IP Library › Granted Patent US 6,826,101
Granted Patent Utility
US 6,826,101 · Confirmation No. 9910

SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME

Inventor: Hiroyuki Fukuyama
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2004-10-15 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-07-19 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-07-19 NOA Notice of Allowance and Fees Due (PTOL-85) 4 View
2004-07-19 1449 List of References cited by applicant and considered by examiner 2 View
2004-07-19 892 List of references cited by examiner 1 View
2004-07-19 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-07-19 FWCLM Index of Claims 1 View
2004-07-19 SRFW Search information including classification, databases and other search related notes 1 View
2004-07-15 SRNT Examiner's search strategy and results 2 View
2004-06-28 ELC. Response to Election / Restriction Filed 1 View
2004-05-28 CTRS Requirement for Restriction/Election 5 View
2004-05-28 FWCLM Index of Claims 1 View
2004-03-04 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2004-03-04 FOR Foreign Reference 15 View
2004-03-04 FOR Foreign Reference 20 View
2003-05-28 TRNA Transmittal of New Application 1 View
2003-05-28 SPEC Specification 31 View
2003-05-28 CLM Claims 5 View
2003-05-28 ABST Abstract 1 View
2003-05-28 DRW Drawings-only black and white line drawings 15 View
2003-05-28 OATH Oath or Declaration filed 3 View
2003-05-28 WFEE Fee Worksheet (SB06) 1 View
2003-05-28 WFEE Fee Worksheet (SB06) 1 View
2003-05-28 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2003-05-28 FOR Foreign Reference 7 View
2003-05-28 FOR Foreign Reference 7 View
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Quick Facts
Patent No.
US 6,826,101
App. No.
10/446,077
Filed
2003-05-28
Granted
2004-11-30
Pub. No.
US20030223297A1
Examiner
PHUNG, ANH K
Art Unit
2824
PTA
0 days