Dynamic scannable latch and method of operation
View Patent ↗A latch has a first mode in which the latch functions as a dynamic latch and a second mode in which the latch functions as a static latch. The latch has a feedback circuit that in turn has two parallel switchable loads. The first load is responsive to a data input signal of the latch in the first mode and disabled in the second mode. The second load is responsive to a clock signal in the second mode and disabled in the first mode. The switchable loads being in parallel provides for the ability to select the feedback that is better for the particular mode of operation. The first and second switchable loads can be optimized for the particular mode of operation that will use it.
1. A circuit, comprising:
a first input circuit having an input for receiving a first input signal and having an output;
a second input circuit having an input for receiving a second input signal and having an output;
an inverting circuit having an input coupled to the outputs of the first and second input circuits; and
a feedback circuit having an input coupled to an output of the inverting circuit and an output coupled to the outputs of the first and second input circuits;
wherein the feedback circuit comprises:
a first transistor having a control terminal coupled to the output of the inverting circuit, a first current electrode coupled to a first power supply terminal, and a second current electrode coupled to the outputs of the first and second input circuits;
a first switchable load, coupled between the second current electrode of the first transistor and a second power supply terminal, responsive to the first input signal in a first mode and disabled in a second mode;
a second switchable load, in parallel with the first switchable load, responsive to a clock signal in the second mode and disabled in the first; and
a second transistor that couples the first and second switchable loads to the second current electrode of the first transistor, the second transistor having a control electrode coupled to the output of the inverting circuit, a first current electrode coupled to the second current electrode of the first transistor, and a second current electrode coupled to the first and second switchable loads.
2. The circuit of claim 1 , wherein the first switchable load comprises a third transistor and a fourth transistor having current electrodes coupled in series between the second transistor and the second power supply terminal, wherein:
the third transistor has a control electrode for receiving the first input signal; and
the fourth transistor has a control electrode for receiving a signal that causes the fourth transistor to be conductive in the first mode and non-conductive in the second mode.
3. The circuit of claim 2 , wherein the second switchable load comprises a fifth transistor and a sixth transistor having current electrodes coupled in series between the second transistor and the second power supply terminal, wherein:
the fifth transistor has a control electrode for receiving the clock signal; and
the sixth transistor has a control electrode for receiving a signal that causes the sixth transistor to be conductive in the second mode and non-conductive in the first mode.
4. The circuit of claim 3 , wherein:
the first mode is a mode in which the circuit operates as a dynamic latch;
the second mode is a mode in which the circuit operates as a static latch;
the first transistor is an N-channel transistor; and
the second, third, fourth, fifth, and sixth transistors are P-channel transistors.
5. The circuit of claim 1 , wherein the first switchable load comprises a second and a third transistor having current electrodes coupled in series between the first transistor and the second power supply terminal, wherein:
the second transistor has a control electrode for receiving the first input signal; and
the third transistor has a control electrode for receiving a signal that causes the third transistor to be conductive in the first mode and non-conductive in the second mode.
6. The circuit of claim 1 , wherein the second switchable load comprises a second and a third transistor having current electrodes coupled in series between the first transistor and the second power supply terminal, wherein:
the second transistor has a control electrode for receiving the clock signal; and
the third transistor has a control electrode for receiving a signal that causes the third transistor to be conductive in the second mode and non-conductive in the first mode.
7. The circuit of claim 1 , further comprising a second transistor coupled in series with the first transistor, wherein:
the first and second transistors are between the first power supply terminal and the output of the feedback circuit; and
the second transistor is responsive to the clock signal.
8. The circuit of claim 7 , wherein the first and second transistors are N-channel transistors and the second transistor has a control electrode for receiving an inverse of the clock signal.
9. The circuit of claim 1 , wherein the first input circuit is responsive to the clock signal.
10. The circuit of claim 9 , wherein the first input circuit comprises:
a clocked inverter comprising an inverter and a clocking transistor coupled to the inverter having a control electrode responsive to the clock signal.
11. The circuit of claim 1 , wherein the second input circuit is responsive to the clock signal.
12. The circuit of claim 9 , wherein the second input circuit comprises a clocked inverter, comprising:
an inverter having an input as the input of the second input circuit and an output as the output of the second input circuit;
a first clocking transistor, coupled between the inverter and the first power supply terminal, for receiving the clock signal; and
a second clocking transistor, coupled between the inverter and the second power supply terminal, for receiving an inverse of the clock signal.
13. The circuit of claim 1 , wherein:
the first input circuit is enabled during the first mode and disabled during the second mode; and
the second input circuit is enabled during the second mode and disabled during the first mode.
14. A latch for storing information at a storage node, wherein the latch has a dynamic latch mode in which the latch functions as a dynamic latch and a scan mode in which the latch functions as a static latch, wherein the latch comprises a feedback circuit, wherein the feedback circuit comprises two parallel loads in which a first load of the two parallel loads is responsive to a data input signal of the latch in the dynamic latch mode and disabled in the scan mode, and a second load of the two parallel loads is responsive to a clock signal in the scan mode and disabled in the dynamic latch mode, the two parallel loads coupled in series with series-connected first and second transistors that are connected together at the storage node, the first and second transistors being of opposite conductivity type and each having a control electrode connected to an output of a logic gate having an input connected to the storage node.
15. The latch of claim 14 , wherein the latch is further characterized as comprising:
a first input circuit, enabled during the dynamic latch mode and disabled during the scan mode, having an input for receiving the data input signal and an output coupled to an output of the feedback circuit;
a second input circuit, disabled during the dynamic latch mode and enabled during the scan mode, having an input for receiving a scan input signal and an output coupled to the output of the feedback circuit; and
an inverting circuit having an input coupled to the output of the first input circuit and second input circuit and an output coupled to an input of the feedback circuit.
16. The latch of claim 15 , further comprising a slave latch, wherein:
the slave latch has an input coupled to the output of the inverting circuit; and
the slave latch has an output that is enabled during the scan mode and disabled during the dynamic latch mode.
17. A method for operating a latch, comprising:
providing a storage node in the latch;
providing input data on the storage node during a first phase of a clock signal while preventing scan data from reaching the storage node during a first mode of operation;
providing a feedback circuit having a first load and a second load in which the first and second loads are in parallel and coupled in series with series-connected first and second transistors that are connected together at the storage node, the first and second transistors being of opposite conductivity type and each having a control electrode connected to an output of a logic gate having an input connected to the storage node;
enabling the first load to be responsive to the input data during the first mode of operation;
disabling the second load during the first mode of operation;
providing scan data on the storage node during the first phase of the clock signal while preventing input data from reaching the storage node during a second mode of operation:
enabling the second load to be responsive to the clock signal during the second mode of operation; and
disabling the first load during the second mode of operation.
18. The method of claim 17 , wherein the step of providing input data is further characterized by allowing a change from a first logic state to a second logic state but not from the second logic state to the first logic state on the storage node during a second phase of the clock signal during the first mode of operation.
19. The method of claim 17 , wherein the step of enabling the second load is further characterized by causing the scan data on the storage node to be unchanged during a second phase of the clock signal during the second mode of operation.