Encoding information in multiple patterned layers
An article of manufacture includes a substrate, a first patterned layer deposited on the substrate in a first region, and a second patterned layer deposited on the substrate in a second region. The first patterned layer encodes first information in first symbols that are detectable by an optical sensor. The second patterned layer encodes second information in second symbols that are detectable by a non-optical sensor. The second information is distinct from the first information and the second region at least partially overlaps the first region.
1. A method comprising:
depositing a first patterned layer on a first region of a substrate, wherein the first patterned layer encodes first information in first symbols that are detectable by an optical sensor; and
depositing a second patterned layer on a second region of the substrate, the second region at least partially overlapping the first region, wherein the second patterned layer encodes second information in second symbols that are detectable by a non-optical sensor, wherein the second information is distinct from the first information.
2. The method of claim 1 , wherein the first patterned layer comprises an ink or pigment layer that reflects light having a wavelength in a human visible spectrum, and wherein the optical sensor is configured to detect the light having the wavelength in the human visible spectrum.
3. The method of claim 1 , wherein the first patterned layer comprises an ink or pigment layer that reflects light having a wavelength in a non-human visible spectrum, and wherein the optical sensor is configured to detect the light having the wavelength in the non-human visible spectrum.
4. The method of claim 1 , wherein the first patterned layer comprises one or more polymer layers, wherein the first symbols are represented by thicknesses of the one or more polymer layers such that a particular symbol corresponds to a first thickness of the one or more polymer layers and a different symbol corresponds to a second thickness of the one or more polymer layers, and wherein the optical sensor is configured to detect differences in thickness of the one or more polymer layers.
5. The method of claim 1 , wherein the second patterned layer comprises one or more polymer layers, wherein the second symbols are represented by thicknesses of the one or more polymer layers such that a particular symbol corresponds to a first thickness of the one or more polymer layers and a different symbol corresponds to a second thickness of the one or more polymer layers, and wherein the non-optical sensor is configured to detect differences in thickness of the one or more polymer layers.
6. The method of claim 1 , wherein the second patterned layer comprises magnetic particles, wherein the second symbols are indicated by locations of the magnetic particles, and wherein the non-optical sensor is configured to detect the locations of the magnetic particles.
7. The method of claim 6 , further comprising forming third symbols to encode third information by establishing magnetic orientations of poles of the magnetic particles, wherein the non-optical sensor or another sensor is configured to detect the magnetic orientations of the poles of the magnetic particles, and wherein the third information is distinct from the first information and is distinct from the second information.
8. The method of claim 1 , further comprising depositing a third patterned layer on a third region of the substrate, wherein the third region at least partially overlaps the first region, the second region, or both, wherein the third patterned layer encodes third information in third symbols that are detectable by at least one of the optical sensor, the non-optical sensor, or another sensor, and wherein the third information is distinct from the first information and is distinct from the second information.
9. The method of claim 1 , wherein the first information includes encrypted data, and wherein the second information includes a key to decrypt the encrypted data.