Non-volatile memory programming
Some embodiments include a memory device and a method of programming memory cells of the memory device. One such method can include applying a signal to a line associated with a memory cell, the signal being generated based on digital information. The method can also include, while the signal is applied to the line, determining whether a state of the memory cell is near a target state when the digital information has a first value, and determining whether the state of the memory cell has reached the target state when the digital information has a second value. Other embodiments including additional memory devices and methods are described.
1. A method comprising:
applying a signal to a line associated with a memory cell, the signal being generated based on digital information;
determining whether the memory cell is near a target state when the digital information has a first value and while the signal is applied to the line; and
determining whether the memory cell has reached the target state when the digital information has a second value and while the signal is applied to the line, wherein the digital information includes a plurality of values generated in sequential order, the first value of the digital information corresponds to a first value among the plurality of values, the second value of the digital information corresponds to a second value among the plurality of values, and wherein a difference between the second value and the first value is two.
2. The method of claim 1 , wherein determining whether the memory cell is near a target state comprises determining whether a threshold voltage value of the memory cell has reached a first voltage value, and wherein determining whether the memory cell has reached the target state comprises determining whether the threshold voltage value of the memory cell has reached a second voltage value, wherein the second voltage value is greater than the first voltage value.
3. The method of claim 1 , further comprising adjusting a programming rate of the memory cell if the memory cell is near the target state.
4. The method of claim 1 , further comprising finishing programming of the memory cell if the memory cell has reached the target state.
5. The method of claim 1 , further comprising increasing the programming rate of the memory cell if the memory cell is not near the target state and has not reached the target state.
6. The method of claim 1 , wherein the second value of the digital information corresponds to a target threshold voltage value of the memory cell.
7. The method of claim 1 , wherein the signal includes a value generated based on the first value of the digital information, and the value of the signal is less than the first voltage value.
8. The method of claim 7 , wherein the signal includes an additional value generated based on the second value of the digital information, wherein the additional value is less than the second voltage value.
9. The method of claim 2 , further comprising:
changing a threshold voltage value of the memory cell before applying the signal to the line.
10. A method comprising:
applying a signal during a first time interval and a second time interval to a first line associated with a memory cell, the signal having a first value generated based on a first value of digital information during the first time interval, and the signal having a second value generated based on a second value of the digital information during the second time interval;
sensing a signal on a second line associated with the memory cell during the first time interval to provide first sense result information indicating a relationship between a state of the memory cell and the first value of the signal; and
sensing the signal on the second line during the second time interval to provide second sense result information indicating a relationship between the state of the memory cell and the second value of the signal, wherein the digital information is different from the state of the memory cell.
11. The method of claim 10 , wherein the state of the memory cell comprises a threshold voltage value of the memory cell.
12. The method of claim 10 , further comprising:
changing the state of the memory cell if the second sense result indicates that the state of the memory cell is less than the second value.
13. The method of claim 11 , further comprising:
applying an additional signal to the first line during a programming operation to change the threshold voltage value of the memory cell; and
applying a voltage greater than zero volts to the second line during a programming of the memory cell if the first sense result information indicates that the threshold voltage value of the memory cell before the additional signal applying to the first line is greater than the first value.
14. A method comprising:
applying a signal during a first time interval and a second time interval to a first line associated with a memory cell, the signal having a first value corresponding to a first value of digital information during the first time interval, and the signal having a second value corresponding to a second value of the digital information during the second time interval;
sensing a signal on a second line associated with the memory cell during the first time interval to provide first sense result information indicating a relationship between a state of the memory cell and the first value;
sensing the signal on the second line during the second time interval to provide second sense result information indicating a relationship between the state of the memory cell and the second value;
storing the first sense result information; and
storing the second sense result information.
15. The method of claim 10 , wherein the second value is greater than the first value, and the second value includes a target threshold voltage value of the memory cell.
16. An apparatus comprising:
memory cells; and
a module to:
generate a first sequence of values and a second sequence of values;
determine whether a threshold voltage value of a selected memory cell among the memory cells has reached a first value when a selected value among the values of the first sequence matches a value corresponding to a target threshold voltage value of the selected memory cell; and
determine whether the threshold voltage value of the selected memory cell has reached a second value when a selected value among the values of the second sequence matches the value corresponding to the target threshold voltage value of the selected memory cell.
17. The apparatus of claim 16 , wherein the module is configured to apply a first voltage to a sense line associated with the selected memory cell during a programming of the selected memory cell if the threshold voltage value of the selected memory cell is less than the first value, and the module is configured to apply a second voltage to the sense line during the programming of the selected memory cell if the threshold voltage value of the selected memory cell is greater than the first value and less than the second value.
18. The apparatus of claim 17 , wherein the module is configured to apply a third voltage to the sense line if the threshold voltage value of the selected memory cell has reached the second value.
19. The apparatus of claim 16 , wherein the second value includes the target threshold voltage value.
20. The apparatus of claim 16 , wherein the module is further configured to:
determine whether a threshold voltage value of an additional selected memory cell of the memory cells has reached a third value when the selected value among the values of the first sequence matches a value corresponding to a target threshold voltage value of the additional selected memory cell; and
determine whether the threshold voltage value of the additional selected memory cell has reached a fourth value when the selected value among the values of the second sequence matches the value corresponding to the target threshold voltage value of the additional selected memory cell.
21. The apparatus of claim 20 , wherein the third value is equal to the first value and the fourth value is equal to the second value.