IP Library Granted Patent US 8,759,129
Granted Patent B2
US 8,759,129 · App. 13/550,097 · Granted Jun 24, 2014

Method of making diode having reflective layer

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Quick Facts
Patent No.
US 8,759,129
App. No.
13/550,097
Granted
Jun 24, 2014
Kind
B2
Abstract

A method of forming a light emitting diode includes forming a transparent substrate and a GaN buffer layer on the transparent substrate. An n-GaN layer is formed on the buffer layer. An active layer is formed on the n-GaN layer. A p-GaN layer is formed on the active layer. A p-electrode is formed on the p-GaN layer and an n-electrode is formed on the n-GaN layer. A reflective layer is formed on a second side of the transparent substrate. A scribe line is formed on the substrate for separating the diodes on the substrate. Also, a cladding layer of AlGaN is between the p-GaN layer and the active layer.

Claims (42)

1. A method of making light emitting diodes comprising:

providing a substrate having a first side and a second side opposite to the first side;

forming a buffer layer on the first side of the substrate;

forming a first-type semiconductor layer on the buffer layer;

forming an active layer on the first-type semiconductor layer;

forming a second-type semiconductor layer on the active layer;

forming a first contact structure on a surface of the second-type semiconductor layer;

forming a second contact structure on the first-type semiconductor layer facing the same direction of the first contact structure; and

reducing a thickness of the substrate to be less than 350 μm,

wherein the first contact structure comprises a structure that includes metallic elements that order proceeds from the surface of the second-type semiconductor layer, the structure is selected from:

a first structure that is arranged in the order of ITO, Au, Ni, and Au;

a second structure that is arranged in the order of ITO, Au, Pd, and Au;

a third structure that is arranged in the order of ITO, Ni, Pd, and Au; and

a fourth structure that is arranged in the order of ITO, Pt, and Au.

2. A method according to claim 1 , wherein Au is located at a top of the first contact structure, and wherein a thickness of Au is more than 500 nm.

3. A method according to claim 1 , further comprising:

forming scribe lines on the substrate, the scribe lines defining individual light emitting diodes; and

separating the light emitting diodes along the scribe lines.

4. A method according to claim 3 , wherein forming scribe lines on the substrate is performed on the first side of the substrate.

5. A method according to claim 3 , wherein forming scribe lines on the substrate is performed by a dry etching method.

6. A method according to claim 1 , wherein the substrate comprises a material selected from the group consisting of sapphire, ZnO, GaN, SiC, and AlN.

7. A method according to claim 1 , wherein the active layer is a multiple quantum layer.

8. A method according to claim 1 , wherein the second contact structure comprises a structure that includes metallic elements that order proceeds from the surface of the second-type semiconductor layer, the structure is selected from:

a first structure that is arranged in the order of Al, Ti, and Au;

a second structure that is arranged in the order of Au, Cr, and Au;

a third structure that is arranged in the order of Au, Ti, and Au; and

a fourth structure that is arranged in the order of Cr, and Au.

9. A method according to claim 8 , wherein Au is located at a top of the second contact structure, and wherein a thickness of Au is more than 500 nm.

10. A method according to claim 1 , further comprising forming a cladding layer including AlGaN between the active layer and the second-type semiconductor layer.

11. A method according to claim 1 , further comprising:

reducing a surface roughness of the second side of the substrate.

12. A method according to claim 11 , wherein the surface roughness is less than 15 nm.

13. A method according to claim 11 , wherein the surface roughness is less than 1 nm.

14. A method according to claim 11 , wherein reducing the surface roughness is performed by one of lapping, mechanical polishing, and dry etching.

15. A method according to claim 1 , further comprising:

forming a reflective layer on the second side of the substrate.

16. A method according to claim 15 , wherein the reflective layer comprises aluminum.

17. A method according to claim 1 , further comprising:

housing the light emitting diodes in a package coated with a reflective material.

18. A method according to claim 1 , wherein the first contact structure comprises a transparent conductive layer, a first-type electrode, and a pad.

19. A method according to claim 1 , wherein the second contact structure comprises a second-type electrode and a pad.

20. A method according to claim 1 , wherein the substrate has a thickness of less than 120 μm.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBER 13/550,997 PREVIOUSLY RECORDED ON REEL 031410 FRAME 0169. ASSIGNOR(S) HEREBY CONFIRMS THE APPLICATION NUMBER 13/550,097. Recorded Dec 12, 2013
From: LG ELECTRONICS INC.
To: LG INNOTEK CO. LTD.
Reel/Frame 031809/0432 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2013
From: LG ELECTRONICS, INC.
To: LG INNOTEK CO. LTD.
Reel/Frame 031410/0169 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2012
From: YOO, MYUNG CHEOL
To: LG ELECTRONICS INC.
Reel/Frame 028558/0825 →