IP Library › Granted Patent US 9,842,867
Granted Patent B2
US 9,842,867 · App. 15/140,723 · Granted Dec 12, 2017

Array substrate and method of manufacturing the same, and display panel

Inventors: Junlin Peng (Beijing, CN); Shuai Yuan (Beijing, CN); Ming Huang (Beijing, CN); Lilu Zhao (Beijing, CN); Feng Xu (Beijing, CN)
Assignees: BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
H01L27/1288H01L21/3085H01L27/124H01L29/41733
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Quick Facts
Patent No.
US 9,842,867
App. No.
15/140,723
Granted
Dec 12, 2017
Kind
B2
Abstract

The present disclosure provides an array substrate and a method of manufacturing the same, and a display panel comprising the array substrate, for reducing a drop or height difference between surfaces of portions of a passivation layer located on either side of a source/drain electrode lead wire and a surface of a portion of passivation layer located on an upper surface of the source/drain electrode lead wire so as to increase an aperture ratio of the display panel. The method comprises: forming a source/drain electrode lead wire and a passivation layer successively on a base substrate, the passivation layer at least covering the source/drain electrode lead wire; and thinning a portion of the passivation layer located on the source/drain electrode lead wire such that a surface of the portion is higher than those of other portions of the passivation layer, at the time of patterning the passivation layer to form a via hole therein.

Claims (28)

1. A method of manufacturing an array substrate, the method comprising steps of:

forming a source/drain electrode lead wire and a passivation layer in turn on a base substrate, the passivation layer covering at least the source/drain electrode lead wire; and

thinning a portion of the passivation layer located on a side of the source/drain electrode lead wire facing away from the base substrate such that a surface of the portion is higher than those of other portions of the passivation layer, at the time of patterning the passivation layer to form a via hole therein.

2. The method according to claim 1 , wherein the step of thinning the portion of the passivation layer located on the source/drain electrode lead wire comprises:

forming a photoresist layer on the passivation layer;

exposing and developing the photoresist layer with a mask so as to form a photoresist partially-remained region, a photoresist fully-removed region and a photoresist fully-remained region, the photoresist partially-remained region corresponding to the source/drain electrode lead wire and the photoresist fully-removed region corresponding to a region of the passivation layer where the via hole is to be formed;

thinning a portion of the passivation layer corresponding to the photoresist fully-removed region;

removing photoresist from the photoresist partially-remained region; and

thinning a portion of the passivation layer corresponding to the photoresist partially-remained region, while fully removing the portion of the passivation layer corresponding to the photoresist fully-removed region to form the via hole.

3. The method according to claim 2 , wherein thinning the portion of the passivation layer corresponding to the photoresist fully-removed region comprises:

etching the portion of the passivation layer corresponding to the photoresist fully-removed region.

4. The method according to claim 3 , wherein a thickness of the etched portion of the passivation layer corresponding to the photoresist fully-removed region is ¼˜⅓ of those of other portions of the passivation layer.

5. The method according to claim 2 , wherein thinning the portion of the passivation layer corresponding to the photoresist partially-remained region comprises:

etching the portion of the passivation layer corresponding to the photoresist partially-remained region.

6. The method according to claim 2 , further comprising:

stripping off the photoresist from the photoresist fully-remained region.

7. The method according to claim 2 , wherein the mask is a half tone mask, a gray tone mask or a mask having slits.

8. The method according to claim 1 , wherein a thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is smaller than those of the other portions of the passivation layer.

9. The method according to claim 8 , wherein a thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is ⅔˜¾ of those of the other portions of the passivation layer.

10. The method according to claim 2 , wherein a thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is smaller than those of the other portions of the passivation layer.

11. The method according to claim 10 , wherein a thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is ⅔˜¾ of those of the other portions of the passivation layer.

12. An array substrate manufactured by using the method of claim 1 , the array substrate comprising the source/drain electrode lead wire and the passivation layer formed in turn on the base substrate,

wherein the passivation layer covers at least the source/drain electrode lead wire, a surface of a portion of the passivation layer located on a side of the source/drain electrode lead wire facing away from the base substrate is higher than those of other portions of the passivation layer, and a thickness of the portion of the passivation layer located on the side of the source/drain electrode lead wire facing away from the base substrate is smaller than those of the other portions of the passivation layer.

13. The array substrate according to claim 12 , wherein the thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is ⅔˜¾ of those of the other portions of the passivation layer.

14. An array substrate manufactured by using the method of claim 2 , the array substrate comprising the source/drain electrode lead wire and the passivation layer formed in turn on the base substrate,

wherein the passivation layer covers at least the source/drain electrode lead wire, a surface of a portion of the passivation layer located on the source/drain electrode lead wire is higher than those of other portions of the passivation layer, and a thickness of the portion of the passivation layer located on the source/drain electrode lead wire is smaller than those of the other portions of the passivation layer.

15. The array substrate according to claim 14 , wherein the thickness of the thinned portion of the passivation layer located on the source/drain electrode lead wire is ⅔˜¾ of those of the other portions of the passivation layer.

16. A display panel, comprising the array substrate according to claim 12 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2016
From: PENG, JUNLIN; YUAN, SHUAI; HUANG, MING; ZHAO, LILU; XU, FENG
To: BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 038403/0115 →
Priority Claims (1)
CN 2015 1 0617952 · Sep 24, 2015 · national
Continuity (1)
Related Publication 20170092665A1 · Mar 30, 2017