IP Library Granted Patent US 9,814,138
Granted Patent B2
US 9,814,138 · App. 15/355,757 · Granted Nov 7, 2017

Wiring substrate

Inventor: Kyota Yamamura (Nagano, JP)
Assignee: Shinko Electric Industries Co., Ltd.
H05K1/115H05K1/09H05K3/06H05K3/061H05K3/227H05K3/423
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Quick Facts
Patent No.
US 9,814,138
App. No.
15/355,757
Granted
Nov 7, 2017
Kind
B2
Abstract

A wiring substrate includes a first insulation layer covering a first wiring layer, a wiring pattern formed on an upper surface of the first insulation layer, and a via formed in a via hole of the first insulation layer to electrically connect the wiring pattern and the first wiring layer. The via includes a via seed layer and a filled portion filling the via hole. The wiring pattern includes a wiring seed layer formed on the upper surface of the first insulation layer and a pattern layer formed on the wiring seed layer. The via seed layer is formed from a metal acting to adsorb a plating enhancement agent, which enhances formation of the filled portion and the pattern layer in an electrolytic plating solution. The wiring seed layer is formed from a metal not acting to adsorb the plating enhancement agent as compared to the via seed layer.

Claims (15)

1. A wiring substrate comprising:

a first wiring layer;

a first insulation layer covering the first wiring layer and including a via hole that exposes a portion of an upper surface of the first wiring layer; and

a second wiring layer including a wiring pattern and a via, wherein the wiring pattern is formed on an upper surface of the first insulation layer, and the via is formed in the via hole to electrically connect the wiring pattern and the first wiring layer, wherein

the via includes

a via seed layer formed on a wall surface of the first insulation layer that defines the via hole, and

a filled portion formed in the via hole in which the via seed layer is formed, wherein the via hole is filled with the filled portion,

the wiring pattern includes

a wiring seed layer formed on the upper surface of the first insulation layer, and

a pattern layer formed on the wiring seed layer, wherein the pattern layer covers both of the wiring seed layer and the filled portion of the via,

the via seed layer is formed from a metal material that acts to adsorb a plating enhancement agent which enhances formation of the filled portion and the pattern layer in an electrolytic plating solution, and

the wiring seed layer is formed from a metal material that does not act to adsorb the plating enhancement agent as compared to the via seed layer.

2. The wiring substrate according to claim 1 , wherein the via seed layer is formed from copper or a copper alloy, and

the wiring seed layer is formed from nickel or a nickel alloy.

3. The wiring substrate according to claim 1 , wherein the via seed layer resides only in the via hole.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2016
From: YAMAMURA, KYOTA
To: SHINKO ELECTRIC INDUSTRIES CO., LTD.
Reel/Frame 040370/0016 →
Priority Claims (1)
JP 2015-229511 · Nov 25, 2015 · national
Continuity (1)
Related Publication 20170150603A1 · May 25, 2017