IP Library Granted Patent US 8,133,332
Granted Patent B2
US 8,133,332 · App. 12/369,844 · Granted Mar 13, 2012

Method for preparing FePt media at low ordering temperature and fabrication of exchange coupled composite media and gradient anisotropy media for magnetic recording

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Quick Facts
Patent No.
US 8,133,332
App. No.
12/369,844
Granted
Mar 13, 2012
Kind
B2
Abstract

A method includes: constructing a multilayer structure including a first layer of Pt, a first layer of A1 phase FePt on the first layer of Pt, and a second layer of Pt on the layer of FePt, and annealing the multilayer structure to convert the A1 phase FePt to L1 o phase FePt.

Claims (42)

1. A method comprising:

constructing a multilayer structure including a first layer of Pt, a first layer of A1 phase FePt on the first layer of Pt, and a second layer of Pt on the layer of FePt; annealing the multilayer structure to convert the A1 phase FePt to L1 o phase FePt;

removing the second layer of Pt; and

depositing a layer of magnetically soft material on the L1 o phase FePt.

2. The method of claim 1 , wherein the annealing step is performed at about 300° C.

3. The method of claim 1 , wherein the A1 phase FePt is Fe rich and comprises:

Fe 50+x ,Pt 50-x , where x is larger than 5 but less than 30.

4. The method of claim 1 , wherein the multilayer structure further comprises:

grain isolation material.

5. The method of claim 1 , wherein:

the first layer of Pt has a thickness in the range of from about 0.5 nm to about 2 nm;

the first layer of A1 phase FePt on the first layer of Pt has a thickness in the range of from about 2 nm to about 10 nm; and

the second layer of Pt on the layer of FePt has a thickness in the range of from about 0 nm to about 5 nm.

6. The method of claim 1 , wherein the multilayer structure is on a substrate comprising one of:

glass, aluminum, or an aluminum alloy.

7. The method of claim 1 , wherein the multilayer structure is formed by physical vapor deposition.

8. The method of claim 1 , wherein the physical vapor deposition comprises one of:

magnetron sputtering, pulsed laser deposition, or ion beam deposition.

9. The method of claim 1 , wherein the annealing step is performed at a minimum annealing temperature in a range from about 200° C. to about 500° C.

10. A method comprising:

constructing a multilayer structure including a first layer of Pt, a first layer of A1 phase FePt on the first layer of Pt, and a second layer of Pt on the layer of FePt;

annealing the multilayer structure to convert the A1 phase FePt to L1 o phase FePt;

removing the second layer of Pt;

depositing an exchange control layer on the L1 o phase FePt; and

depositing a layer of magnetically soft material on the exchange control layer.

11. The method of claim 10 , wherein the exchange control layer comprises at least one of:

Pt, Pd, or a non-magnetic material.

12. The method of claim 10 , wherein the multilayer structure further comprises:

grain isolation material.

13. The method of claim 10 , wherein the annealing step is performed at about 300° C.

14. The method of claim 10 , wherein the A1 phase FePt is Fe rich and comprises:

Fe 50+x Pt 50-x , where x is larger than 5 but less than 30.

15. The method of claim 10 , wherein:

the first layer of Pt has a thickness in the range of from about 0.5 nm to about 2 nm;

the first layer of A1 phase FePt on the first layer of Pt has a thickness in the range of from about 2 nm to about 10 nm; and

the second layer of Pt on the layer of FePt has a thickness in the range of from about 0 nm to about 5 nm.

16. The method of claim 10 , wherein the multilayer structure is on a substrate comprising one of:

glass, aluminum, or an aluminum alloy.

17. The method of claim 10 , wherein the multilayer structure is formed by physical vapor deposition.

18. The method of claim 10 , wherein the physical vapor deposition comprises one of:

magnetron sputtering, pulsed laser deposition, or ion beam deposition.

19. The method of claim 10 , wherein the annealing step is performed at a minimum annealing temperature in a range from about 200° C. to about 500° C.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Jul 23, 2025
From: THE BANK OF NOVA SCOTIA
To: SEAGATE TECHNOLOGY PUBLIC LIMITED COMPANY; SEAGATE TECHNOLOGY; SEAGATE TECHNOLOGY HDD HOLDINGS; I365 INC.; SEAGATE TECHNOLOGY LLC; SEAGATE TECHNOLOGY INTERNATIONAL; SEAGATE HDD CAYMAN; SEAGATE TECHNOLOGY (US) HOLDINGS, INC.
Reel/Frame 072193/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2025
From: THE BANK OF NOVA SCOTIA
To: SEAGATE TECHNOLOGY US HOLDINGS, INC.; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY LLC
Reel/Frame 070363/0903 →
RELEASE OF SECURITY INTEREST Recorded Jul 23, 2024
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: SEAGATE TECHNOLOGY LLC; EVAULT INC
Reel/Frame 068457/0076 →
RELEASE OF SECURITY INTEREST Recorded May 20, 2024
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
Reel/Frame 067471/0955 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS Recorded Jul 19, 2013
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT AND SECOND PRIORITY REPRESENTATIVE
To: SEAGATE TECHNOLOGY LLC; EVAULT INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY INTERNATIONAL; SEAGATE TECHNOLOGY US HOLDINGS, INC.
Reel/Frame 030833/0001 →
SECURITY AGREEMENT Recorded Oct 15, 2012
From: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
To: THE BANK OF NOVA SCOTIA, AS ADMINISTRATIVE AGENT
Reel/Frame 029127/0527 →
SECOND LIEN PATENT SECURITY AGREEMENT Recorded Oct 15, 2012
From: SEAGATE TECHNOLOGY LLC; EVAULT, INC. (F/K/A I365 INC.); SEAGATE TECHNOLOGY US HOLDINGS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 029253/0585 →
SECURITY AGREEMENT Recorded Mar 24, 2011
From: SEAGATE TECHNOLOGY LLC
To: THE BANK OF NOVA SCOTIA, AS ADMINISTRATIVE AGENT
Reel/Frame 026010/0350 →
RELEASE Recorded Jan 19, 2011
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: SEAGATE TECHNOLOGY HDD HOLDINGS; MAXTOR CORPORATION; SEAGATE TECHNOLOGY LLC; SEAGATE TECHNOLOGY INTERNATIONAL
Reel/Frame 025662/0001 →
SECURITY AGREEMENT Recorded May 15, 2009
From: MAXTOR CORPORATION; SEAGATE TECHNOLOGY LLC; SEAGATE TECHNOLOGY INTERNATIONAL
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT AND FIRST PRIORITY REPRESENTATIVE; WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT AND SECOND PRIORITY REPRESENTATIVE
Reel/Frame 022757/0017 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2009
From: QIU, JIAOMING; CHEN, YONGHUA; JU, GANPING
To: SEAGATE TECHNOLOGY LLC
Reel/Frame 022249/0478 →