Optical trigger for PICA technique
View Patent ↗Optical triggering system and method for synchronizing a test of an integrated circuit chip with its operation. An optical triggering system includes a testing mechanism, such as a PICA testing mechanism, for testing an integrated circuit chip. An optical trigger mechanism generates an optical trigger signal for synchronizing a test of the integrated circuit chip with its operation. The optical trigger mechanism provides an optical trigger signal having reduced jitter and a higher frequency rate than an electrical trigger signal resulting in a more accurate test of the integrated circuit chip.
1. A system for synchronizing a test of an integrated circuit chip with its operation, comprising:
a testing mechanism for testing the integrated circuit chip; and
an optical trigger mechanism for generating an optical trigger signal for synchronizing a test of the integrated circuit chip with its operation for testing by the testing mechanism, wherein the optical trigger mechanism includes:
a light emission device external of the integrated circuit chip for generating the optical trigger signal; and
a light detection device on the integrated circuit chip and responsive to detecting the optical trigger signal generated by the external light emission device for synchronizing a test of the integrated circuit chip with its operation.
2. The system according to claim 1 , wherein the light emission device comprises a laser.
3. The system according to claim 1 , wherein the light detection device comprises a light detection diode.
4. The system according to claim 1 , and further including a light transmission mechanism for transmitting the optical trigger signal to the light detection device.
5. The system according to claim 4 , wherein the light transmission mechanism comprises one of collection optics and an optical fiber.
6. The system according to claim 1 , wherein the testing mechanism comprises a PICA testing mechanism.
7. A method for testing an integrated circuit chip, comprising:
providing a testing mechanism for testing an integrated circuit chip;
generating an optical trigger signal externally of the integrated circuit chip for synchronizing a test of the integrated circuit chip with its operation for testing by the testing mechanism; and
detecting the optical trigger signal on the integrated circuit chip.
8. The method according to claim 7 , and further including:
transmitting the optical trigger signal from an external light emission device to a light detection device on the integrated circuit chip.
9. The method according to claim 8 , wherein transmitting the optical trigger signal from an external light emission device to a light detection device on the integrated circuit chip comprises:
transmitting the optical trigger signal from the external light emission device to the light detection device on the integrated circuit chip using one of collection optics and an optical fiber.