Three dimensional strained semiconductors

1. An apparatus, comprising:

a substrate;

an array of three dimensional semiconductor structures positioned above the substrate, wherein each three dimensional structure comprises a bottom surface, a top surface and at least one side surface connecting the bottom surface and the top surface;

a cavity region between each of the three dimensional structures; and

a thin film located in each cavity region and surrounding each side surface of each three dimensional structure, the thin film being configured to induce a volumetric strain in at least a portion of each three dimensional structure,

wherein a separation between the three dimensional semiconductor structures is non-uniform.

2. The apparatus of claim 1 , wherein the three dimensional structures have a pitch in a range from about 10 nm to about 10 μm.

3. The apparatus of claim 1 , wherein a thickness of the thin film is less than a height of each three dimensional semiconductor structure, wherein the thickness of the thin film and the height of each three dimensional semiconductor structure is measured in a direction perpendicular to a plane extending along the bottom surfaces of the three dimensional semiconductor structures.

4. The apparatus of claim 1 , wherein the thin film comprises a material selected from the group consisting of: B, Al 2 O 3 , TiO 2 , Ta 2 O 5 , a metal, and combinations thereof.

5. The apparatus of claim 4 , wherein the thin film comprises a dopant, the dopant comprising at least one of: carbon and hydrogen.

6. The apparatus of claim 1 , wherein a bandgap of a bulk of the three dimensional structures is affected by the induced volumetric strain.

7. The apparatus of claim 1 , wherein the induced volumetric strain is within 10% of a fracture point of the three dimensional structures.

8. The apparatus of claim 1 , wherein the induced strain is in at least 50% of the volume of the three dimensional structures.

9. The apparatus of claim 1 , wherein the induced strain is in at least 90% of a volume of the three dimensional structures.

10. The apparatus of claim 1 , wherein each three dimensional structure has an upper portion and a lower portion, wherein the upper portion has a smaller average diameter relative to an average diameter of the lower portion, wherein the diameters are measured parallel to the bottom surface of the three dimensional structure.

11. The apparatus of claim 1 , wherein the array comprises a semiconductor material including a III-V or II-VI material.

12. The apparatus of claim 1 , wherein the induced strain is between 0.05 and 5%.

13. The apparatus of claim 1 , wherein at least some of the three dimensional structures each comprise a pillar having a rounded cross sectional shape, the cross section being taken perpendicular to a longitudinal axis of the pillar.

14. The apparatus of claim 1 , wherein at least some of the three dimensional structures each comprise a cross sectional shape selected from the group consisting of: a circle, a rectangle, a square, an octagon, a hexagon, a triangle, and an ellipsoid, wherein the cross section is taken perpendicular to a longitudinal axis of the three dimensional structure.

15. The apparatus of claim 1 , wherein the thin film comprises a dielectric material.

16. The apparatus of claim 1 , wherein the thin film comprises a material selected from the group consisting of: SiO 2 , SiN x , SiO x N y , B, and combinations thereof.

17. The apparatus of claim 1 , wherein the thin film is non-crystalline.

18. The apparatus of claim 1 , wherein the apparatus is functional as at least one of a photovoltaic, a photodiode, a light emitting diode, a laser diode, and an electronic diode.

19. The apparatus of claim 1 , wherein the induced-strain is a tensile strain and/or compressive strain.