IP Library Granted Patent US 9,803,111
Granted Patent B2
US 9,803,111 · App. 14/379,961 · Granted Oct 31, 2017

Adhesive for semiconductor, fluxing agent, manufacturing method for semiconductor device, and semiconductor device

Inventors: Kazutaka Honda (Tsukuba, JP); Akira Nagai (Tsukuba, JP); Makoto Satou (Yuki, JP)
Assignee: HITACHI CHEMICAL COMPANY, LTD.
C09J11/06B23K35/362B23K35/3613B23K35/3618C08K5/092C09J163/00H01L21/563H01L23/295H01L24/11H01L24/27H01L24/29H01L24/32H01L24/73H01L24/81H01L24/83H01L24/92H01L25/0657H05K3/305H01L24/03H01L24/05H01L24/13H01L24/16H01L24/17H01L24/33H01L24/94H01L2224/03825H01L2224/0401H01L2224/051H01L2224/056H01L2224/0558H01L2224/05111H01L2224/05116H01L2224/05139H01L2224/05144H01L2224/05147H01L2224/05155H01L2224/05575H01L2224/05611H01L2224/05616H01L2224/05639H01L2224/05644H01L2224/05647H01L2224/05655H01L2224/11825H01L2224/131H01L2224/136H01L2224/13025H01L2224/1358H01L2224/13111H01L2224/13116H01L2224/13139H01L2224/13144H01L2224/13147H01L2224/13155H01L2224/13575H01L2224/13611H01L2224/13639H01L2224/13644H01L2224/13647H01L2224/13655H01L2224/16145H01L2224/16148H01L2224/16225H01L2224/16227H01L2224/16238H01L2224/17181H01L2224/271H01L2224/27416H01L2224/27436H01L2224/27848H01L2224/2919H01L2224/2929H01L2224/2939H01L2224/29386H01L2224/29387H01L2224/32145H01L2224/32225H01L2224/33181H01L2224/73104H01L2224/81011H01L2224/8121H01L2224/81121H01L2224/81191H01L2224/81193H01L2224/81203H01L2224/81815H01L2224/81895H01L2224/81907H01L2224/831H01L2224/83191H01L2224/83203H01L2224/83855H01L2224/83862H01L2224/9205H01L2224/92122H01L2224/92125H01L2224/94H01L2225/06513H01L2225/06517H01L2225/06541H01L2924/0665H01L2924/07802H01L2924/10253H05K3/3436H05K2201/0367H05K2201/10977Y02P70/613
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Quick Facts
Patent No.
US 9,803,111
App. No.
14/379,961
Granted
Oct 31, 2017
Kind
B2
Abstract

An adhesive for a semiconductor, comprising an epoxy resin, a curing agent, and a compound having a group represented by the following formula (1): wherein R 1 represents an electron-donating group.

Claims (15)

1. An adhesive for a semiconductor, comprising an epoxy resin in an amount of 5 to 75% by mass based on the total amount of the adhesive, a curing agent, a phenoxy resin, at least one compound selected from a group consisting of methylsuccinic acid, 2-methylglutaric acid, 2-methyladipic acid, 2-methylpimelic acid, and 2-methylsuberic acid in an amount of 0.5 to 10% by mass based on the total amount of the adhesive, and resin fillers,

wherein a mass ratio of the content of the epoxy resin to the content of the phenoxy resin is 0.01 to 5.

2. The adhesive for a semiconductor according to claim 1 , wherein the at least one compound is a fluxing agent.

3. The adhesive for a semiconductor according to claim 1 , wherein the phenoxy resin has a weight average molecular weight of 10000 or more.

4. The adhesive for a semiconductor according to claim 1 , wherein the adhesive has a film shape.

5. A fluxing agent, comprising at least one compound selected from a group consisting of methylsuccinic acid, 2-methyiglutaric acid, 2-methyladipic acid, 2-methylpimelic acid, and 2-methylsuberic acid, wherein the fluxing agent is blended in an adhesive for a semiconductor comprising an epoxy resin in an amount of 5 to 75% by mass based on the total amount of the adhesive, a curing agent, a phenoxy resin, the fluxing agent in an amount of 0.5 to 10% by mass based on the total amount of the adhesive, and resin fillers, and a mass ratio of the content of the epoxy resin to the content of the phenoxy resin is 0.01 to 5.

6. A manufacturing method for a semiconductor device, wherein connection portions of a semiconductor chip are electrically connected to connection portions of a wiring circuit substrate or connection portions of a plurality of semiconductor chips are electrically connected to each other,

the method comprising a step of sealing at least part of the connection portions with the adhesive for a semiconductor according to claim 1 .

7. A semiconductor device prepared by the manufacturing method according to claim 6 .

8. The adhesive for a semiconductor according to claim 1 , wherein the adhesive has an insulation property.

9. The fluxing agent according to claim 5 , wherein the adhesive has an insulation property.

10. A fluxing agent, comprising at least one compound selected from a group consisting of methylsuccinic acid, 2-methyiglutaric acid, 2-methyladipic acid, 2-methylpimelic acid, and 2-methylsuberic acid, wherein the fluxing agent is configured to be blended in an adhesive for a semiconductor such that the adhesive comprises an epoxy resin in an amount of 5 to 75% by mass based on the total amount of the adhesive, a curing agent, a phenoxy resin, the fluxing agent in an amount of 0.5 to 10% by mass based on the total amount of the adhesive, and resin fillers, and a mass ratio of the content of the epoxy resin to the content of the phenoxy resin is 0.01 to 5.

11. The adhesive for a semiconductor according to claim 1 , wherein the resin fillers comprise at least one selected from the group consisting of a polyurethane resin and a polyimide resin.

12. The fluxing agent according to claim 5 , wherein the resin fillers comprise at least one selected from the group consisting of a polyurethane resin and a polyimide resin.

13. The fluxing agent according to claim 10 , wherein the resin fillers comprise at least one selected from the group consisting of a polyurethane resin and a polyimide resin.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2014
From: HONDA, KAZUTAKA; NAGAI, AKIRA; SATOU, MAKOTO
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 033799/0149 →
Priority Claims (1)
JP 2012-038544 · Feb 24, 2012 · national
Continuity (1)
Related Publication 20150048495A1 · Feb 19, 2015