IP Library › Granted Patent US 9,347,877
Granted Patent B2
US 9,347,877 · App. 13/687,456 · Granted May 24, 2016

Laser gas analyzer

Inventors: Takaaki Hirata (Musashino, JP); Yasuhiko Mitsumoto (Musashino, JP); Masaya Ooyama (Musashino, JP); Nobuhiko Kanbara (Musashino, JP); Naoyuki Fujimura (Musashino, JP); Minoru Maeda (Musashino, JP); Tadashi Sugiyama (Musashino, JP); Alan Cowie (Friendswood, TX); Jie Zhu (Pearland, TX)
Assignee: YOKOGAWA ELECTRIC CORPORATION
G01N21/39G01N21/3504G01N21/359
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Quick Facts
Patent No.
US 9,347,877
App. No.
13/687,456
Granted
May 24, 2016
Kind
B2
Abstract

A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.

Claims (17)

1. A laser gas analyzer comprising:

a wavelength-variable laser having a wavelength-variable width;

a calibrating gas cell in which wavelength calibrating gas is sealed, wherein the light of the wavelength-variable laser is made to be incident to the calibrating gas cell;

a light-split module configured to split an output light of the calibrating gas cell into a measurement light and a reference light, the reference light is for wavelength calibration;

a first gas cell into which gases to be measured are introduced, wherein the measurement light is made to be incident to the first gas cell;

a photoelectric section configured to convert the reference light and an output light of the first gas cell into electrical signals; and

a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to the output light of the first gas cell, and to obtain concentrations of the respective gases to be measured based on areas of the absorption lines of the gasses to be measured, wherein the data processor includes;

an absorption line wavelength data storage configured to store absorption line wavelength data of the gases to be measured;

a wavelength calibrator into which the reference signal and the absorption signal are inputted and which is connected to the absorption line wavelength data storage, configured to calibrate wavelength of the absorption spectrum based on the absorption line wavelength data, the reference signal, and the absorption signal, and to obtain an absorption spectrum of an absorbance by performing division of the wavelength-calibrated reference signal and the absorption signal;

an absorption spectrum data storage configured to store absorption spectrum data of the gases to be measured;

a spectrum separator into which the absorption spectrum of the absorbance is inputted from the wavelength calibrator and which is connected to the absorption spectrum data storage, and configured to separate the absorption spectrum of the absorbance of each of the gases to be measured from the absorption spectrum of the absorbance;

an area-to-concentration ratio data storage configured to store wavelength range data used for calculating areas of the absorption lines of the gases to be measured and to store proportional constant data of the area and gas partial pressure; and

a concentration detector into which the absorption spectrum of each of the gases to be measured is inputted from the spectrum separator and which is connected to the area-to-concentration ratio data storage, configured to obtain an area of a designated wavelength range, and to calculate partial pressures of the gases to be measured.

2. The laser gas analyzer according to claim 1 ,

wherein the wavelength calibrator is configured to compare an absorption line of a wavelength calibrating gas and known absorption line.

3. The laser gas analyzer according to claim 2 ,

wherein the wavelength calibrator is configured to compare the absorption line of the wavelength calibrating gas and the known absorption line using polynomial approximation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 28, 2012
From: HIRATA, TAKAAKI; MITSUMOTO, YASUHIKO; OOYAMA, MASAYA; KANBARA, NOBUHIKO; FUJIMURA, NAOYUKI; MAEDA, MINORU; SUGIYAMA, TADASHI; COWIE, ALAN; ZHU, JIE
To: YOKOGAWA ELECTRIC CORPORATION
Reel/Frame 029366/0108 →
Priority Claims (1)
JP 2011-258910 · Nov 28, 2011 · national
Continuity (1)
Related Publication 20130135619A1 · May 30, 2013