IP Library Granted Patent US 8,063,468
Granted Patent B2
US 8,063,468 · App. 12/207,922 · Granted Nov 22, 2011

Semiconductor device, method for manufacturing semiconductor device, and method for designing manufacturing semiconductor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,063,468
App. No.
12/207,922
Granted
Nov 22, 2011
Kind
B2
Abstract

A semiconductor device includes a semiconductor chip, a moisture resistant ring provided in the semiconductor chip and having a chamfered flat part in a position corresponding to a corner of the semiconductor chip, and a first monitor pattern formed inside the moisture resistant ring. At least a part of the first monitor pattern is disposed inside an n-sided polygonal area (n is a natural number which is 4 or higher than 4) situated within the moisture resistant ring, and outside a quadrangular area situated inside the n-sided polygonal area. The n-sided polygonal area has a vertex at least at each of a first end and a second end of the chamfered flat part, and the quadrangular area has a vertex at least at a middle point of the chamfered flat part.

Claims (20)

1. A semiconductor device comprising:

a semiconductor chip;

a moisture resistant ring provided in the semiconductor chip and having a chamfered flat part in a position corresponding to a corner of the semiconductor chip; and

a first monitor pattern formed inside the moisture resistant ring,

wherein at least a part of the first monitor pattern is disposed inside an n-sided polygonal area (n is a natural number which is 4 or higher than 4) situated within the moisture resistant ring, and outside a quadrangular area situated inside the n-sided polygonal area,

the n-sided polygonal area has a vertex at least at each of a first end and a second end of the chamfered flat part, and

the quadrangular area has a vertex at least at a middle point of the chamfered flat part.

2. The semiconductor device according to claim 1 , further comprising a second monitor pattern, a third monitor pattern, and a fourth monitor pattern which have an arrangement same to an arrangement of the first monitor pattern,

wherein the first monitor pattern, the second monitor pattern, the third monitor pattern, and the fourth monitor pattern are disposed in four corners of the semiconductor chip, respectively.

3. The semiconductor device according to claim 1 ,

wherein the first monitor pattern is disposed outside an I/O ring of the semiconductor chip.

4. A semiconductor device comprising:

a semiconductor element formed in a first area of a semiconductor chip;

a frame surrounding the semiconductor element; and

a first monitor pattern formed in an n-sided polygonal (n is a natural number which is 4 or higher than 4) second area disposed in a corner of the semiconductor chip and inside the frame,

wherein the frame has a chamfered flat part at each of four corners of the frame, and one side of the n-sided polygonal second area is parallel to the chamfered flat part.

5. The semiconductor device according to claim 4 , further comprising a second monitor pattern, a third monitor pattern, and a fourth monitor pattern which have relative positions same to a relative position of the first monitor pattern,

wherein the first monitor pattern, the second monitor pattern, the third monitor pattern, and the fourth monitor pattern are disposed in four corners of the semiconductor chip, respectively.

6. The semiconductor device according to claim 5 ,

wherein the frame is a seal ring.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2025
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 073964/0516 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2024
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 069454/0333 →
MERGER Recorded May 24, 2023
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU LIMITED
Reel/Frame 064221/0545 →
CHANGE OF NAME AND CHANGE OF ADDRESS Recorded Jul 16, 2020
From: AIZU FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053481/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: AIZU FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053209/0468 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
CHANGE OF NAME Recorded Jul 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024794/0500 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2008
From: FUJITA, KAZUSHI; NANJO, RYOTA
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021541/0934 →