Detection system and method of detecting corrosion under an outer protective layer
Incoherent millimeter wave, sub-millimeter wave and terahertz test signals are used to probe metal substrates that are covered by a protective coating or outer layer, such as paint or thermal insulation, obscuring direct assessment of the substrate. The incoherent test signals, which may be from a naturally occurring passive source (such as the sky) and/or from an active noise source, provide signal dispersion and angular variation of the test signals with respect to angular incidence to the substrate. Illumination of the substrate permits differentiation between un-corroded and corroded sections of the sample because reflectivity (and emissivity) from a metal-based substrate is heavily dependent on the surface resistivity which in turn is dependent on the corroded state. A detector/camera is arranged to pick up reflections from the substrate and an associated control system identifies regions of the sample that reflect the test signal illumination differently or otherwise indicate a variation from a reference value. The differences therefore signify the presence or lack of corrosion or, indeed, the presence of other abnormalities within or on the substrate.
1. A method of detecting the presence of anomalies in or on a substrate covered by a protective coating or layer, the method comprising:
observing reflectivity from the substrate arising from incident electromagnetic waves produced from wide-angled illumination from a first incoherent passive source, the incident electromagnetic waves having millimeter or sub-millimeter wavelengths or having a frequency below about thirty terahertz;
identifying the presence of anomalies in the substrate by at least one of:
contrasting observed reflectivity in adjacent areas of the substrate, and
contrasting observed reflectivity of an area of the substrate under test against a reference reflectivity value anticipated for the area of the substrate under test;
observing reflectivity from the substrate arising from incident electromagnetic waves produced from wide-angled illumination from an incoherent active source that is different to the first incoherent passive source, the incident electromagnetic waves from the incoherent active source having millimeter or sub-millimeter wavelengths or having a frequency below about thirty terahertz; and
identifying the presence of anomalies in the substrate by contrasting spectral reflectivity profiles observed from the passive source and the active source.
2. The method of claim 1 , further comprising:
assessing structural integrity of a layer on, or coating covering, the substrate by evaluating transmissivity through the layer or coating, the evaluation contrasting differences in the spectral reflectivity profiles observed using the passive source and the active source; and
generating an output in the event that the transmissivity between the observed spectral reflectivity profiles from the passive source and the active source exceeds a threshold.
3. The method of claim 1 , further comprising:
determining emissivity from the substrate at two different temperatures to assess whether a change in emissivity has occurred between the two different temperatures; and
generating an output in the event that the change in emissivity exceeds a predetermined threshold, the output indicating the presence of at an anomaly in or on the substrate.
4. The method of claim 3 , wherein the source is at a temperature differential to the substrate, the temperature differential being at least one hundred Kelvin.
5. The method of claim 1 , wherein the first incoherent source is a passive source and the observed reflectivity is within frequency bands that are transparent with respect to atmospheric water and atmospheric oxygen.
6. The method of claim 5 , wherein the observations of reflectivity are targeted within at least one of the frequency ranges of:
between about 30 GHz and about 60 GHz;
between about 65 GHz and about 100 GHz;
between about 120 GHz and about 157 GHz;
between about 160 GHz and about 181 GHz;
between about 185 GHz and about 270 GHz; and
between about 320 GHz and about 360 GHz.
7. The method of claim 1 , wherein the first incoherent source is a passive source and the observed reflectivity is within frequency bands that are transparent with respect to atmospheric water and atmospheric oxygen.
8. A detection system identifying structural anomalies in a substrate covered by a layer or coating, the detection system comprising:
an imaging system including a detector configured to receive and detect, in use, reflectivity from a substrate under test, said reflectivity arising from illumination of the substrate by an incoherent, wide-angled source of electromagnetic waves, the detector configured to observe reflectivity within frequency bands that are transparent with respect to atmospheric water and atmospheric oxygen;
an active incoherent noise source providing, in use, selective wide-angled illumination of the substrate under investigation, the active incoherent noise source generating at least one of (i) millimeter wavelengths, (ii) sub-millimeter wavelengths and (iii) micron wavelength having a frequency below about thirty terahertz; and
a processor-based evaluation system responsive to the imaging system, the processor based evaluation system configured to present an indication of a difference in detected reflectivity between at least one of:
reflectivity evaluated from a plurality of different areas of the substrate, whereby the difference in reflectivity indicates an anomaly, and
observed reflectivity of an area of the substrate under test against a reference reflectivity value anticipated for the area of the substrate under test, whereby the difference in observed reflectivity relative to the reference reflectivity indicates an anomaly;
wherein the processor-based evaluation system being further configured to contrast relative levels of reflectivity from the substrate as produced by said active incoherent noise source and said passive source, and generate an indication of the presence of an anomaly in the substrate in the event that the contrast of measurable parameters for evaluated reflectivity under the active and passive sources yields a difference that exceeds a predetermined threshold.
9. The detection system according to claim 8 , wherein the processor-based evaluation system is further configured to provide an indication of confidence in structural integrity of a layer on, or coating covering, the substrate under test, the indication based on evaluating transmissivity through the layer or coating, the evaluation contrasting differences in the spectral reflectivity profiles observed using the passive source and the active source.
10. A detection system identifying structural anomalies in a substrate covered by a layer or coating, the detection system comprising:
an imaging system including a detector configured to receive and detect, in use, reflectivity from a substrate under test, said reflectivity arising from illumination of the substrate by an incoherent, wide-angled source of electromagnetic waves, the detector configured to observe reflectivity within frequency bands that are transparent with respect to atmospheric water and atmospheric oxygen;
a processor-based evaluation system responsive to the imaging system, the processor-based evaluation system configured to present an indication of a difference in detected reflectivity between at least one of:
reflectivity evaluated from a plurality of different areas of the substrate, whereby the difference in reflectivity indicates an anomaly, and
observed reflectivity of an area of the substrate under test against a reference reflectivity value anticipated for the area of the substrate under test, whereby the difference in observed reflectivity relative to the reference reflectivity indicates an anomaly; and
an active incoherent noise source providing, in use, selective wide-angled illumination of the substrate under investigation, the active incoherent noise source generating at least one of (i) millimeter wavelengths, (ii) sub-millimeter wavelengths and (iii) micron wavelength having a frequency below about thirty terahertz;
wherein the processor-based evaluation system is further configured to provide an indication of confidence in structural integrity of a layer on, or coating covering, the substrate under test, the indication based on evaluating transmissivity through the layer or coating, the evaluation contrasting differences in the spectral reflectivity profiles observed using the passive source and the active source.