, x-axis angular rotation, and y-axis angular rotation.

15. A single proof-mass, micromachined, monolithic, 6-axis inertial sensor apparatus, comprising:

a main proof-mass section forming an x-y plane suspended about a single, central anchor, the main proof-mass section including radial portions extending outward towards an edge of the 6-axis inertial sensor;

a pair of x-axis proof-mass sections coupled to the main proof-mass section using multi-function flexure bearings and coupled to each other using an anti-phase flexure bearing;

a pair of y-axis proof-mass sections coupled to multiple radial portions of the main proof-mass section using elongated flexure bearings;

a central suspension system configured to suspend the 6-axis inertial sensor from the single, central anchor; and

a drive electrode including a moving portion and a stationary portion, the moving portion coupled to the radial portions, wherein the drive electrode and the central suspension system are configured to oscillate the 6-axis inertial sensor about a z-axis normal to the x-y plane at a drive frequency.

16. The apparatus of claim 15 , wherein the multi-function flexure bearings are configured to allow the pair of x-axis proof-mass sections to move in-phase or anti-phase along an x-axis of the x-y plane.

17. The apparatus of claim 16 , wherein the multi-function flexure bearings are configured to allow the pair of x-axis proof-mass sections to move in-phase along the x-axis in response to an x-axis acceleration, and anti-phase along the x-axis in response to a z-axis rotation.

18. The apparatus of claim 15 , wherein the multi-function flexure bearings are configured to allow each of the pair of x-axis proof-mass sections to rotate about a y-axis of the x-y plane in response to a z-axis acceleration.

19. A method, comprising:

suspending a single proof-mass of a 6-axis inertial sensor about a single, central anchor coupled to a stationary layer using a central suspension, the single proof-mass including a main proof-mass section including a radial portion extending outward towards an edge of the 6-axis inertial sensor;

suspending first and second x-axis proof-mass sections from the main proof-mass section using multi-function flexure bearings;

coupling the first and second x-axis proof-mass sections to each other using an anti-phase flexure bearing;

anchoring a stationary drive electrode to the stationary layer;

coupling a moveable electrode to the stationary electrode; and

oscillating the single proof-mass at a drive frequency using the stationary drive electrode, the moveable electrode, and the central suspension.

20. The method of claim 19 , wherein the multi-function flexure bearings are configured to allow the first and second x-axis proof-mass sections to move in-phase along the x-axis in response to an x-axis acceleration, anti-phase along the x-axis in response to a z-axis rotation, and to rotate about the y-axis in response to a z-axis acceleration.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 058871, FRAME 0799 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 065653/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 040075, FRAME 0644 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0536 →
SECURITY INTEREST Recorded Nov 12, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 058871/0799 →
RELEASE OF SECURITY INTEREST Recorded Oct 28, 2021
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 057969/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 057694/0374 →
PATENT SECURITY AGREEMENT Recorded Sep 19, 2016
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 040075/0644 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 23, 2013
From: ACAR, CENK
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 030893/0537 →
Continuity (2)
Provisional Application 61384240 · Sep 18, 2010
Related Publication 20130270657A1 · Oct 17, 2013