Method of manufacturing semiconductor device
View Patent ↗To prevent semiconductor chips from adhering to the trays during transport, a method is employed which transports semiconductor chips in the following state. When trays provided with a plurality of accommodating portions having a recessed cross section for accommodating semiconductor chips on a main surface thereof are stacked in a plurality of stages, the semiconductor chips are accommodated in spaces defined by the accommodating portions formed over the main surface of the lower-stage tray and corresponding accommodating portions formed over the back surface of the upper-stage tray. Here, on bottom surfaces of the accommodating portions formed over the back surface of the upper-stage tray, isolated projections having a height which prevents the projections from coming into contact with the semiconductor chips are arranged in a scattered manner. In this way, it is possible to prevent the semiconductor chips from adhering to the back surface of the upper-stage tray.
1. A method of manufacturing a semiconductor device, comprising steps of:
(a) forming an element and a wiring layer on a main surface of a semiconductor wafer;
(b) reducing a thickness of the semiconductor wafer;
(c) cutting out semiconductor chips from the semiconductor wafer; and
(d) transporting the semiconductor chips in a state that the semiconductor chips are accommodated in a tray,
wherein the step (d) includes the steps of:
(d1) providing a plurality of trays each having a first accommodating portion formed on a main surface thereof and a second accommodating portion formed on a back surface thereof, the back surface thereof opposing to the main surface thereof; and
(d2) transporting the plurality of trays to a desired place in a state that the semiconductor chips formed in the step (c) are accommodated in a space, wherein the space is defined at portions where the second accommodating portion of the back surface of an upper-stage tray of the plurality of trays overlaps the first accommodating portion of the main surface of a lower-stage tray of the plurality of trays, when the plurality of trays are stacked in a plurality of stages;
wherein a projection is formed on a bottom surface in the second accommodating portion, the bottom surface opposing to the semiconductor chip;
wherein the projection is not in contact with the semiconductor chip accommodated in the tray;
wherein the semiconductor chip is accommodated such that a main surface of the semiconductor chip opposes to the bottom surface of the second accommodating portion;
wherein a polyimide-based resin film is exposed on the main surface of the semiconductor chip; and
wherein an external terminal formed on the main surface of the semiconductor chip is exposed from an opening formed in the resin film.
2. The method of manufacturing a semiconductor device according to claim 1 , wherein a height of the projection is equal to or more than 100 μm.
3. The method of manufacturing a semiconductor device according to claim 1 , wherein a thickness of the semiconductor chip is equal to or less than 150 μm.
4. A method of manufacturing a semiconductor device, comprising steps of:
(a) forming an element and a wiring layer on a main surface of a semiconductor wafer;
(b) reducing a thickness of the semiconductor wafer;
(c) cutting out semiconductor chips from the semiconductor wafer; and
(d) transporting the semiconductor chips in a state that the semiconductor chips are accommodated in a tray,
wherein the step (d) includes the steps of:
(d1) providing a plurality of trays each having a first accommodating portion formed on a main surface thereof and a second accommodating portion formed on a back surface thereof, the back surface thereof opposing to the main surface thereof; and
(d2) transporting the plurality of trays to a desired place in a state that the semiconductor chips formed in the step (c) are accommodated in a space, wherein the space is defined at portions where the second accommodating portion of the back surface of an upper-stage tray of the plurality of trays overlaps the first accommodating portion of the main surface of a lower-stage tray of the plurality of trays, when the plurality of trays are stacked in a plurality of stages;
wherein a convexoconcave shape is formed on a bottom surface in the first accommodating portion by pearskin finish treatment;
wherein a projection is formed on a bottom surface in the second accommodating portion, the bottom surface in the second accommodating portion opposing to the semiconductor chip;
wherein the projection is not in contact with the semiconductor chip accommodated in the tray;
wherein the projection is formed such that a roughness of the bottom surface in the second accommodating portion is greater than that of the bottom surface in the first accommodating portion;
wherein the semiconductor chip is accommodated such that a main surface of the semiconductor chip opposes to the bottom surface of the second accommodating portion;
wherein a polyimide-based resin film is exposed on the main surface of the semiconductor chip; and
wherein an external terminal formed on the main surface of the semiconductor chip is exposed from an opening formed in the resin film.
5. The method of manufacturing a semiconductor device according to claim 4 , wherein a height of the projection is equal to or more than 100 μm.
6. The method of manufacturing a semiconductor device according to claim 4 , wherein a thickness of the semiconductor chip is equal to or less than 150 μm.
