IP Library Granted Patent US 9,705,007
Granted Patent B2
US 9,705,007 · App. 15/097,508 · Granted Jul 11, 2017

Thin film transistor and fabrication method thereof, and display device

Inventors: Wei Yang (Beijing, CN); Woo Bong Lee (Beijing, CN); Ce Ning (Beijing, CN); Wenlin Zhang (Beijing, CN)
Assignee: BOE TECHNOLOGY GROUP CO., LTD.
H01L29/7869H01L21/02554H01L21/02565H01L21/02587H01L21/02631H01L21/02664H01L29/24H01L29/66969
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Quick Facts
Patent No.
US 9,705,007
App. No.
15/097,508
Granted
Jul 11, 2017
Kind
B2
Abstract

A thin film transistor and a fabrication method thereof, and a display device are provided. The thin film transistor comprises an active layer, wherein, a target oxide is formed at a portion of the active layer where an oxygen content is higher than oxygen contents of other portions of the active layer, and a carrier mobility of the target oxide is greater than that of other portions of the active layer.

Claims (9)

1. A thin film transistor, comprising an active layer, wherein

a target oxide is formed at a portion of the active layer where an oxygen content is higher than oxygen contents of other portions of the active layer, and a carrier mobility of the target oxide is greater than that of other portions of the active layer.

2. The thin film transistor according to claim 1 , wherein the active layer is made of an indium gallium zinc oxide.

3. The thin film transistor according to claim 2 , wherein the target oxide is formed of a zinc-based oxynitride.

4. The thin film transistor according to claim 1 , wherein the active layer is formed by using a sputtering device having a plurality of targets, and the target oxide is formed at a portion of the active layer between adjacent targets of the plurality of targets.

5. The thin film transistor according to claim 4 , wherein a modified layer is formed at a portion of the active layer corresponding to each target of the plurality of targets, and a carrier mobility of the modified layer is lower than that of other portions of the active layer.

6. The thin film transistor according to claim 5 , wherein, in a same plasma treatment process, the target oxide and the modified layer are formed.

7. The thin film transistor according to claim 1 , wherein, a modified layer is formed at a portion of the active layer where an oxygen content is lower than oxygen contents of other portions of the active layer, and the carrier mobility of the modified layer is lower than that of other portions of the active layer.

8. A display device, comprising the thin film transistor according to claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2016
From: YANG, WEI; LEE, WOO BONG; NING, CE; ZHANG, WENLING
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 038266/0478 →
Priority Claims (1)
CN 2015 1 0182175 · Apr 16, 2015 · national
Continuity (1)
Related Publication 20160308061A1 · Oct 20, 2016