Etching method, gate etching method, and method of manufacturing semiconductor devices
View Patent ↗In a method of manufacturing a semiconductor device, a dummy sample and an actual device are prepared. The dummy sample and the actual device have substantially an identical layer and an identical resist pattern formed on the layer. Then, a dummy discharge is carried out. The layer and the resist pattern of the dummy sample are etched in an etching device so that the layer and the resist pattern of the dummy device are simultaneously slimmed. Finally, the layer and the resist pattern of the actual device are etched in the etching device after the etching of the dummy sample so that the layer and the resist pattern of the actual device are simultaneously slimmed.
1. A method of manufacturing a semiconductor device comprising:
preparing a dummy sample and an actual device each of which has a layer and a resist pattern formed on the layer, wherein each of the layers and the resist patterns of the dummy sample and the actual device have substantially identical material, but have a different size;
carrying out a dummy discharge;
etching the layer and the resist pattern of the dummy sample in an etching device, so as to simultaneously slim the layer and the resist pattern of the dummy sample; and
etching the layer and the resist pattern of the actual device in the etching device after the etching of the dummy sample, so as to simultaneously slim the layer and the resist pattern of the actual device.
2. A method of manufacturing a semiconductor device according to claim 1 , wherein the dummy discharge includes:
providing a silicon substrate in the etching device;
introducing an etching gas into the etching device; and
applying an RF power to the etching device so as to etch the silicon substrate.
3. A method of manufacturing a semiconductor device according to claim 1 , wherein conditions of the dummy sample etching and the actual device etching are substantially identical.
4. A method of manufacturing a semiconductor device according to claim 1 , wherein conditions of the dummy discharge, the dummy sample etching and the actual device etching are substantially identical.
5. A method of manufacturing a semiconductor device according to claim 1 , wherein a deposition film made of a material of the resist pattern is deposited on an inner wall of the etching device.
6. A method of manufacturing a semiconductor device according to claim 1 , wherein the dummy sample includes a gate insulating film formed on a substrate, a gate material film formed on the gate insulating film, an organic layer formed on the gate material film, and the resist pattern formed on the organic layer, and wherein the actual device includes the gate insulating film formed on the substrate, the gate material film formed on the gate insulating film, the organic layer formed on the gate material film, and the resist pattern formed on the organic layer.