7. A method of manufacturing a semiconductor device, comprising steps of:
(a) forming an element and a wiring layer on a main surface of a semiconductor wafer;
(b) reducing a thickness of the semiconductor wafer;
(c) cutting out semiconductor chips from the semiconductor wafer; and
(d) transporting the semiconductor chips in a state that the semiconductor chips are accommodated in a tray,
wherein the step (d) includes the steps of:
(d1) providing a plurality of trays each having a first accommodating portion formed on a main surface thereof and a second accommodating portion formed on a back surface thereof, the back surface thereof opposing to the main surface thereof; and
(d2) transporting the plurality of trays to a desired place in a state that the semiconductor chips formed in the step (c) are accommodated in a space, wherein the space is defined at portions where the second accommodating portion of the back surface of an upper-stage tray of the plurality of trays overlaps the first accommodating portion of the main surface of a lower-stage tray of the plurality of trays, when the plurality of trays are stacked in a plurality of stages;
wherein a plurality of projections are formed on a bottom surface in the second accommodating portion, the bottom surface in the second accommodating portion opposing to the semiconductor chip;
wherein the plurality of projections are decentrally-arranged on the bottom surface;
wherein each of the plurality of projections is not in contact with the semiconductor chip accommodated in the tray;
wherein the semiconductor chip is accommodated such that a main surface of the semiconductor chip opposes to the bottom surface of the second accommodating portion;
wherein a polyimide-based resin film is exposed on the main surface of the semiconductor chip; and
wherein an external terminal formed on the main surface of the semiconductor chip is exposed from an opening formed in the resin film.
8. The method of manufacturing a semiconductor device according to claim 7 , wherein a height of the projection is equal to or more than 100 μm.
9. The method of manufacturing a semiconductor device according to claim 7 , wherein a thickness of the semiconductor chip is equal to or less than 150 μm.
10. A method of manufacturing a semiconductor device, comprising steps of:
(a) forming an element and a wiring layer on a main surface of a semiconductor wafer;
(b) reducing a thickness of the semiconductor wafer;
(c) cutting out semiconductor chips from the semiconductor wafer; and
(d) transporting the semiconductor chips in a state that the semiconductor chips are accommodated in a tray,
wherein the step (d) includes the steps of:
(d1) providing a plurality of trays each having a first accommodating portion formed on a main surface thereof and a second accommodating portion formed on a back surface thereof, the back surface thereof opposing to the main surface thereof; and
(d2) transporting the plurality of trays to a desired place in a state that the semiconductor chips formed in the step (c) are accommodated in a space, wherein the space is defined at portions where the second accommodating portion of the back surface of an upper-stage tray of the plurality of trays overlaps the first accommodating portion of the main surface of a lower-stage tray of the plurality of trays, when the plurality of trays are stacked in a plurality of stages;
wherein a convexoconcave shape is formed on a bottom surface in the first accommodating portion by pearskin finish treatment;
wherein a plurality of projections are decentrally-arranged on a bottom surface in the second accommodating portion, the bottom surface in the second accommodating portion opposing to the semiconductor chip;
wherein a height of each of the plurality of projections is larger than that of a convex portion of the convexoconcave shape;
wherein each of the plurality of projections is not in contact with the semiconductor chip accommodated in the tray;
wherein the semiconductor chip is accommodated such that a main surface of the semiconductor chip opposes to the bottom surface of the second accommodating portion;
wherein a polyimide-based resin film is exposed on the main surface of the semiconductor chip; and
wherein an external terminal formed on the main surface of the semiconductor chip is exposed from an opening formed in the resin film.
11. The method of manufacturing a semiconductor device according to claim 10 , wherein a height of the projection is equal to or more than 100 μm.
12. The method of manufacturing a semiconductor device according to claim 10 , wherein a thickness of the semiconductor chip is equal to or less than 150 μm.
13. A method of manufacturing a semiconductor device, comprising steps of:
(a) forming an element and a wiring layer on a main surface of a semiconductor wafer;
(b) reducing a thickness of the semiconductor wafer;
(c) cutting out semiconductor chips from the semiconductor wafer;
(d) transporting the semiconductor chips in a state that the semiconductor chips are accommodated in a tray;
(e) after the step (d), picking up the semiconductor chip from the tray, and mounting the semiconductor chip on a chip-mounting area of a substrate; and
(f) after the step (e), electrically connecting an external terminal with an electrode of the substrate, wherein the external terminal is a part of the wiring layer formed on the main surface of the semiconductor chip,
wherein the step (d) includes the steps of:
(d1) providing a plurality of trays each having a main surface, a first accommodating portion formed on the main surface, and a back surface opposing to the main surface; and
(d2) transporting the plurality of trays to a desired place in a state that the semiconductor chips formed in the step (c) are accommodated in a space, wherein the space is defined at portions where the back surface of the upper-stage tray of the plurality of trays overlaps the first accommodating portion of the main surface of the lower-stage tray of the plurality of trays, when the plurality of trays are stacked in a plurality of stages;
wherein a projection is formed on a bottom surface in a second accommodating portion, the bottom surface opposing to the semiconductor chip;
wherein the projection is not in contact with the semiconductor chip accommodated in the tray;
wherein the semiconductor chip is accommodated such that a main surface of the semiconductor chip opposes to the bottom surface of the second accommodating portion;
wherein a polyimide-based resin film is exposed on the main surface of the semiconductor chip; and
wherein an external terminal formed on the main surface of the semiconductor chip is exposed from an opening formed in the resin film.
14. The method of manufacturing a semiconductor device according to claim 13 , wherein a height of the projection is equal to or more than 100 μm.
15. The method of manufacturing a semiconductor device according to claim 13 , wherein a thickness of the semiconductor chip is equal to or less than 150 μm.