Semiconductor device and test method thereof
A semiconductor chip includes a memory array including a plurality of memory cells, a plurality of terminals including a plurality of test terminals to output a result of a specific test, and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
1. A semiconductor chip comprising:
a memory array including a plurality of memory cells;
a plurality of terminals including a plurality of test terminals to output a result of a specific test; and
a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
2. The semiconductor chip according to claim 1 , wherein the chip identification data is supplied from outside of the semiconductor chip.
3. The semiconductor chip according to claim 1 , wherein the result includes a result of a test for memory array.
4. The semiconductor chip according to claim 1 , wherein the plurality of terminals includes a plurality of through silicon vias.
5. The semiconductor chip according to claim 4 , wherein at least one of the plurality of through silicon vias provides current paths between a first terminal formed on a first surface of the semiconductor chip and a second terminal formed on a second surface opposite to the first surface of the semiconductor chip.
6. The semiconductor chip according to claim 1 , further comprising a chip identification data generating circuit generating the chip identification data in response to a data supplied from outside of the semiconductor chip.