IP Library Granted Patent US 7,345,410
Granted Patent B2
US 7,345,410 · App. 11/386,372 · Granted Mar 18, 2008

Temperature compensation of film bulk acoustic resonator devices

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Quick Facts
Patent No.
US 7,345,410
App. No.
11/386,372
Granted
Mar 18, 2008
Kind
B2
Abstract

A resonator. The resonator includes a bottom electrode overlaying at least part of a substrate, a composite structure overlaying at least part of the bottom electrode, and a top electrode overlaying at least part of the composite structure. The composite structure comprises a piezoelectric layer and a compensation layer, and the compensation layer includes silicon dioxide combined with boron.

Claims (22)

1. A resonator, comprising:

a bottom electrode overlaying at least part of a substrate;

a composite structure overlaying at least part of the bottom electrode, wherein the composite structure comprises a piezoelectric layer and a compensation layer and wherein the compensation layer comprises silicon dioxide combined with boron; and

a top electrode overlaying at least part of the composite structure.

2. The resonator as recited in claim 1 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises silicon dioxide ion implanted with boron.

3. The resonator as recited in claim 1 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises borosilicate glass.

4. The resonator as recited in claim 1 , wherein the piezoelectric layer overlays at least part of the bottom electrode and wherein the compensation layer overlays at least part of the piezoelectric layer.

5. The resonator as recited in claim 1 , wherein the compensation layer overlays at least part of the bottom electrode and wherein the piezoelectric layer overlays at least part of the compensation layer.

6. The resonator as recited in claim 1 , wherein the composite structure further comprises an additional compensation layer, wherein the compensation layer overlays at least part of the bottom electrode, wherein the piezoelectric layer overlays at least part of the compensation layer, and wherein the additional compensation layer overlays at least part of the piezoelectric layer.

7. The resonator as recited in claim 1 , wherein the bottom electrode overlays a cavity created in the substrate and wherein the cavity is devoid of sacrificial material.

8. A resonator, comprising:

a bottom electrode overlaying at least part of a substrate, wherein the bottom electrode comprises a bottom under electrode layer, a compensation layer, and a bottom over electrode layer and wherein the compensation layer comprises silicon dioxide combined with boron;

a piezoelectric layer overlaying at least part of the bottom electrode; and

a top electrode overlaying at least part of the piezoelectric layer.

9. The resonator as recited in claim 8 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises silicon dioxide ion implanted with boron.

10. The resonator as recited in claim 8 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises borosilicate glass.

11. A resonator, comprising:

a bottom electrode overlaying at least part of a substrate;

a piezoelectric layer overlaying at least part of the bottom electrode; and

a top electrode overlaying at least part of the piezoelectric layer, wherein the top electrode comprises a top under electrode layer, a compensation layer, and a top over electrode layer and wherein the compensation layer comprises silicon dioxide combined with boron.

12. The resonator as recited in claim 11 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises silicon dioxide ion implanted with boron.

13. The resonator as recited in claim 11 , wherein the silicon dioxide combined with boron comprising the compensation layer comprises borosilicate glass.

Assignments (11)
CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER PREVIOUSLY RECORDED AT REEL: 047357 FRAME: 0302. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 22, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048674/0834 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED ON REEL 047195 FRAME 0658. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047357/0302 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047195/0658 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
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Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →
MERGER Recorded May 7, 2013
From: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2009
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2009
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2006
From: GRANNEN, KEVIN J.; CHOY, JOHN; ROGERS, CARRIE A.
To: AGILENT TECHNOLOGIES, INC.
Reel/Frame 017774/0896 →