IP Library › Granted Patent US 9,447,517
Granted Patent B2
US 9,447,517 · App. 13/996,071 · Granted Sep 20, 2016

Seed material for liquid phase epitaxial growth of monocrystalline silicon carbide, and method for liquid phase epitaxial growth of monocrystalline silicon

Inventors: Satoshi Torimi (Kanonji, JP); Satoru Nogami (Kanonji, JP); Tsuyoshi Matsumoto (Kanonji, JP)
Assignee: TOYO TANSO CO., LTD.
C30B19/12C30B28/12C30B29/36Y10T428/26
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Quick Facts
Patent No.
US 9,447,517
App. No.
13/996,071
Granted
Sep 20, 2016
Kind
B2
Abstract

Provided is an inexpensive seed material for liquid phase epitaxial growth of silicon carbide. A seed material 12 for liquid phase epitaxial growth of a monocrystalline silicon carbide includes a surface layer containing a polycrystalline silicon carbide with a 3C crystal polymorph. Upon Raman spectroscopic analysis of the surface layer with an excitation wavelength of 532 nm, a peak other than a TO peak and an LO peak is observed as a peak derived from the polycrystalline silicon carbide with a 3C crystal polymorph.

Claims (14)

1. A method for liquid phase epitaxial growth of a monocrystalline silicon carbide comprising the steps of:

preparing a seed material and a feed material, the seed material including a surface layer containing a polycrystalline silicon carbide with a 3C crystal polymorph, wherein upon Raman spectroscopic analysis of the surface layer with an excitation wavelength of 532 nm, a peak other than a TO peak and an LO peak is observed as a peak derived from the polycrystalline silicon carbide with a 3C crystal polymorph; and

heating the seed material and the feed material with the surface layers of the seed material and the feed material facing each other through a silicon melt layer to epitaxially grow a monocrystalline silicon carbide on the surface layer of the seed material.

2. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the peak other than the TO peak and the LO peak is observed at a lower wavenumber than that of the TO peak.

3. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the peak other than the TO peak and the LO peak has a peak intensity 0.3 or greater times the peak intensity of the TO peak.

4. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the absolute amount of shift of the LO peak from 972 cm −1 is 4 cm −1 or more.

5. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 4 , wherein the amount of shift of the LO peak from 972 cm −1 is 4 cm −1 or more.

6. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the full width at half-maximum of the LO peak is 15 cm −1 or less.

7. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the surface layer contains a polycrystalline silicon carbide with a 3C crystal polymorph as a major ingredient.

8. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 7 , wherein the surface layer is substantially made of the polycrystalline silicon carbide with a 3C crystal polymorph.

9. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the seed material including: a support member; and a polycrystalline silicon carbide film formed on the support member and forming the surface layer.

10. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 9 , wherein the polycrystalline silicon carbide film has a thickness within a range of 30 μm to 800 μm.

11. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the seed material being formed of a polycrystalline silicon carbide material containing a polycrystalline silicon carbide with a 3C crystal polymorph.

12. The method for liquid phase epitaxial growth of a monocrystalline silicon carbide according to claim 1 , wherein the surface layer of the feed material contains a polycrystalline silicon carbide with a 3C crystal polymorph.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2013
From: TORIMI, SATOSHI; NOGAMI, SATORU; MATSUMOTO, TSUYOSHI
To: TOYO TANSO CO., LTD.
Reel/Frame 030651/0054 →
Priority Claims (1)
JP 2010-288476 · Dec 24, 2010 · national
Continuity (1)
Related Publication 20130263774A1 · Oct 10, 2013