IP Library › Granted Patent US 9,859,366
Granted Patent B2
US 9,859,366 · App. 14/924,273 · Granted Jan 2, 2018

Process for fabricating silicon nanostructures

Inventors: Brent A. Buchine (Watertown, MA); Marcie R. Black (Salem, NH); Faris Modawar (Orem, UT)
Assignee: Advanced Silicon Group, Inc.
H01L29/0669B01J20/10B01J20/28007B82Y20/00B82Y30/00C23C14/34H01L21/0234H01L21/02118H01L21/02164H01L21/02175H01L21/02244H01L21/02282H01L21/02307H01L21/02488H01L21/02513H01L21/02532H01L21/02603H01L21/2855H01L21/28568H01L21/3086H01L21/30604H01L21/32134H01L29/04H01L29/0676H01L29/16H01L31/028H01L31/0236H01L31/02363H01L31/0352H01M4/0492H01M4/134H01M4/366H01M4/386H01M4/1395H01M4/661H01M10/0525H01M2004/027Y02E10/50Y10S977/762
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Quick Facts
Patent No.
US 9,859,366
App. No.
14/924,273
Granted
Jan 2, 2018
Kind
B2
Abstract

A process for etching a substrate comprising polycrystalline silicon to form silicon nanostructures includes depositing metal on top of the substrate and contacting the metallized substrate with an etchant aqueous solution comprising about 2 to about 49 weight percent HF and an oxidizing agent.

Claims (26)

1. A process for etching a substrate comprising polycrystalline silicon to form polycrystalline silicon nanostructures, the process comprising:

depositing metal on top of the substrate; and

contacting the metallized substrate with an etchant aqueous solution comprising about 2 to about 49 weight percent HF and an oxidizing agent.

2. The process of claim 1 , further comprising selecting a method of metal deposition and selecting the oxidizing agent such that the process results in formation of an array of nanostructures oriented substantially vertically relative to the top of the substrate.

3. The process of claim 2 , further comprising selecting the method of metal deposition and selecting the oxidizing agent such that the process results in formation of nanostructured arrays in which an average diameter of the nanostructures is less than about 125 nm.

4. The process of claim 1 , further comprising selecting a method of metal deposition and selecting the oxidizing agent such that the process results in formation of nanostructures oriented substantially and approximately perpendicular to the top of the substrate.

5. The process of claim 1 , wherein depositing the metal comprises depositing the metal as a continuous film.

6. The process of claim 1 , wherein the oxidizing agent is oxygen gas and the process further comprises bubbling the oxygen gas through the etchant aqueous solution.

7. The process of claim 1 , wherein the metal deposited on top of the substrate is silver.

8. The process of claim 7 , wherein the silver is deposited by sputtering.

9. The process of claim 7 , wherein the silver is deposited as a continuous film.

10. The process of claim 1 , further comprising depositing nanoparticles of one of silicon dioxide and iron oxide on the top of the substrate prior to depositing the metal on the top of the substrate.

11. The process of claim 10 , wherein the nanoparticles have dimensions of less than 100 nanometers.

12. The process of claim 10 , wherein the nanoparticles are deposited by spin-coating a solution including the nanoparticles on top of the substrate.

13. The process of claim 1 , further comprises pretreating iron oxide nanoparticles with oleic acid and depositing the pretreated iron oxide nanoparticles on the top of the substrate prior to depositing the metal on the top of the substrate.

14. The process of claim 13 , wherein depositing the pretreated iron oxide nanoparticles on the top of the substrate includes forming a solution of the pretreated iron oxide nanoparticles dispersed in chloroform, dipping the substrate in the solution, removing the substrate from the solution, and drying the substrate.

15. The process of claim 1 , further comprising depositing polystyrene nanoparticles on the top of the substrate prior to depositing the metal on the top of the substrate.

16. The process of claim 15 , further comprising reducing the size and spacing of the polystyrene nanoparticles by exposure to an oxygen plasma prior to depositing the metal on the top of the substrate.

17. The process of claim 15 , wherein the nanoparticles have dimensions of less than 100 nanometers.

18. The process of claim 1 , wherein the oxidizing agent is hydrogen peroxide.

19. The process of claim 1 , wherein the oxidizing agent is one or more of oxygen, ozone, chlorine, iodine, ammonium perchlorate, ammonium permanganate, barium peroxide, bromine, calcium chlorate, calcium hypochlorite, chlorine trifluoride, chromic acid, chromium trioxide (chromic anhydride), magnesium peroxide, dibenzoyl peroxide, sodium peroxide, dinitrogen trioxide, fluorine, perchloric acid, potassium bromate, potassium chlorate, potassium peroxide, propyl nitrate, sodium chlorate, sodium chlorite, and sodium perchlorate.

20. The process of claim 1 , further comprising removing the metal from the top of the substrate after etching the substrate.

21. The process of claim 1 , further comprising forming a silicon nanostructure produced by the process into a lithium ion battery anode.

22. The process of claim 1 , further comprising forming an optoelectronic device including a silicon nanostructure produced by the process.

23. The process of claim 1 , further comprising forming an intermediate band photovoltaic material including a silicon nanostructure produced by the process.

24. The process of claim 1 , further comprising filling pores in a silicon nanostructure produced by the process with one or more of doped silicon, bismuth, germanium, gallium nitride, zinc oxide, and gallium arsenide.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2020
From: ADVANCED SILICON GROUP, INC.
To: ADVANCED SILICON GROUP TECHNOLOGIES, LLC
Reel/Frame 054143/0197 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2015
From: BUCHINE, BRENT A.; BLACK, MARCIE R.; MODAWAR, FARIS
To: BANDGAP ENGINEERING, INC.
Reel/Frame 036895/0032 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2015
From: BLACK, MARCIE R.; ADAMS, TRACY; CHLEBOSKI, RICHARD; DANE SHULMAN ASSOCIATES, LLC; MASSACHUSETTS GREEN ENERGY FUND I LP; SHAW, ROBERT W., JR.; NEW ENTERPRISE ASSOCIATES 12, LP
To: ADVANCED SILICON GROUP, INC.
Reel/Frame 036895/0747 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2015
From: BANDGAP ENGINEERING, INC.
To: BLACK, MARCIE R.; ADAMS, TRACY; CHLEBOSKI, RICHARD; DANE SHULMAN ASSOCIATES, LLC; MASSACHUSETTS GREEN ENERGY FUND I LP; SHAW, ROBERT W., JR.; NEW ENTERPRISE ASSOCIATES 12, LP
Reel/Frame 036981/0172 →
Continuity (6)
Continuation 14444361 · Jul 28, 2014
Continuation 13305649 · Nov 28, 2011
Continuation 12423623 · Apr 14, 2009
Provisional Application 61141082 · Dec 29, 2008
Provisional Application 61044573 · Apr 14, 2008
Related Publication 20160049471A1 · Feb 18, 2016