IP Library Granted Patent US 9,618,571
Granted Patent B2
US 9,618,571 · App. 14/436,605 · Granted Apr 11, 2017

Detection circuit for relative error voltage

Inventor: Yongbo Zhang (Shenzhen, CN)
Assignee: SANECHIPS TECHNOLOGY CO., LTD.
G01R31/2882G01R19/10
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Quick Facts
Patent No.
US 9,618,571
App. No.
14/436,605
Granted
Apr 11, 2017
Kind
B2
Abstract

A detection circuit for a relative error voltage, including: a first current mirror, a second current mirror, a third current mirror, a current sink and resistors R 1 , R 2 and R 3 . A voltage signal to be detected V 1 accesses the first current mirror via the resistor R 2 , and a voltage signal to be detected V 2 accesses the second current mirror via the resistor R 3 ; a mirrored-end of the first current mirror is connected to the current sink, and a mirroring-end thereof is connected to a mirrored-end of the third current mirror; a mirrored-end of the second current mirror is connected to the current sink, and a mirroring-end thereof is connected to a mirroring-end of the third current mirror; the current sink is grounded via the resistor R 1 ; and the third current mirror converts double-ended currents of the first and the second current mirrors to single-ended currents to output as voltage signals.

Claims (22)

1. A detection circuit for a relative error voltage, comprising: a first current mirror, a second current mirror, a third current mirror, a current sink and resistors R 1 , R 2 and R 3 ; wherein,

a voltage signal to be detected V 1 accesses the first current mirror via the resistor R 2 , and a voltage signal to be detected V 2 accesses the second current mirror via the resistor R 3 ;

a mirrored end of the first current mirror is connected to the current sink, and a mirroring end of the first current mirror is connected to a mirrored end of the third current mirror; a mirrored end of the second current mirror is connected to the current sink, and a mirroring end of the second current mirror is connected to a mirroring end of the third current mirror; and

the current sink is grounded via the resistor R 1 ; and the third current mirror converts double-ended currents of the first current mirror and the second current mirror to single-ended currents to output as voltage signals.

2. The detection circuit for a relative error voltage according to claim 1 , wherein, the current sink limits an influent current as: I 1 =K*Vref/R 1 ;

wherein, K is a proportion coefficient (K is a constant not equal to zero), and Vref is a reference voltage with a zero-temperature coefficient.

3. The detection circuit for a relative error voltage according to claim 2 , wherein,

when the detection circuit for the relative error voltage is in a balance state, a voltage difference between the voltage signals to be detected is: V 1 −V 2 =I 1 *(R 2 −R 3 ); if the R 2 is equal to the R 3 , then an output logic level is reversed when the voltage difference between the V 1 and the V 2 is not zero; and if the R 2 is not equal to the R 3 , then the output logic level is reversed when the voltage difference between the V 1 and the V 2 reaches a set value.

4. The detection circuit for a relative error voltage according to claim 1 , wherein, resistance types of the resistors R 1 , R 2 and R 3 are the same.

5. The detection circuit for a relative error voltage according to claim 1 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors.

6. The detection circuit for a relative error voltage according to claim 5 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors adjusted through a logic switch.

7. The detection circuit for a relative error voltage according to claim 1 , wherein,

both the first current mirror and the second current mirror are constituted of two common-source common-gate P-type field effect transistors, or, both the first current mirror and the second current mirror are constituted of two common-emitter common-base PNP-type triodes, and a grid and a drain of a transistor at a mirrored end, or a base and a collector of a triode at a mirrored end, are short-circuited as a diode structure; and

the third current mirror is constituted of two common-source common-gate N-type field effect transistors, or, is constituted of two common-emitter common-base NPN-type triodes, and a grid and a drain of a transistor at a mirrored end, or a base and a collector of a triode at a mirrored end, are short-circuited as a diode structure.

8. The detection circuit for a relative error voltage according to claim 7 , wherein,

the voltage signal to be detected V 1 accesses a source or an emitter of the first current mirror through the resistor R 2 , and the voltage signal to be detected V 2 accesses a source or an emitter of the second current mirror through the resistor R 3 .

9. The detection circuit for a relative error voltage according to claim 2 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors.

10. The detection circuit for a relative error voltage according to claim 3 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors.

11. The detection circuit for a relative error voltage according to claim 4 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors.

12. The detection circuit for a relative error voltage according to claim 9 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors adjusted through a logic switch.

13. The detection circuit for a relative error voltage according to claim 10 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors adjusted through a logic switch.

14. The detection circuit for a relative error voltage according to claim 11 , wherein, the resistors R 1 , R 2 and R 3 are variable resistors adjusted through a logic switch.

Assignments (3)
CHANGE OF NAME Recorded Nov 30, 2016
From: ZTE MICROELECTRONICS TECHNOLOGY CO. LTD.
To: SANECHIPS TECHNOLOGY CO., LTD.
Reel/Frame 041267/0677 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2015
From: ZTE CORPORATION
To: ZTE MICROELECTRONICS TECHNOLOGY CO.LTD
Reel/Frame 037164/0487 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 17, 2015
From: ZHANG, YONGBO
To: ZTE CORPORATION
Reel/Frame 035434/0874 →
Priority Claims (1)
CN 2012 2 0534856 U · Oct 18, 2012 · national
Continuity (1)
Related Publication 20160169963A1 · Jun 16, 2016