IP Library Granted Patent US 9,486,834
Granted Patent B2
US 9,486,834 · App. 14/235,626 · Granted Nov 8, 2016

Ferroelectric film and method for manufacturing the same

Inventors: Takeshi Kijima (Chiba, JP); Yuuji Honda (Chiba, JP)
Assignee: YOUTEC CO., LTD.
B05D5/00H01L41/0815H01L41/1873H01L41/1878H01L41/318Y10T428/26
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Quick Facts
Patent No.
US 9,486,834
App. No.
14/235,626
Granted
Nov 8, 2016
Kind
B2
Abstract

To produce a ferroelectric film formed of a lead-free material. The ferroelectric film according to an aspect of the present invention includes a (K 1−X Na X )NbO 3 film or a BiFeO 3 film having a perovskite structure and a crystalline oxide preferentially oriented to (001) formed on at least one of the upper side and lower side of the (K 1−X Na X )NbO 3 film or BiFeO 3 film, and X satisfies the formula below 0.3≦X≦0.7.

Claims (45)

1. A ferroelectric film comprising:

a (K 1−x Na x )NbO 3 film or a BiFeO 3 film having a perovskite structure; and

a crystalline oxide preferentially oriented to (001), formed on at least one of an upper side and lower side of said (K 1−x Na x )NbO 3 film or BiFeO 3 film,

wherein said crystalline oxide is a bismuth layered-structure ferroelectric substance having a pseudo-perovskite structure or a tungsten-bronze type ferroelectric substance,

wherein said bismuth layered-structure ferroelectric substance is (Bi 2 O 2 ) 2 + (A m−1 B m O 3+1 ) 2− (m=1 to 5) or Bi 2 A m−1 B m O 3m+3 (m=1 to 5), and

wherein X satisfies the formula below

0.3≦X≦0.7.

2. The ferroelectric film according to claim 1 ,

wherein said crystalline oxide is formed in an island shape or in a film shape.

3. The ferroelectric film according to claim 1 ,

wherein a thickness of said crystalline oxide is 2 to 30 nm.

4. The ferroelectric film according to claim 1 ,

wherein said (K 1−x Na x )NbO 3 film or BiFeO 3 film is formed by a sol-gel method.

5. The ferroelectric film according to claim 1 ,

wherein a ferroelectric film including said (K 1−x Na x )NbO 3 film or BiFeO 3 film, and said crystalline oxide formed on at least one of the upper side and lower side thereof is stacked.

6. A ferroelectric film comprising:

a (K 1−x Na x )NbO 3 film or a BiFeO 3 film having a perovskite structure; and

a crystalline oxide preferentially oriented to (001), formed on at least one of an upper side and lower side of said (K 1−x Na x )NbO 3 film or BiFeO 3 film,

wherein said crystalline oxide is a tungsten-bronze type ferroelectric substance, and

wherein X satisfies the formula below

0.3<X<0.7.

7. The ferroelectric film according to claim 6 ,

wherein said crystalline oxide is formed in an island shape or in a film shape.

8. The ferroelectric film according to claim 6 ,

wherein a thickness of said crystalline oxide is 2 to 30 nm.

9. The ferroelectric film according to claim 6 ,

wherein said (K 1−x Na x )NbO 3 film or BiFeO 3 film is formed by a sol-gel method.

10. The ferroelectric film according to claim 6 ,

wherein a ferroelectric film including said (K 1−x Na x )NbO 3 film or BiFeO 3 film, and said crystalline oxide formed on at least one of the upper side and lower side thereof is stacked.

11. A ferroelectric film comprising:

a (K 1−x Na x )NbO 3 film or a BiFeO 3 film having a perovskite structure; and

a crystalline oxide preferentially oriented to (001), formed on at least one of an upper side and lower side of said (K 1−x Na x )NbO 3 film or a BiFeO 3 film,

wherein X satisfies the formula below

0.3<X<0.7,

wherein said crystalline oxide is a bismuth layered-structure ferroelectric substance having a pseudo-perovskite structure or a tungsten-bronze type ferroelectric substance, and

wherein said bismuth layered-structure ferroelectric substance is Bi 4 Ti 3 O 12 or (Bi 4−x La x )Ti 3 O 12 , and x satisfies the formula below

0<x<1.

12. The ferroelectric film according to claim 11 ,

wherein said crystalline oxide is formed in an island shape or in a film shape.

13. The ferroelectric film according to claim 11 ,

wherein a thickness of said crystalline oxide is 2 to 30 nm.

14. The ferroelectric film according to claim 11 ,

wherein said (K 1−x Na x )NbO 3 film or BiFeO 3 film is formed by a sol-gel method.

15. The ferroelectric film according to claim 11 ,

wherein a ferroelectric film including said (K 1−x Na x )NbO 3 film or BiFeO 3 film, and said crystalline oxide formed on at least one of the upper side and lower side thereof is stacked.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Jul 1, 2022
From: ADVANCED MATERIAL TECHNOLOGIES, INC.
To: UMI I INVESTMENT LIMITED PARTNERSHIP
Reel/Frame 060572/0037 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2022
From: ADVANCED MATERIAL TECHNOLOGIES, INC.
To: KRYSTAL INC.
Reel/Frame 060572/0227 →
SECURITY INTEREST Recorded Jan 25, 2022
From: ADVANCED MATERIAL TECHNOLOGIES, INC.
To: UMI I INVESTMENT LIMITED PARTNERSHIP
Reel/Frame 058763/0517 →
CHANGE OF NAME Recorded Jun 29, 2018
From: YOUTEC CO., LTD.
To: ADVANCED MATERIAL TECHNOLOGIES, INC.
Reel/Frame 046463/0924 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2016
From: KIJIMA, TAKESHI; HONDA, YUUJI
To: YOUTEC CO., LTD.
Reel/Frame 039954/0633 →
Continuity (1)
Related Publication 20140242379A1 · Aug 28, 2014