IP Library Granted Patent US 8,022,518
Granted Patent B2
US 8,022,518 · App. 12/759,008 · Granted Sep 20, 2011

Semiconductor device having a sealing body and partially exposed conductors

Assignee: Renesas Electronics Corporation
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Quick Facts
Patent No.
US 8,022,518
App. No.
12/759,008
Granted
Sep 20, 2011
Kind
B2
Abstract

A novel semiconductor device high in both heat dissipating property and connection reliability in mounting is to be provided. The semiconductor device comprises a semiconductor chip, a resin sealing member for sealing the semiconductor chip, a first conductive member connected to a first electrode formed on a first main surface of the semiconductor chip, and a second conductive member connected to a second electrode formed on a second main surface opposite to the first main surface of the semiconductor chip, the first conductive member being exposed from a first main surface of the resin sealing member, and the second conductive member being exposed from a second main surface opposite to the first main surface of the resin sealing member and also from side faces of the resin sealing member.

Claims (69)

1. A semiconductor device comprising:

(a) a semiconductor chip having a main surface and a back surface opposite to the main surface,

the semiconductor chip having a first side and a second side intersecting the first side, and

the semiconductor chip having a first electrode and a second electrode on the main surface thereof and a third electrode on the back surface thereof;

(b) a first metal conductor having a first obverse surface and a first reverse surface opposite to the first obverse surface,

the first metal conductor comprising a first portion, a second portion, and a third portion,

the first portion being positioned over the first electrode of the semiconductor chip,

the third portion being positioned under the first portion,

the second portion being positioned between the first portion and the third portion, and

the first electrode of the semiconductor chip is electrically connected to the first reverse surface of the first portion by using a conductive adhesive;

(c) a second metal conductor having a second obverse surface and a second reverse surface opposite to the second obverse surface,

the second metal conductor being positioned under the first portion of the first metal conductor, and

the second electrode of the semiconductor chip is electrically connected to the second obverse surface by using a metal wire;

(d) a third metal conductor having a third obverse surface and a third reverse surface opposite to the third obverse surface,

the semiconductor chip being mounted over the third obverse surface of the third metal conductor, and

the third electrode of the semiconductor chip is electrically connected to the third obverse surface;

(e) a sealing body having a top surface and a bottom surface opposite to the top surface,

the sealing body having a first side surface and a second side surface opposite to the first side surface,

the first and second side surfaces intersecting the top and bottom surfaces, and

the sealing body sealing the semiconductor chip, the wire, a part of the first metal conductor, a part of the second metal conductor, and a part of the third metal conductor;

wherein a part of the first obverse surface of the first portion of the first metal conductor is exposed from the top surface of the sealing body,

wherein a part of the first reverse surface of the third portion of the first metal conductor, a part of the second reverse surface of the second metal conductor, and a part of the third reverse surface of the third metal conductor are exposed from the bottom surface of the sealing body,

wherein the first portion of the first metal conductor has a first area and a second area, the first area is located nearer to the first side surface of the sealing body than the second area in a plan view, and a length of the first area is longer than a length of the second area in a direction where the first side surface of the sealing body extends, and

wherein the second electrode of the semiconductor chip is disposed in an area defined by the first and second areas of the first portion of the first metal conductor and the first and second sides of the semiconductor chip in the plan view.

2. A semiconductor device according to claim 1 ,

wherein the first area of the first portion of the first metal conductor is opposed to the first side of the semiconductor chip and the second area of the first portion of the first metal conductor is opposed to the second side of the semiconductor chip in the plan view.

3. A semiconductor device according to claim 1 ,

wherein the second metal conductor is disposed along the second side surface of the sealing body.

4. A semiconductor device according to claim 3 ,

wherein the first area of the first portion of the first metal conductor is opposed to the second metal conductor in the plan view.

5. A semiconductor device according to claim 1 ,

wherein the third portion of the first metal conductor is disposed along the second side surface of the sealing body.

6. A semiconductor device according to claim 1 ,

wherein the first obverse surface of the second area of the first portion of the first metal conductor is exposed from the top surface of the sealing body.

7. A semiconductor device comprising:

(a) a semiconductor chip having a main surface and a back surface opposite to the main surface,

the semiconductor chip having a first side and a second side intersecting the first side, and

the semiconductor chip including a MOSFET, and

the semiconductor chip having a source electrode and a gate electrode of the MOSFET on the main surface thereof and a drain electrode of the MOSFET on the back surface thereof;

(b) a first metal conductor having a first obverse surface and a first reverse surface opposite to the first obverse surface,

the first metal conductor comprising a first portion, a second portion, and a third portion,

the first portion being positioned over the source electrode of the semiconductor chip,

the third portion being positioned under the first portion,

the second portion being positioned between the first portion and the third portion, and

the source electrode of the semiconductor chip is electrically connected to the first reverse surface of the first portion by using a conductive adhesive;

(c) a second metal conductor having a second obverse surface and a second reverse surface opposite to the second obverse surface,

the second metal conductor being positioned under the first portion of the first metal conductor, and

the gate electrode of the semiconductor chip is electrically connected to the second obverse surface by using a metal wire;

(d) a third metal conductor having a third obverse surface and a third reverse surface opposite to the third obverse surface,

the semiconductor chip being mounted over the third obverse surface of the third metal conductor, and

the drain electrode of the semiconductor chip is electrically connected to the third obverse surface;

(e) a sealing body having a top surface and a bottom surface opposite to the top surface,

the sealing body having a first side surface and a second side surface opposite to the first side surface,

the first and second side surfaces intersecting the top and bottom surfaces, and

the sealing body sealing the semiconductor chip, the wire, a part of the first metal conductor, a part of the second metal conductor, and a part of the third metal conductor;

wherein a part of the first obverse surface of the first portion of the first metal conductor is exposed from the top surface of the sealing body,

wherein a part of the first reverse surface of the third portion of the first metal conductor, a part of the second reverse surface of the second metal conductor, and a part of the third reverse surface of the third metal conductor are exposed from the bottom surface of the sealing body,

wherein the first portion of the first metal conductor has a first area and a second area, the first area is located nearer to the first side surface of the sealing body than the second area in a plan view, and a length of the first area is longer than a length of the second area in a direction where the first side surface of the sealing body extends, and

wherein the gate electrode of the semiconductor chip is disposed in an area defined by the first and second areas of the first portion of the first metal conductor and the first and second sides of the semiconductor chip in the plan view.

8. A semiconductor device according to claim 7 ,

wherein the first area of the first portion of the first metal conductor is opposed to the first side of the semiconductor chip and the second area of the first portion of the first metal conductor is opposed to the second side of the semiconductor chip in the plan view.

9. A semiconductor device according to claim 7 ,

wherein the second metal conductor is disposed along the second side surface of the sealing body.

10. A semiconductor device according to claim 9 ,

wherein the first area of the first portion of the first metal conductor is opposed to the second metal conductor in the plan view.

11. A semiconductor device according to claim 7 ,

wherein the third portion of the first metal conductor is disposed along the second side surface of the sealing body.

12. A semiconductor device according to claim 7 ,

wherein the first obverse surface of the second area of the first portion of the first metal conductor is exposed from the top surface of the sealing body.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
MERGER AND CHANGE OF NAME Recorded Jul 29, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024755/0338 →
Priority Claims (1)
JP 2003-054638 · Feb 28, 2003 · national
Continuity (4)
Continuation 12155479 · Jun 5, 2008
Continuation 11131367 · May 18, 2005
Division 10755375 · Jan 13, 2004
Related Publication 20100193934A1 · Aug 5, 2010