Methods and apparatus for memory calibration
View Patent ↗In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.
1. A method of adjusting memory system calibration, comprising:
while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and
while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data.
2. The method of claim 1 further comprising:
storing the first amount of calibration data; and
storing the second amount of calibration data.
3. The method of claim 1 wherein:
in the first operating state, the memory system is initialized; and
in the second operating state, the memory system stores or reads functional data.
4. The method of claim 1 wherein calibrating the memory system using the first amount of calibration data includes:
storing a first set of bit patterns which correspond to respective pins of the memory, wherein each bit pattern is of a first size; and
transmitting the bit patterns to respective pins of the memory.
5. An apparatus for adjusting memory system calibration, comprising:
a first array for storing a first amount of calibration data;
a second array for storing a second amount of calibration data, wherein the second amount of calibration data is smaller than the first amount of calibration data; and
calibration adjustment logic coupled to the first and second arrays;
wherein the calibration adjustment logic is adapted to:
while the memory system operates in a first operating state, calibrate the memory system using the first amount of calibration data so that functional data may be read from and written to memory of the memory system; and
while the memory system operates in a second operating state, calibrate the memory system using the second amount of calibration data so that functional data may be read from and written to the memory.
6. The apparatus of claim 5 wherein the apparatus is adapted to:
store the first amount of calibration data in the first array; and
store the second amount of calibration data in the second array.
7. The apparatus of claim 5 wherein:
in the first operating state, the memory system is initialized; and
in the second operating state, the memory system stores or reads functional data.
8. The apparatus of claim 5 wherein the apparatus is adapted to:
store a first set of bit patterns, which correspond to respective pins of the memory, in the first array, wherein each bit pattern is of a first size; and
transmit the bit patterns to respective pins of the memory.
9. The apparatus of claim 8 wherein the apparatus is further adapted to:
store a second set of bit patterns, each of which corresponds to a plurality of pins of the memory, in the second array, wherein each bit pattern is of a second size smaller than the first; and
transmit the bit patterns from the second set to corresponding pins of the memory.
10. The apparatus of claim 9 wherein the second set includes fewer bit patterns than the first set.
11. The apparatus of claim 9 wherein the apparatus is further adapted to transmit the same bit pattern from the second set to non-adjacent pins of the memory.
12. A system for adjusting memory system calibration, comprising:
an apparatus for adjusting memory system calibration having:
a first array for storing a first amount of calibration data;
a second array for storing a second amount of calibration data, wherein the second amount of calibration data is smaller than the first amount of calibration data; and
calibration adjustment logic coupled to the first and second arrays; and
a memory coupled to the apparatus for adjusting memory system calibration;
wherein the calibration adjustment logic is adapted to:
while the memory system operates in a first operating state, calibrate the memory system using the first amount of calibration data so that functional data may be read from and written to the memory of the memory system; and
while the memory system operates in a second operating state, calibrate the memory system using the second amount of calibration data so that functional data may be read from and written to the memory.
13. The system of claim 12 wherein the apparatus is adapted to:
store the first amount of calibration data in the first array; and
store the second amount of calibration data in the second array.
14. The system of claim 12 wherein:
in the first operating state, the memory system is initialized; and
in the second operating state, the memory system stores or reads functional data.
15. The system of claim 12 wherein the apparatus is adapted to:
store a first set of bit patterns, which correspond to respective pins of the memory, in the first array, wherein each bit pattern is of a first size; and
transmit the bit patterns to respective pins of the memory.
16. The system of claim 15 wherein the apparatus is further adapted to:
store a second set of bit patterns, each of which corresponds to a plurality of pins of the memory, in the second array, wherein each bit pattern is of a second size smaller than the first and the second set includes fewer bit patterns than the first set; and
transmit the bit patterns from the second set to corresponding pins of the memory.
17. The system of claim 16 wherein the apparatus is further adapted to transmit the same bit pattern from the second set to non-adjacent pins of the memory.
18. A method of adjusting memory system calibration, comprising:
while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and
while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data;
wherein calibrating the memory system using the first amount of calibration data includes;
storing a first set of bit patterns which correspond to respective pins of the memory, wherein each bit pattern is of a first size; and
transmitting the bit patterns to respective pins of the memory; and
wherein calibrating the memory system using the second amount of calibration data includes:
storing a second set of bit patterns each of which corresponds to a plurality of pins of the memory, wherein each bit pattern is of a second size smaller than the first; and
transmitting the bit patterns from the second set to corresponding pins of the memory.
19. The method of claim 18 wherein the second set includes fewer bit patterns than the first set.
20. The method of claim 18 wherein transmitting the bit patterns from the second set to corresponding pins of the memory includes transmitting the same bit pattern from the second set to non-adjacent pins of the memory.