Method of manufacturing semiconductor device

1. A method of a semiconductor device manufacturing, comprising:

(a) supplying a source gas to an upper region of a process chamber where vertically stacked substrates are accommodated through a first gas supply hole disposed at a front end of a first nozzle disposed in a lower region of the process chamber where the source gas is not pyrolyzed, wherein the first nozzle is installed along a stacking direction of the vertically stacked substrates;

(b) supplying the source gas to substrates disposed in the lower region and a middle region of the process chamber through a plurality of second gas supply holes of a second nozzle extending from the lower region to the middle region along the stacking direction, wherein the plurality of second gas supply holes are disposed at positions facing the substrates disposed in the lower region and the middle region; and

(c) supplying a reactive gas to substrates disposed in the lower region, the middle region and the upper region of the process chamber through a plurality of third gas supply holes of a third nozzle extending from the lower region to the upper region along the stacking direction, wherein the plurality of third gas supply holes are disposed at positions facing the substrates of the vertically stacked substrates disposed in the lower region, the middle region and the upper region.

2. The method of claim 1 , further comprising: (d) exhausting the process chamber.

3. The method of claim 2 , wherein gas remaining in the process chamber is exhausted in a direction parallel to a main surface of the vertically stacked substrates in the step (d).

4. The method of claim 2 , wherein the steps (a), (d), (b), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

5. The method of claim 2 , wherein the steps (a), (d), (b), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

6. The method of claim 2 , wherein the steps (b), (d), (a), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

7. The method of claim 2 , wherein the steps (b), (a), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

8. The method of claim 2 , wherein the steps (a), (d), (c), (d), (b), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

9. The method of claim 2 , wherein the steps (b), (d), (c), (d), (a), (d), (c) and (d) are repeated in order without mixing the source gas and the reactive gas.

10. The method of claim 1 , further comprising:

(e) supplying into the process chamber an inert gas at a first flow rate along with the source gas supplied in the step (a); and

(f) supplying into the process chamber through the first gas supply hole the inert gas at a second flow rate different from the first flow rate along with the source gas between the steps (a) and (b) such that the source gas is supplied to the lower region and the middle region.

11. The method of claim 2 , further comprising: (g) simultaneously performing the steps (a) and (b), and wherein the steps (g), (d), (c) and (d) are repeated in order.

12. The method of claim 1 , wherein the step (a) comprises: storing an inert gas in an inert gas storing unit; and injecting the source gas into the process chamber by the inert gas stored in the inert gas storing unit.

13. A method of manufacturing a semiconductor device, comprising:

(a) supplying a source gas to a lower region and a middle region of a process chamber where vertically stacked substrates are accommodated through a first gas supply hole disposed at a front end of a first nozzle disposed in the lower region of the process chamber where the source gas is not pyrolyzed, wherein the first nozzle extends along a stacking direction of the vertically stacked substrates;

(b) supplying the source gas to the middle region and an upper region of the process chamber through a second gas supply hole disposed at a front end of a second nozzle extending along the stacking direction, wherein the second gas supply hole is disposed higher than the first gas supply hole; and

(c) supplying a reactive gas into the process chamber through a plurality of third gas supply holes of a third nozzle extending from the lower region to the upper region along the stacking direction, wherein the plurality of third gas supply holes are disposed at positions facing substrates disposed in the lower region, the middle region and the upper region.

14. A method of manufacturing a semiconductor device, comprising:

(a) simultaneously supplying a source gas and an inert gas at a first flow rate to a middle region and an upper region of a process chamber where vertically stacked substrates are accommodated through a first gas supply hole disposed at a front end of a first nozzle disposed in a lower region of the process chamber where the source gas is not pyrolyzed, wherein the first nozzle extends along a stacking direction of the vertically stacked substrates;

(b) simultaneously supplying the source gas and the inert gas at a second flow rate smaller than the first flow rate to the lower region and the middle region through the first gas supply hole; and

(c) supplying a reactive gas into the process chamber through a plurality of second gas supply holes of a third nozzle extending from the lower region to the upper region along the stacking direction, wherein the plurality of third gas supply holes are disposed at positions facing substrates disposed in the lower region, the middle region and the upper region.