Mass spectrometer

1. A mass spectrometer for performing an analysis of sample ions, the mass spectrometer comprising:

a first ion optical element that is supplied with a first gas;

a mass analyzer, wherein the performance of the mass analyzer is dependent on the pressure of the first gas in the first ion optical element; and

a controller for setting a property of the first gas, which comprises at least the pressure of the first gas, on the basis of at least an expected mass of the sample ions and a desired resolution of the mass analyzer, wherein setting the property of the first gas includes determining a compromise between optimizing the performance of the first ion optical element and optimizing the performance of the mass analyzer, the controller comprises a computer for making rules-based decisions for setting the property of the first gas, wherein the rules-based decisions comprise determining which of a plurality of predetermined mass ranges an expected or determined mass of the sample lies within, determining whether a desired mass resolution lies below or above a mass resolution threshold and setting the property of the gas based on the determination to enable a desired signal intensity and/or mass resolution to be obtained using the mass analyzer.

2. The mass spectrometer of claim 1 , wherein the mass analyzer is selected from: an ion cyclotron resonance (ICR) mass analyzer, an orbital trap mass analyzer, a time-of-flight mass analyzer, an electrostatic trap mass analyzer, and an electrodynamic ion trap mass analyzer.

3. The mass spectrometer of claim 1 , wherein the property of the first gas further comprises at least a composition of the first gas.

4. The mass spectrometer of claim 1 , further comprising:

a second ion optical element that is supplied with a second gas; wherein the controller is configured for setting a property of the second gas on the basis of the characteristic of the analysis to be performed by the mass spectrometer.

5. The mass spectrometer of claim 4 , wherein the property of the second gas comprises at least one of a second gas pressure in the second ion optical element and a composition of the second gas.

6. The mass spectrometer of claim 1 , wherein the controller is configured to receive an input of an application of the analysis of the sample ions, a type of the sample ions, the expected mass of the sample ions, a charge of the sample ions and the desired analysis resolution.

7. The mass spectrometer of claim 6 , wherein the controller is configured to receive the input of at least one of the application of the analysis of the sample ions, the type of the sample ions, the expected mass of the sample ions, the expected charge of the sample ions and the desired analysis resolution from an operator of the controller.

8. The mass spectrometer of claim 1 , wherein the controller is configured to determine at least one of a type of the sample ions, the expected mass of the sample ions and an expected charge of the sample ions from a mass spectrometer experimentation result.

9. The mass spectrometer of claim 8 , wherein the at least one of the type of the sample ions, the expected mass of the sample ions and the expected charge of the sample ions is determined from at least one of an average mass and average charge obtained from a plurality of mass spectrometer experimentation results.

10. The mass spectrometer of claim 1 , wherein the first ion optical element is any one of a mass analyzer; a collision cell; an ion storage device; an ion guide; a mass filter; an ion mobility analyzer; and an ion lens.

11. A method for operating a mass spectrometer, the mass spectrometer comprising a first ion optical element and a mass analyzer, the method comprising the steps of:

determining at least an expected mass of sample ions and a desired resolution of the mass analyzer; and

determining whether a desired mass resolution lies below or above a mass resolution threshold, and

making a rules-based decision to determine the property of a first gas, including at least pressure of the first gas, based on said determinations to enable a desired signal intensity and/or mass resolution to be obtained using the mass analyzer, wherein determining the property of the first gas includes determining a compromise between optimizing the performance of the first ion optical element and optimizing the performance of the mass analyzer;

setting, on the basis of the rules based decision, the property of a first gas used for supplying a first ion optical element of the mass spectrometer, wherein the performance of the mass analyzer is dependent on the pressure of the first gas in the first ion optical element.

12. The method of claim 11 , wherein the mass analyzer is any one of: an ion cyclotron resonance (ICR) mass analyzer, an orbital trap mass analyzer, a time-of-flight mass analyzer (especially a multiple-reflection time-of-flight (MR-TOF) mass analyzer), an electrostatic trap mass analyzer, and an electrodynamic ion trap mass analyzer.

13. The method of claim 11 , wherein the property of the first gas further comprises at least a composition of the first gas.

14. The method of claim 11 , further comprising the step of:

setting, on the basis of the characteristic of the sample ion, a property of a second gas used for supplying a second ion optical element of the mass spectrometer.

15. The method of claim 14 , wherein the property of the second gas comprises at least one of a second gas pressure in the second ion optical element and a composition of the second gas.

16. The method of claim 11 further comprising:

receiving at least one of an application of the analysis of the sample ions, a type of the sample ions, the expected mass of the sample ions, an expected charge of the sample ions and the desired analysis resolution from an operator of the mass spectrometer.

17. The method of claim 11 further comprising:

determining at least one of a type of the sample ions, the expected mass of the sample ions and an expected charge of the sample ions from a mass spectrometer experimentation result.

18. The method of claim 17 wherein the at least one of the type of the sample ions, the expected mass of the sample ions and the expected charge of the sample ions is determined from at least one of an average mass and average charge obtained from a plurality of mass spectrometer experimentation results.

19. The method of claim 11 , wherein the first ion optical element is any one of a mass analyzer; a collision cell; an ion storage device; an ion guide; a mass filter; an ion mobility analyzer; and an ion lens.