IP Library Granted Patent US 9,685,559
Granted Patent B2
US 9,685,559 · App. 14/654,164 · Granted Jun 20, 2017

Vertically stacked heterostructures including graphene

Inventors: Xiangfeng Duan (Los Angeles, CA); Woojong Yu (Los Angeles, CA); Yuan Liu (Los Angeles, CA); Yu Huang (Los Angeles, CA)
Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
H01L29/7869H01L29/1606H01L29/41733H01L29/41775H01L29/45H01L29/66742H01L29/66969H01L29/78642H01L29/78681H01L29/78684H01L29/78693H01L29/78696H01L31/022408H01L31/032H01L31/113
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Quick Facts
Patent No.
US 9,685,559
App. No.
14/654,164
Granted
Jun 20, 2017
Kind
B2
Abstract

A vertically stacked heterostructure device includes: (1) a substrate; and (2) vertically stacked layers disposed over the substrate and including (a) a source electrode including a layer of graphene; (b) a drain electrode; and (c) a semiconducting channel disposed between the source electrode and the drain electrode. During operation of the device, a current is configured to flow between the source electrode and the drain electrode through the semiconducting channel.

Claims (28)

1. A vertically stacked heterostructure device, comprising:

a substrate; and

vertically stacked layers disposed over the substrate and including

a source electrode including a layer of graphene;

a drain electrode; and

a semiconducting channel disposed between the source electrode and the drain electrode, the semiconducting channel including a material different from graphene,

wherein, during operation of the device, a current is configured to flow between the source electrode and the drain electrode through the semiconducting channel.

2. The vertically stacked heterostructure device of claim 1 , further comprising a dielectric layer disposed over the substrate, and the substrate corresponds to a back gate.

3. The vertically stacked heterostructure device of claim 2 , further comprising a voltage source connected to the substrate to apply a back gate voltage.

4. The vertically stacked heterostructure device of claim 2 , wherein the source electrode is disposed over the dielectric layer, the semiconducting channel is disposed over the source electrode, the drain electrode is disposed over the semiconducting channel, and at least a portion of the drain electrode overlies at least a portion of the source electrode to define an overlapping area.

5. The vertically stacked heterostructure device of claim 4 , wherein the semiconducting channel includes at least one of a transition metal dichalcogenide or a transition metal oxide.

6. The vertically stacked heterostructure device of claim 4 , wherein a thickness of the semiconducting channel corresponds to a channel length.

7. The vertically stacked heterostructure device of claim 4 , wherein the drain electrode includes a metal.

8. The vertically stacked heterostructure device of claim 4 , further comprising a voltage source connected to the source electrode to apply a source-drain voltage.

9. The vertically stacked heterostructure device of claim 4 , wherein the device has an on-current density of at least 1,000 A/cm 2 , and a room temperature on-off current ratio of at least 1,000.

10. The vertically stacked heterostructure device of claim 1 , wherein the drain electrode is disposed over the substrate, the semiconducting channel is disposed over the drain electrode, the source electrode is disposed over the semiconducting channel, and at least a portion of the source electrode overlies at least a portion of the drain electrode to define an overlapping area.

11. The vertically stacked heterostructure device of claim 10 , wherein the vertically stacked layers further include a top gate disposed over the source electrode.

12. The vertically stacked heterostructure device of claim 11 , further comprising a voltage source connected to the top gate to apply a top gate voltage.

13. The vertically stacked heterostructure device of claim 11 , wherein the semiconducting channel includes a thin film, semiconductor material.

14. The vertically stacked heterostructure device of claim 11 , wherein a thickness of the semiconducting channel corresponds to a channel length.

15. The vertically stacked heterostructure device of claim 11 , wherein the drain electrode includes a metal.

16. The vertically stacked heterostructure device of claim 11 , further comprising a voltage source connected to the source electrode to apply a source-drain voltage.

17. The vertically stacked heterostructure device of claim 11 , wherein the device has an on-current density of at least 600 A/cm 2 , and a room temperature on-off current ratio of at least 10,000.

18. The vertically stacked heterostructure device of claim 1 , wherein the substrate is a flexible substrate.

19. A method of photocurrent generation, comprising:

providing a vertical stack of layers disposed over a substrate, wherein the vertical stack of layers includes a top electrode, a bottom electrode, and a semiconducting channel disposed between the top electrode and the bottom electrode, the semiconducting channel includes a material different from graphene, and at least one of the top electrode and the bottom electrode includes a layer of graphene; and

generating a photocurrent by illuminating the vertical stack of layers, wherein the photocurrent flows between the top electrode and the bottom electrode through the semiconducting channel, and generating the photocurrent includes applying a back gate voltage to the substrate to modulate the photocurrent.

20. The method of claim 19 , wherein the vertical stack of layers further includes a top gate disposed over the top electrode, and generating the photocurrent further includes applying a top gate voltage to the top gate to modulate the photocurrent.

Assignments (1)
CONFIRMATORY LICENSE Recorded May 23, 2016
From: UNIVERSITY OF CALIFORNIA, LOS ANGELES
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 038786/0658 →
Continuity (3)
Provisional Application 61745102 · Dec 21, 2012
Provisional Application 61765655 · Feb 15, 2013
Related Publication 20150318401A1 · Nov 5, 2015