IP Library Granted Patent US 9,534,951
Granted Patent B2
US 9,534,951 · App. 14/426,590 · Granted Jan 3, 2017

Measuring module for remission photometric analysis and method for the production thereof

Inventors: Jan Buchwald (Jena, DE); Susanne Gaumitz (Weida, DE); Stefan Kalveram (Viernheim, DE); Sebastian Trick (Mannheim, DE)
Assignees: Jenoptik Polymer Systems GmbH; Roche Diagnostics Operations, Inc.
G01J1/0411C23C14/22C23C14/221G01J1/42G01N21/474G02B5/20H01L31/167G01N2201/0633H01L25/167H01L2924/0002
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Quick Facts
Patent No.
US 9,534,951
App. No.
14/426,590
Granted
Jan 3, 2017
Kind
B2
Abstract

A measuring module for remission photometric analysis of one or a plurality of specimens is provided with the following features: a transmitter with a transmission channel for transmitting a measuring radiation to location of the specimen; a first focusing device for focusing the measuring radiation on the specimen; a receiver with a receiving channel to receive the radiation reflected by the specimen; a second focusing device made of plastic for focusing the measuring radiation reflected by the specimen onto the receiver, whereby the second focusing device further comprises a filter which is designed to filter a fluorescence radiation from the specimen excited by the measuring radiation.

Claims (21)

1. A measuring module for the remission photometric analysis of at least one specimen, the measuring module comprising:

a transmitting device with a transmitting channel emitting a measuring radiation to a location of the specimen;

a first focusing device focusing the measuring radiation onto the specimen;

a receiving device with a receiving channel receiving the radiation reflected by the specimen;

a second focusing device made of plastic focusing the measuring radiation reflected by the specimen onto the receiving device,

wherein the second focusing device also comprises a filter, wherein the filter is formed as a filter layer, wherein the filter layer is formed as a multilayered system and has a thickness greater than 0.5 μm and less than 4.5 μm,

the filter removing a secondary radiation that is excited by the measuring radiation including autofluorescence of the specimen, secondary maxima of the transmitting device, or ambient light.

2. The measuring module as claimed in claim 1 , wherein the individual layers of the multilayered system have a thickness of greater than 10 nm and less than 300 nm and comprise the following materials in alternating sequence: silicon oxide, tantalum pentoxide and/or titanium oxide.

3. The measuring module as claimed in claim 1 , wherein the transmitting device, the receiving device, the first and second focusing devices are arranged in one and the same housing, in particular made of plastic.

4. The measuring module as claimed in claim 1 , wherein the transmitting device is formed as one or a plurality of light-emitting diodes and the receiving device is formed as one or a plurality of photodiodes.

5. The measuring module as claimed in claim 1 , wherein the transmitting device and the receiving device are arranged in a first plane.

6. The measuring module as claimed in claim 5 , wherein the first focusing device and the second focusing device are arranged in a second plane, wherein the specimen is arranged in a third plane, and wherein the first plane is parallel to the second plane and the third plane.

7. The measuring module as claimed in claim 1 , wherein the first focusing device is an aspheric lens.

8. The measuring module as claimed in claim 1 , wherein the specimen is disposed in a specimen holder.

9. A method for producing a measuring module as claimed in claim 1 , the method comprising:

a) producing the first and second focusing devices by means of plastic;

b) encapsulating the first and second focusing devices in such a way that a housing is formed; and

c) vapor depositing a filter onto the second focusing device.

10. The method according to claim 9 , wherein steps a) and b) are performed in the reverse sequence, to be precise in such a way that first a housing is produced by means of plastic and then the housing with the first and second focusing devices is encapsulated.

11. The method as claimed in claim 9 , wherein method steps a) and b) are performed by the two-component injection-molding process.

12. The method as claimed in claim 9 , wherein step c), vapour depositing, is performed by a PVD vapor-depositing process with an ion-beam-assisted plasma source.

Assignments (3)
CHANGE OF NAME Recorded Feb 25, 2020
From: JENOPTIK POLYMER SYSTEMS GMBH
To: JENOPTIK OPTICAL SYSTEMS GMBH
Reel/Frame 052011/0509 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2016
From: ROCHE DIAGNOSTICS OPERATIONS, INC.
To: ROCHE DIABETES CARE, INC.
Reel/Frame 040518/0100 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2015
From: BUCHWALD, JAN; GAUMITZ, SUSANNE; KALVERAM, STEFAN; TRICK, SEBASTIAN
To: JENOPTIK POLYMER SYSTEMS GMBH; ROCHE DIAGNOSTICS OPERATIONS, INC.
Reel/Frame 036091/0028 →
Priority Claims (1)
DE 10 2012 018 015 · Sep 6, 2012 · national
Continuity (1)
Related Publication 20150241268A1 · Aug 27, 2015