CONTROLLER BASED MEMORY EVALUATION
A memory system or flash card may include a controller. Improved testing and memory evaluation may be achieved by utilizing the memory's controller rather than an external tester. User defined test algorithms may be run from the controller to characterize, evaluate and test memory (e.g. NAND memory) or test other components, such as the controller itself.
1 . A flash memory device comprising:
a non-volatile storage having an array of memory blocks storing data; and
a controller in communication with the non-volatile storage, the controller is configured for:
receiving a test algorithm for testing the memory blocks; and
running one or more tests with the test algorithm on the memory blocks.
2 . The device of claim 1 wherein the non-volatile storage comprises a NAND memory.
3 . The device of claim 1 wherein the tests are run without needing a host device.
4 . The device of claim 1 wherein the tests are run without an external tester.
5 . The device of claim 1 wherein the test algorithm is embedded in the controller.
6 . A flash memory device comprising:
a NAND memory storing data; and
a controller in communication with the NAND memory, the controller is configured for:
receiving NAND parameters and NAND algorithms; characterizing and
evaluating the NAND memory based on the NAND parameters and the NAND algorithms.
7 . The device of claim 6 wherein the evaluating is accomplished without needing a host device.
8 . The device of claim 6 wherein the evaluating is accomplished without an external tester.
9 . A method for evaluating flash memory in a memory device comprising:
in the memory device having a controller and blocks of memory, the controller:
receiving a test program that is stored with the controller;
implementing the test program without a host device.
10 . The method of claim 9 wherein the implementing of the test program is run by the controller independent of the host device.
11 . The method of claim 9 wherein the implementing of the testing program is accomplished without an external tester.
12 . The method of claim 9 wherein the flash memory comprises NAND memory.
13 . The method of claim 9 wherein the testing program comprises one or more algorithms embedded in the controller.