Storage Control System with Settings Adjustment Mechanism and Method of Operation Thereof
Systems, methods and/or devices are used to enable a settings adjustment mechanism. In one aspect, the method includes (1) accessing characterization information corresponding to how a group of non-volatile memory devices of a storage control system operates as the group wears, (2) determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device, and (3) determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.
1 . A method of operation of a storage control system comprising:
accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;
determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and
determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.
2 . The method of claim 1 , further comprising:
using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.
3 . The method of claim 1 , wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.
4 . The method of claim 1 , wherein the estimated age represents the estimated wear on the non-volatile memory device.
5 . The method of claim 1 , wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to promote even performance as the non-volatile memory device ages.
6 . The method of claim 1 , wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to promote even power usage as the non-volatile memory device ages.
7 . The method of claim 1 , wherein the one or more settings for the non-volatile memory device are determined in accordance with the estimated age and the characterization information to maximize endurance of the non-volatile memory device.
8 . The method of claim 1 , wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.
9 . A storage control system, comprising:
one or more processors; and
memory storing one or more programs to be executed by the one or more processors, the one or more programs comprising instructions for:
accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;
determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and
determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.
10 . The storage control system of claim 9 , wherein the one or more programs further comprise instructions for:
using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.
11 . The storage control system of claim 9 , wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.
12 . The storage control system of claim 9 , wherein the estimated age represents the estimated wear on the non-volatile memory device.
13 . The storage control system of claim 9 , wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.
14 . A non-transitory computer readable storage medium, storing one or more programs configured for execution by one or more processors of a storage control system, the one or more programs including instructions for:
accessing characterization information corresponding to how a group of non-volatile memory devices of the storage control system operates as the group wears;
determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device; and
determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.
15 . The non-transitory computer readable storage medium of claim 14 , wherein the one or more programs further include instructions for:
using the determined one or more settings for the non-volatile memory device to adjust operating characteristics of the non-volatile memory device.
16 . The non-transitory computer readable storage medium of claim 14 , wherein the characterization information identifies different settings to use for different ages of a respective non-volatile memory device of the group of non-volatile memory devices.
17 . The non-transitory computer readable storage medium of claim 14 , wherein the estimated age represents the estimated wear on the non-volatile memory device.
18 . The non-transitory computer readable storage medium of claim 14 , wherein determining the estimated age of the non-volatile memory device includes filtering that limits impact of outlier measurements on the estimated age.