IP Library › Granted Patent US 9,925,618
Granted Patent B2
US 9,925,618 · App. 14/842,272 · Granted Mar 27, 2018

Laser processing apparatus

Inventors: Tsutomu Maeda (Tokyo, JP); Kiyoshi Ohsuga (Tokyo, JP)
Assignee: Disco Corporation
B23K26/0057B23K26/032B23K26/402B23K26/53H01L21/67092H01L21/681B23K2203/56
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Quick Facts
Patent No.
US 9,925,618
App. No.
14/842,272
Granted
Mar 27, 2018
Kind
B2
Abstract

A laser processing apparatus is provided wherein a laser beam of a wavelength which passes through a wafer having a surface on which a plurality of devices are disposed is irradiated along a schedule division line to separate the adjacent devices from each other to form a modification layer which continuously extends in a given length in the inside of the wafer. A mark portion is displayed in an overlapping relationship with a picked up image obtained by image pickup of a wafer on a display unit. If the mark portion is moved to a desired position of the picked up image displayed on the display unit, then coordinates which correspond to the desired position of the picked up image are stored as a start point or an end portion of a scheduled division line, along which the modification layer is to be formed, into a storage unit.

Claims (9)

1. A laser processing apparatus wherein a laser beam of a wavelength which passes through a wafer having a surface on which a plurality of devices are disposed is irradiated along a schedule division line to separate the adjacent devices from each other to form a modification layer which continuously extends in a given length in the inside of the wafer, comprising:

a chuck table configured to hold a wafer thereon;

laser beam irradiation means for irradiating the laser beam on the wafer held on the chuck table;

moving means for moving the chuck table and the laser beam irradiation means relative to each other in a processing feeding direction and an indexing feeding direction;

display means for displaying a picked up image obtained by image pickup of the wafer held on the chuck table;

inputting means for inputting a processing condition for processing of the wafer; and

a storage device that stores the processing condition inputted by the inputting means;

a mark portion being displayed in an overlapping relationship with the picked up image on the display means;

coordinates which correspond to a desired position of the picked up image displayed on the display means when the mark portion is moved to the desired position of the picked up image being stored as a start point or an end portion of a scheduled division line, along which the modification layer is to be formed, into the storage device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2015
From: MAEDA, TSUTOMU; OHSUGA, KIYOSHI
To: DISCO CORPORATION
Reel/Frame 036469/0477 →
Priority Claims (1)
JP 2014-186235 · Sep 12, 2014 · national
Continuity (1)
Related Publication 20160074959A1 · Mar 17, 2016