IP Library › Granted Patent US 9,362,320
Granted Patent B2
US 9,362,320 · App. 14/295,047 · Granted Jun 7, 2016

Integrated circuit having a level shifter and method of making the same

Inventors: Yuichiro Yamashita (Hsinchu, TW); Po-Sheng Chou (Baoshan Township, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
H01L27/14605H01L27/1469H01L27/14612H01L27/14634H01L27/14689H01L28/40
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Quick Facts
Patent No.
US 9,362,320
App. No.
14/295,047
Granted
Jun 7, 2016
Kind
B2
Abstract

Integrated circuit (IC), and method of forming an IC, in which a photodiode having a photodiode output is coupled to a column line. A transfer transistor is coupled to the photodiode and to the column line. A first reset transistor is coupled to the photodiode and to the column line at a first node. The first node is between the transfer transistor and the column line. A second reset transistor is coupled to the photodiode and to the column line at a second node. The second node is between the first node and the column line. A source follower transistor is coupled to the photodiode and to the column line. The source follower transistor is between the second node and the column line. A level shifter is coupled to the photodiode and to the column line. The level shifter is between the first node and the second node.

Claims (52)

1. An integrated circuit comprising:

a photodiode, the photodiode having a photodiode output;

a column line electrically coupled to the photodiode;

a transfer transistor electrically coupled to the photodiode and to the column line, the transfer transistor being between the photodiode output and the column line;

a first reset transistor electrically coupled to the photodiode and to the column line at a first node, the first node being between the transfer transistor and the column line;

a second reset transistor electrically coupled to the photodiode and to the column line at a second node, the second node being between the first node and the column line;

a source follower transistor electrically coupled to the photodiode and to the column line, the source follower transistor being between the second node and the column line; and

a level shifter electrically coupled to the photodiode and to the column line, the level shifter being between the first node and the second node.

2. The integrated circuit of claim 1 , wherein the level shifter comprises a capacitor.

3. The integrated circuit of claim 2 , wherein the capacitor is a metal-oxide-metal capacitor.

4. The integrated circuit of claim 2 , wherein the capacitor is a metal-insulator-metal capacitor.

5. The integrated circuit of claim 2 , wherein the source follower transistor comprises a first gate having a first oxide thickness, the transfer transistor comprises a second gate having a second oxide thickness, the first reset transistor comprises a third gate having a third oxide thickness, and the first oxide thickness of the first gate is less than the second oxide thickness of the second gate and the third oxide thickness of the third gate.

6. The integrated circuit of claim 2 , further comprising:

a first substrate; and

a second substrate separate from the first substrate,

wherein the photodiode is on the first substrate and the source follower transistor is on the second substrate.

7. The integrated circuit of claim 6 , wherein the integrated circuit further comprises:

a first electrode proximate a first edge of the first substrate; and

a second electrode proximate a second edge of the second substrate,

wherein the photodiode on the first substrate and the source follower transistor on the second substrate are electrically coupled by way of the first electrode and the second electrode.

8. The integrated circuit of claim 7 , wherein the capacitor is formed by the first electrode and the second electrode, and a capacitance of the capacitor is based, at least in part, on a distance between the first electrode and the second electrode.

9. The integrated circuit of claim 8 , wherein the first substrate is bonded to the second substrate at a bonding boundary, the first electrode is proximate the bonding boundary, the second electrode is proximate the bonding boundary, and the capacitor is formed at the bonding boundary.

10. The integrated circuit of claim 6 , wherein the second reset transistor is on the second substrate.

11. The integrated circuit of claim 10 , wherein the source follower transistor and the second reset transistor are PMOS transistors.

12. The integrated circuit of claim 11 , wherein the first reset transistor is on the second substrate.

13. The integrated circuit of claim 10 , wherein the capacitor is on the second substrate.

14. The integrated circuit of claim 6 , wherein the first substrate is over the second substrate.

15. An image sensor comprising:

a first substrate;

a second substrate;

a photodiode on the first substrate, the photodiode having a photodiode output;

a column line electrically coupled to the photodiode;

a first transistor electrically coupled to the photodiode and to the column line, the first transistor being between the photodiode output and the column line;

a second transistor electrically coupled to the photodiode and to the column line at a first node, the first node being between the first transistor and the column line;

a third transistor electrically coupled to the photodiode and to the column line at a second node, the second node being between the first node and the column line;

a fourth transistor on the second substrate and electrically coupled to the photodiode and to the column line, the fourth transistor being between the second node and the column line; and

a level shifter electrically coupled to the photodiode and to the column line, the level shifter being between the first node and the second node.

16. The image sensor of claim 15 , wherein the level shifter comprises a metal-oxide-metal capacitor.

17. The image sensor of claim 15 , wherein the level shifter comprises a metal-insulator-metal capacitor.

18. The image sensor of claim 15 , further comprising:

a first electrode proximate a first edge of the first substrate; and

a second electrode proximate a second edge of the second substrate,

wherein the photodiode on the first substrate and the fourth transistor on the second substrate are electrically coupled by way of the first electrode and the second electrode.

19. The image sensor of claim 18 , wherein the level shifter comprises a capacitor formed by the first electrode and the second electrode, and a capacitance of the capacitor is based, at least in part, on a distance between the first electrode and the second electrode.

20. A method of forming an image sensor, the method comprising:

forming a photodiode, the photodiode having a photodiode output;

forming a column line electrically coupled to the photodiode;

forming a transfer transistor electrically coupled to the photodiode and to the column line, the transfer transistor being between the photodiode output and the column line;

forming a first reset transistor electrically coupled to the photodiode and to the column line at a first node, the first node being between the transfer transistor and the column line;

forming a second reset transistor electrically coupled to the photodiode and to the column line at a second node, the second node being between the first node and the column line;

forming a source follower transistor electrically coupled to the photodiode and to the column line, the source follower transistor being between the second node and the column line; and

forming a level shifter electrically coupled to the photodiode and to the column line, the level shifter being between the first node and the second node.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2014
From: YAMASHITA, YUICHIRO; CHOU, PO-SHENG
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 033021/0998 →
Continuity (1)
Related Publication 20150349005A1 · Dec 3, 2015