Apparatus and method for rapid chemical analysis using differential desorption
The present invention is directed to a method and device to generate a chemical signature for a mixture of analytes. The present invention involves using a SPME surface to one or both absorb and adsorb the mixture of analytes. In an embodiment of the invention, the surface is then exposed to different temperature ionizing species chosen with appropriate spatial resolution to desorb a chemical signature for the mixture of analytes.
1. A kit comprising:
two or more sorbent coated fibers with a length and a diameter to permit multiple exposure of the sorbent coated fiber to one or more temperature gasses from a desorption ionization source;
a holder to stabilize a position of the two or more sorbent coated fibers such that the two or more sorbent coated fibers are separated at least by a distance, where the holder enables contact between the two or more sorbent coated fibers and one or more samples; and
an adjuster to set the position of the holder such that the one or more temperature carrier gasses from the desorption ionization source are directed at one or more target areas on the two or more sorbent coated fibers.
2. The kit of claim 1 , where the distance is between:
a lower limit of approximately 1 mm; and
an upper limit of approximately 10 mm.
3. The kit of claim 1 , where the average length is between:
a lower limit of approximately 4 mm; and
an upper limit of approximately 150 mm.
4. The kit of claim 1 , where the diameter of the sorbent coated fiber is between:
a lower limit of approximately 0.05 mm; and
an upper limit of approximately 2 mm.
5. The kit of claim 1 , where one or more of the two or more sorbent coated fibers is made up of one or more materials selected from the group consisting of C-18, PDMS/divinyl-benzene, PDMS, C-8 and C-4.
6. The kit of claim 1 , further comprising the desorption ionization source.
7. The kit of claim 6 , further comprising one or more gasses to supply the desorption ionization source selected from the group consisting of helium, nitrogen, oxygen, neon, argon, krypton, and xenon.
8. The kit of claim 7 , further comprising a heater to heat the desorption ionization source carrier gasses to between:
a lower limit of approximately 270° K; and
an upper limit of approximately 600° K.
9. The kit of claim 6 , further comprising a second desorption ionization source, where the desorption ionization source is the same as the second desorption ionization source.
10. The kit of claim 9 , where one or both the desorption ionization source and the second desorption ionization source is an electrospray ionization source.
11. A kit for analyzing a sorbent coated fiber comprising:
a sorbent coated fiber of a length and a diameter to permit multiple exposure of the sorbent coated fiber to a plurality of different temperature gasses from a desorption ionization source;
a reagent fiber containing reactive chemicals; and
a holder for positioning the sorbent coated fiber at a distance from the reagent fiber, where the holder is adapted to position one or both the sorbent coated fiber and the reagent fiber to direct a plurality of different temperatures of a carrier gas from a desorption ionization source at a target area on one or both the sorbent coated fiber and the reagent fiber to analyze molecules present on the one or both the sorbent coated fiber and the reagent fiber.
12. The kit of claim 11 , where the distance is between:
a lower limit of approximately 1 mm; and
an upper limit of approximately 10 mm.
13. The kit of claim 11 , where the length is between:
a lower limit of approximately 4 mm; and
an upper limit of approximately 150 mm.
14. The kit of claim 11 , where the diameter is between:
a lower limit of approximately 0.05 mm; and
an upper limit of approximately 2 mm.
15. The kit of claim 11 , where the sorbent coated fiber is made up of one or more materials selected from the group consisting of C-18, PDMS/divinyl-benzene, PDMS, C-8 and C-4.
16. The kit of claim 11 , further comprising the desorption ionization source.
17. The kit of claim 16 , further comprising one or more gasses to supply the desorption ionization source selected from the group consisting of helium, nitrogen, oxygen, neon, argon, krypton, and xenon.
18. The kit of claim 17 , further comprising a heater to heat the desorption ionization source carrier gasses to between:
a lower limit of approximately 270° K; and
an upper limit of approximately 600° K.
19. The kit of claim 16 , further comprising a second desorption ionization source, where the desorption ionization source is the same as the second desorption ionization source.
20. The kit of claim 19 , where one or both the desorption ionization source and the second desorption ionization source is an electrospray ionization source.