Designing and operating of semiconductor integrated circuit by taking into account process variation

1. An apparatus for designing a semiconductor integrated circuit, comprising:

a memory unit configured to store data and a program; and

a processing unit configured to process the data stored in the memory by executing the program stored in the memory,

wherein the processing unit performs:

defining a tolerable range in which an operating temperature and an operating power supply voltage of a semiconductor integrated circuit are allowed to vary;

computing a target temperature and a target power supply voltage that cancel variation in circuit characteristics caused by process variation of the semiconductor integrated circuit, separately for each circuit characteristic responsive to the process variation; and

designing the semiconductor integrated circuit such that the semiconductor integrated circuit properly operates with any temperature and power supply voltage within the tolerable range based on an assumption that the semiconductor integrated circuit is to operate within the tolerable range centered substantially at the target temperature and target power supply voltage.