IP Library Granted Patent US 9,728,670
Granted Patent B2
US 9,728,670 · App. 14/395,631 · Granted Aug 8, 2017

Light-emitting diode and manufacturing method therefor

Inventors: Shaohua Huang (Xiamen, CN); Jyh-Chiarng Wu (Xiamen, CN)
Assignee: Xiamen Sanan Optoelectronics Technology Co., Ltd.
H01L33/002H01L33/025H01L33/12H01L33/0079H01L33/14
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Quick Facts
Patent No.
US 9,728,670
App. No.
14/395,631
Granted
Aug 8, 2017
Kind
B2
Abstract

Disclosed is a light-emitting diode with an n-type graded buffer layer and a manufacturing method therefor. An epitaxial structure of a light-emitting diode comprises: a growth substrate; an n-type graded buffer layer located on the growth substrate; an n-type limiting layer ( 231 ) located on the n-type graded buffer layer; an active layer ( 232 ) located on the n-type limiting layer ( 231 ); and a p-type limiting layer ( 233 ) located on the active layer ( 232 ). A buffer layer is converted into an n-type graded buffer layer by means of an ion implantation method, and is applied to a light-emitting diode chip of a vertical structure while ensuring that a high-quality epitaxial structure is obtained, thereby being able to effectively reduce the contact resistance.

Claims (38)

1. An LED epitaxial structure, comprising:

a growth substrate;

an n-type gradient buffer layer over the growth substrate;

an n-type semiconductor layer over the n-type gradient buffer layer;

an active layer over the n-type semiconductor layer; and

a p-type semiconductor layer over the active layer;

wherein an n-type doping of the n-type gradient buffer layer has a Gaussian distribution, and a side of the n-type gradient buffer layer adjacent to the growth substrate is highly doped.

2. The LED epitaxial structure of claim 1 , wherein an n-type doping concentration of the n-type gradient buffer layer is more than 1×10 18 .

3. The method of claim 1 , wherein the n-type doping of the n-type gradient buffer layer has a Gaussian distribution, and a side of the n-type gradient buffer layer adjacent to the growth substrate is highly doped.

4. A method for LED epitaxial growth, comprising:

1) providing a growth substrate, on which a u-doped buffer layer is formed via a first epitaxial growth;

2) transforming the buffer layer into an n-type gradient buffer layer through ion implantation;

3) forming an n-type semiconductor layer via a second epitaxial growth on the n-type gradient buffer layer;

4) forming an active layer on the n-type semiconductor layer via epitaxial growth; and

5) forming a p-type semiconductor layer on the active layer via epitaxial growth.

5. A vertical LED chip structure, comprising:

a conductive substrate;

a light-emitting epitaxial layer on the conductive substrate including an n-type semiconductor layer, a p-type semiconductor layer and an active layer between the two;

an n-type gradient buffer layer formed on the n-type semiconductor layer; and

an n-electrode formed on the n-type gradient buffer layer;

wherein an n-type doping of the n-type gradient buffer layer has a Gaussian distribution, and a side of the n-type gradient buffer layer adjacent to the n-type semiconductor layer is highly doped.

6. The vertical LED chip structure as claimed in claim 5 , wherein an n-type doping concentration of the n-type gradient buffer layer is more than 1×10 18 and ranges from 1×10 18 to 1×10 20 .

7. The vertical LED chip structure of claim 5 , wherein

a doping concentration of the highly-doped side is 1×10 18 ˜5×10 18 .

8. The vertical LED chip structure of claim 5 , wherein a side of the n-type gradient buffer layer away from the n-type semiconductor layer is highly doped with a doping concentration of 5×10 18 ˜1×10 20 .

9. The vertical LED chip structure of claim 5 , wherein the n-type gradient buffer layer has a flat surface or a patterned concave-convex surface.

10. A method for making the vertical LED of claim 5 , comprising:

1) providing a growth substrate, on which a u-doped buffer layer is formed via a first epitaxial growth;

2) transforming the buffer layer into an n-type gradient buffer layer through ion implantation;

3) forming an n-type semiconductor layer, an active layer and a p-type semiconductor layer via a second epitaxial growth on the n-type gradient buffer layer to thereby form an LED epitaxial structure;

4) forming a metal reflecting layer on the p-type semiconductor layer;

5) bonding a conductive substrate with the epitaxial structure;

6) removing the growth substrate and exposing a surface of the n-type gradient buffer layer;

7) making an n-electrode on the exposed n-type gradient buffer layer; and making a p-electrode on a back of the conductive substrate; and 8)

forming a vertical LED chip by cutting.

11. The method of claim 10 , wherein the n-type doping concentration of the n-type gradient buffer layer is more than 1×10 18 and ranges from 1×10 18 to 1×10 20 .

12. The method of claim 10 , wherein the n-type doping of the n-type gradient buffer layer has a Gaussian distribution, and a side adjacent to the n-type semiconductor layer has a low doping.

13. The method of claim 10 , wherein in step 2), an n-type gradient buffer layer is formed by injecting Si ion in the buffer layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2023
From: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
To: QUANZHOU SANAN SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 065302/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2014
From: HUANG, SHAOHUA; WU, JYH-CHIARNG
To: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 033985/0681 →
Priority Claims (1)
CN 2012 1 0119410 · Apr 23, 2012 · national
Continuity (1)
Related Publication 20150084088A1 · Mar 26, 2015