IP Library › Granted Patent US 9,748,094
Granted Patent B2
US 9,748,094 · App. 13/095,122 · Granted Aug 29, 2017

Semiconductor compound structure and method of fabricating the same using graphene or carbon nanotubes, and semiconductor device including the semiconductor compound structure

Inventors: Jun-hee Choi (Seongnam-si, KR); Un-jeong Kim (Osan-si, KR); Sang-jin Lee (Anyang-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L21/02538H01L21/02422H01L21/02444H01L33/08H01L33/24H01L29/1606
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Quick Facts
Patent No.
US 9,748,094
App. No.
13/095,122
Granted
Aug 29, 2017
Kind
B2
Abstract

A semiconductor compound structure and a method of fabricating the semiconductor compound structure using graphene or carbon nanotubes, and a semiconductor device including the semiconductor compound structure. The semiconductor compound structure includes a substrate; a buffer layer disposed on the substrate, and formed of a material including carbons having hexagonal crystal structures; and a semiconductor compound layer grown and formed on the buffer layer.

Claims (18)

1. A semiconductor device comprising:

a substrate having a first surface;

a lower electrode disposed above the first surface of the substrate;

a buffer layer disposed on the lower electrode and above the first surface of the substrate, and comprising carbons having hexagonal crystal structures;

a light emission layer formed on the buffer layer, and formed of a semiconductor compound;

an insulating layer formed to bury a lower portion of the light emission layer on the buffer layer; and

an upper electrode formed to cover the light emission layer and the insulating layer.

2. The semiconductor device of claim 1 , further comprising a wetting layer formed on the buffer layer for depositing the light emission layer.

3. The semiconductor device of claim 1 , wherein the light emission layer comprises a first semiconductor layer formed on the buffer layer, an active layer formed on the first semiconductor layer, and a second semiconductor layer formed on the active layer.

4. The semiconductor device of claim 1 , wherein the light emission layer comprises a group III-V compound semiconductor material.

5. The semiconductor device of claim 1 , wherein the buffer layer comprises graphene or graphite.

6. The semiconductor device of claim 5 , wherein the light emission layer is formed as a plurality of rods.

7. The semiconductor device of claim 1 , wherein the buffer layer comprises carbon nanotubes (CNTs).

8. The semiconductor device of claim 7 , wherein the light emission layer is formed to cover the CNTs.

9. The semiconductor device of claim 1 , further comprising a resistive layer between the lower electrode and the buffer layer.

10. The semiconductor device of claim 1 , further comprising a catalyst layer on the lower electrode for forming the buffer layer.

11. The semiconductor device of claim 1 , wherein the lower electrode is formed on an upper surface of the substrate.

12. The semiconductor device of claim 1 , wherein the lower electrode is disposed to be separated from the substrate, and the insulating layer fills a space between the substrate and the lower electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2011
From: CHOI, JUN-HEE; KIM, UN-JEONG; LEE, SANG-JIN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 026187/0157 →
Priority Claims (1)
KR 10-2010-0086586 · Sep 3, 2010 · national
Continuity (1)
Related Publication 20120056237A1 · Mar 8, 2012