IP Library Granted Patent US 8,289,758
Granted Patent B2
US 8,289,758 · App. 12/943,979 · Granted Oct 16, 2012

Magnetic tunnel junction with electronically reflective insulative spacer

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,289,758
App. No.
12/943,979
Granted
Oct 16, 2012
Kind
B2
Abstract

Magnetic tunnel junctions having a specular insulative spacer are disclosed. The magnetic tunnel junction includes a free magnetic layer, a reference magnetic layer, an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic layer from the reference magnetic layer, and an electrically insulating and electronically reflective layer positioned to reflect at least a portion of electrons back into the free magnetic layer.

Claims (33)

1. A magnetic tunnel junction, comprising:

a free magnetic layer;

a reference magnetic layer;

an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic layer from the reference magnetic layer;

an electrically insulating and electronically reflective layer positioned to reflect at least a portion of electrons back into the free magnetic layer;

a second electrically insulating and electronically reflective layer, wherein the free magnetic layer is between the electrically insulating and electronically reflective layer and the second electrically insulating and electronically reflective layer.

2. A magnetic tunnel junction according to claim 1 , wherein the electrically insulating and electronically reflective layer has a non-uniform thickness.

3. A magnetic tunnel junction according to claim 1 , wherein the electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms.

4. A magnetic tunnel junction according to claim 1 , wherein the electrically insulating and electronically reflective layer comprises AlO, TiO, MgO, ZnO, SiO, CuO, NiO, SiN, TaN or AlN.

5. A magnetic tunnel junction according to claim 1 , wherein the electrically insulating and electronically reflective layer has an area resistance from 1 to 50 ohmsμm 2 .

6. A magnetic tunnel junction according to claim 1 , wherein the free magnetic layer is between the electrically insulating and non-magnetic tunneling barrier layer and the electrically insulating and electronically reflective layer.

7. A magnetic tunnel junction according to claim 6 , wherein the reference magnetic layer comprises a synthetic anti-ferromagnetic element.

8. A magnetic tunnel junction according to claim 1 , wherein the second electrically insulating and electronically reflective layer has a non-uniform thickness.

9. A magnetic tunnel junction according to claim 1 , wherein the second electrically insulating and electronically reflective layer has a thickness value in a range from 3 to 15 Angstroms.

10. A magnetic tunnel junction, comprising:

a free magnetic layer;

a reference magnetic layer;

an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic layer from the reference magnetic layer;

a first electrically insulating and electronically reflective layer; and

a second electrically insulating and electronically reflective layer, wherein the free magnetic layer is between the electrically insulating and electronically reflective layer and the second electrically insulating and electronically reflective layer.

11. A magnetic tunnel junction according to claim 10 , wherein at least one of the first or second electrically insulating and electronically reflective layers has a non-uniform thickness.

12. A magnetic tunnel junction according to claim 10 , wherein the first and second electrically insulating and electronically reflective layers have a thickness value in a range from 3 to 15 Angstroms.

13. A magnetic tunnel junction according to claim 12 , wherein the first and second electrically insulating and electronically reflective layers comprise AlO, TiO, MgO, ZnO, SiO, CuO, NiO, SiN, TaN or AlN.

14. A magnetic tunnel junction according to claim 13 , wherein the first and second electrically insulating and electronically reflective layers have an area resistance from 1 to 50 ohmsμm 2 .

15. A magnetic tunnel junction according to claim 11 , wherein the reference magnetic layer comprises a synthetic anti-ferromagnetic element.

16. A magnetic tunnel junction, comprising:

a free magnetic layer;

a synthetic anti-ferromagnetic reference magnetic element;

an electrically insulating and non-magnetic tunneling barrier layer separating the free magnetic layer from the synthetic anti-ferromagnetic reference magnetic layer;

an electrically insulating and electronically reflective layer, wherein the free magnetic layer is between the electrically insulating and electronically reflective layer and the electrically insulating and non-magnetic tunneling barrier layer;

a comprising a second electrically insulating and electronically reflective layer disposed within the synthetic anti-ferromagnetic reference magnetic element.

17. A magnetic tunnel junction according to claim 16 , wherein the electrically insulating and electronically reflective layer has a non-uniform thickness.

18. A magnetic tunnel junction according to claim 16 , wherein the synthetic anti-ferromagnetic element comprises a first ferromagnetic layer, a second ferromagnetic layer, and a third ferromagnetic layer, the first and second ferromagnetic layers are anti-ferromagnetically aligned and separated by an electrically conductive and non-ferromagnetic spacer layer and an anti-ferromagnetic layer is adjacent to the first ferromagnetic layer, and the second electrically insulating and electronically reflective layer separates the second ferromagnetic layer from a third ferromagnetic layer.

Assignments (2)
RELEASE OF SECURITY INTEREST Recorded Jul 23, 2025
From: THE BANK OF NOVA SCOTIA
To: SEAGATE TECHNOLOGY PUBLIC LIMITED COMPANY; SEAGATE TECHNOLOGY; SEAGATE TECHNOLOGY HDD HOLDINGS; I365 INC.; SEAGATE TECHNOLOGY LLC; SEAGATE TECHNOLOGY INTERNATIONAL; SEAGATE HDD CAYMAN; SEAGATE TECHNOLOGY (US) HOLDINGS, INC.
Reel/Frame 072193/0001 →
SECURITY AGREEMENT Recorded Mar 24, 2011
From: SEAGATE TECHNOLOGY LLC
To: THE BANK OF NOVA SCOTIA, AS ADMINISTRATIVE AGENT
Reel/Frame 026010/0350 →