IP Library Granted Patent US 6,924,521
Granted Patent B2
US 6,924,521 · App. 10/760,499 · Granted Aug 2, 2005

Semiconductor device comprising a capacitor using a ferroelectric material

Assignees: Kabushiki Kaisha Toshiba; Infineon Technologies AG
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Quick Facts
Patent No.
US 6,924,521
App. No.
10/760,499
Granted
Aug 2, 2005
Kind
B2
Abstract

A semiconductor device comprises a bottom electrode, a top electrode, and a dielectric film provided between the bottom electrode and the top electrode and made of a perovskite type ferroelectrics containing Pb, Zr, Ti and O, the dielectric film comprising a first portion formed of a plurality of crystal grains partitioned by grain boundaries having a plurality of directions.

Claims (19)

1. A semiconductor device comprising:

a bottom electrode;

a top electrode; and

a dielectric film provided between the bottom electrode and the top electrode and made of a perovskite type ferroelectrics containing Pb, Zr, Ti and O, the dielectric film comprising a first portion formed of a plurality of crystal grains partitioned by grain boundaries having a plurality of directions, wherein the crystal grain contained in the first portion is shaped conical or oval.

2. The semiconductor device according to claim 1 , wherein the dielectric film further comprises a second portion provided between the bottom electrode and the first portion and formed of a plurality of crystal grains partitioned by grain boundaries extending in one direction.

3. The semiconductor device according to claim 2 , wherein the crystal grain contained in the second portion is shaped columnar.

4. The semiconductor device according to claim 2 , wherein the dielectric film further comprises a third portion provided between the top electrode and the first portion and formed of a plurality of crystal grains partitioned by grain boundaries extending in one direction.

5. The semiconductor device according to claim 4 , wherein the crystal grain contained in the third portion is shaped columnar.

6. The semiconductor device according to claim 1 , wherein the dielectric film further comprises a second portion provided between the top electrode and the first portion and formed of a plurality of crystal grains partitioned by grain boundaries extending in one direction.

7. The semiconductor device according to claim 6 , wherein the crystal grain contained in the second portion is shaped columnar.

8. The semiconductor device according to claim 1 , wherein at least one of the bottom electrode and the top electrode includes a film containing Ru.

9. A semiconductor device comprising:

a bottom electrode;

a top electrode; and

a dielectric film provided between the bottom electrode and the top electrode and made of a perovskite type ferroelectrics containing Pb, Zr, Ti and O, the dielectric film comprising a first portion formed of a plurality of crystal grains partitioned by grain boundaries having a plurality of directions, wherein a cross section of the crystal grain contained in the first portion is wedge-shaped or shaped elliptical.

10. A semiconductor device comprising:

a bottom electrode;

a top electrode; and

a dielectric film provided between the bottom electrode and the top electrode and made of a perovskite type ferroelectrics containing Pb, Zr, Ti and O, the dielectric film comprising a first portion formed of a plurality of crystal grains partitioned by grain boundaries having a plurality of directions, wherein the crystal grains contained in the first portion and positioned adjacent to each other have different heights.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023796/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2004
From: ARISUMI, OSAMU; IMAI, KEITARO; YAMAKAWA, KOJI; MOON, BUM-KI
To: KABUSHIKI KAISHA TOSHIBA; INFINEON TECHNOLOGIES AG
Reel/Frame 015510/0063 →
Priority Claims (1)
JP 2002-154585 · May 28, 2002 · national
Continuity (2)
Continuation PCTJP030667100 · May 28, 2003
Related Publication 20040206995A1 · Oct 21, 2004