IP Library Granted Patent US 8,828,742
Granted Patent B2
US 8,828,742 · App. 13/290,779 · Granted Sep 9, 2014

Method of manufacturing magnetoresistive effect element that includes forming insulative sidewall metal oxide layer by sputtering particles of metal material from patterned metal layer

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Quick Facts
Patent No.
US 8,828,742
App. No.
13/290,779
Granted
Sep 9, 2014
Kind
B2
Abstract

A method of manufacturing a magnetoresistive effect element includes forming a first electrode above a substrate, forming a metal layer of a metal material above the first electrode, forming a first magnetic layer above the metal layer, forming a tunnel insulating film above the first magnetic layer, forming a second magnetic layer above the tunnel insulating film, forming a second electrode layer above the second magnetic layer, patterning the second electrode layer, patterning the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer, while depositing sputtered particles of the metal film on side walls of the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer to form a sidewall metal layer, and oxidizing the sidewall metal layer to form an insulative sidewall metal oxide layer.

Claims (26)

1. A method of manufacturing a magnetoresistive effect element comprising:

forming a first electrode above a substrate;

forming a metal layer of a metal material above the first electrode;

forming a first magnetic layer above the metal layer;

forming a tunnel insulating film above the first magnetic layer;

forming a second magnetic layer above the tunnel insulating film;

forming a second electrode layer above the second magnetic layer;

patterning the second electrode layer;

patterning the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer, while depositing sputtered particles of the metal layer on side walls of the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer to form a sidewall metal layer; and

oxidizing the sidewall metal layer to form an insulative sidewall metal oxide layer.

2. The method of manufacturing a magnetoresistive effect element according to claim 1 , wherein

in patterning the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer, the metal layer is etched selectively to the first electrode.

3. The method of manufacturing a magnetoresistive effect element according to claim 2 , wherein

in patterning the second magnetic layer, the tunnel insulating film, the first magnetic layer and the metal layer, CH 3 OH, HCOH, HCOOH or a mixed gas of CO and NH 3 is used as an etching gas.

4. The method of manufacturing a magnetoresistive effect element according to claim 1 , wherein

in oxidizing the sidewall metal layer, the sidewall metal layer is exposed to a plasma containing oxygen to oxidize the sidewall metal layer.

5. The method of manufacturing a magnetoresistive effect element according to claim 4 , wherein

in oxidizing the sidewall metal layer, the sidewall metal layer is exposed to the plasma of O 2 , CO 2 , or a gas of O 2 or CO 2 diluted with N 2 , Ar, CO or CO 2 to oxidize the sidewall metal layer.

6. The method of manufacturing a magnetoresistive effect element according to claim 4 , wherein

in oxidizing the sidewall metal layer, the sidewall metal layer is oxidized under a pressure of not more than 1 Torr.

7. The method of manufacturing a magnetoresistive effect element according to claim 1 , wherein

the metal material is aluminum, titanium, zirconium, vanadium, chrome or copper.

8. The method of manufacturing a magnetoresistive effect element according to claim 1 , wherein

the first electrode is formed of tantalum tungsten or hafnium.

9. The method of manufacturing a magnetoresistive effect element according to claim 1 ,

further comprising after forming the sidewall metal layer, cleaning with a chemical solution.

Assignments (4)
CHANGE OF NAME AND CHANGE OF ADDRESS Recorded Jul 16, 2020
From: AIZU FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053481/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: AIZU FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053209/0468 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2011
From: IBA, YOSHIHISA
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027363/0398 →