IP Library › Granted Patent US 9,653,368
Granted Patent B2
US 9,653,368 · App. 14/705,166 · Granted May 16, 2017

Display device and method of fabricating the same

Inventors: Won-Kyu Kwak (Yongin, KR); Hwan-Soo Jang (Yongin, KR); Jae-Yong Lee (Yongin, KR)
Assignee: Samsung Display Co., Ltd.
H01L22/32G09G3/006H01L22/14H01L27/124H01L27/1259G09G3/3225G09G2330/12
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Quick Facts
Patent No.
US 9,653,368
App. No.
14/705,166
Granted
May 16, 2017
Kind
B2
Abstract

A display device includes a display area, a test pad, a plurality of first test transistors, and at least one outline. The display area includes pixels coupled to data lines and scan lines. The test pad receives a test signal. The first test transistors are coupled between the data lines of the display area and the test pad. The at least one outline is coupled between one of the first test transistors and the test pad. The at least one outline is located in a non-display area outside the display area.

Claims (31)

1. A display device, comprising:

a display area including pixels coupled to data lines and scan lines;

a test pad to receive a test signal;

a plurality of first test transistors coupled between the data lines of the display area and the test pad; and

at least one outline coupled between one of the first test transistors and the test pad, the at least one outline in a non-display area outside the display area, wherein the at least one outline traverses a path that goes and returns along the at least one side of the display area and is adjacent to the at least one side of the display area.

2. The display device as claimed in claim 1 , wherein:

the first test transistor is coupled to the at least one outline,

the at least one outline is coupled to a data line, and

the data line is coupled to at least one green pixel or sub-pixel in the display area.

3. The display device as claimed in claim 1 , further comprising: a resistance between one of the first test transistors that is not coupled to the at least one outline and the test pad.

4. The display device as claimed in claim 1 , further comprising:

a test control pad coupled to control electrodes of the first test transistors;

a plurality of initialization transistors coupled between the data lines of the display area and data pads to receive initialization signals; and

a plurality of initialization control pads coupled to control electrodes of the initialization transistors.

5. The display device as claimed in claim 4 , further comprising:

a plurality of data pads coupled to the data lines.

6. The display device as claimed in claim 5 , wherein the test pad, the test control pad, the initialization control pads, the data pads, the test transistors, the initialization transistors, and the at least one outline are in the non-display area.

7. The display device as claimed in claim 4 , wherein the test control pad is to receive a test control signal different from an initialization control signal received by one of the initialization control pads, the test control signal and the initialization control signal corresponding to different gray level values.

8. The display device as claimed in claim 7 , wherein:

scan signals are coupled to the scan lines within a period during which the test control signal is supplied as first gate-on voltage value, and

the scan signals are supplied as second gate-on voltages value.

9. The display device as claimed in claim 1 , further comprising:

a plurality of first test control pads coupled to control electrodes of the first test transistors;

a plurality of initialization transistors coupled between the data lines in the display area and initialization pads to receive initialization signals;

a plurality of initialization control pads coupled to control electrodes of the initialization transistors;

a second test transistor coupled between one of the data lines and the at least one outline;

a second test control pad coupled to a control electrode of the second test transistor; and a plurality of data pads coupled to the data lines.

10. The display device as claimed in claim 9 , wherein the first and second test control pads are to receive a test control signal opposite to an initialization control signal received by one of the initialization control pads.

11. The display device as claimed in claim 10 , wherein scan signals coupled to the scan lines are supplied as second gate-on voltages, during a period when the test control signal is supplied as a first gate-on voltage.

12. The display device as claimed in claim 9 , wherein the test pad, the first and second test control pads, the initialization control pads, the data pads, the first and second test transistors, the initialization transistors, and the at least one outline are in the non-display area.

13. The display device as claimed in claim 1 , wherein the at least one outline has a length adjacent to at least one side of the display area that is equal to or greater than a length of the at least one side.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2015
From: KWAK, WON-KYU; JANG, HWAN-SOO; LEE, JAE-YONG
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 035574/0698 →
Priority Claims (1)
KR 10-2014-0101136 · Aug 6, 2014 · national
Continuity (1)
Related Publication 20160043010A1 · Feb 11, 2016