IP Library Granted Patent US 8,581,405
Granted Patent B2
US 8,581,405 · App. 13/151,408 · Granted Nov 12, 2013

Integrated circuit having a semiconductor substrate with barrier layer

Inventors: Stephan Dertinger (Heidelberg, DE); Alfred Martin (Munich, DE); Barbara Hasler (Munich, DE); Grit Sommer (Grafing, DE); Florian Binder (Gauting, DE)
Assignees: Infineon Technologies AG; Qimonda AG
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Quick Facts
Patent No.
US 8,581,405
App. No.
13/151,408
Granted
Nov 12, 2013
Kind
B2
Abstract

An integrated circuit having a semiconductor substrate with a barrier layer is disclosed. The arrangement includes a semiconductor substrate and a metallic element. A carbon-based barrier layer is disposed between the semiconductor substrate and the metallic element.

Claims (10)

1. An integrated circuit having a semiconductor arrangement comprising:

a conductive structure comprising polycrystalline silicon or highly doped silicon;

a metallic element; and

a carbon-based barrier layer disposed between the conductive structure and the metallic element and in direct contact with at least the conductive structure, the carbon-based barrier layer completely covering a border between the conductive structure and the metallic element and being doped so as to be electrically conductive to pass electrical signals from the conductive structure to the metallic element.

2. The integrated circuit of claim 1 , further comprising:

an oxide layer arranged between the carbon-based barrier layer and the metallic element.

3. The integrated circuit of claim 2 , wherein the oxide layer comprises iridium or iridium oxide.

4. The integrated circuit of claim 1 , wherein the carbon-based barrier layer physically separates the conductive structure from the metallic element.

5. The integrated circuit of claim 1 , wherein the specific electric resistance of the carbon-based barrier layer is lower than the specific electric resistance of the conductive structure.

6. The integrated circuit of claim 1 , wherein the thermal conductivity of the carbon-based barrier layer is higher than the thermal conductivity of the conductive structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Continuity (2)
Division 11828865 · Jul 26, 2007
Related Publication 20110233630A1 · Sep 29, 2011